Inventors:
Frank Lambrecht - Mountain View CA
Ching-Chao Huang - San Jose CA
Michael Fox - Provo UT
Assignee:
Rambus Inc. - Los Altos CA
International Classification:
G06F 1750
US Classification:
716 4, 703 16, 703 17, 703 20, 702 64, 702125, 375342, 375295, 327 33, 327 37, 327 51, 327 63, 327 91
Abstract:
A technique for determining performance characteristics of electronic systems is disclosed. In one exemplary embodiment, the technique may be realized as a method for determining performance characteristics of electronic systems. The method includes the steps of measuring a first response on a transmission medium from a falling edge transmitted on the transmission medium, and measuring a second response on the transmission medium from a rising edge transmitted on the transmission medium. The method also includes the step of determining worst case bit patterns for transmission on the transmission medium based upon the first response and the second response.