MICHAEL ANDREW TOTH
Athletic Trainer in Kepner, PA
License number
Pennsylvania RT006555
Category
Medicine
Type
Athletic Trainer
Address
Address
Kepner, PA 17960
Professional information
Michael Toth - New Ringgold, PA
Work:
Intel Mobile Communications - Allentown, PA
Senior Manager FT Verification Agere Systems, LSI Corp - Allentown, PA
Senior Technical Manager DSP Product/Test Engineering, Wireless
Wireless/Consumer Team Leader Lucent Technologies - Allentown, PA
Distinguished Member of Technical Staff AT&T
Consultant for external business opportunities AT&T Bell Laboratories - Allentown, PA
Member of Technical Staff Memory Reliability
Device Engineer AT&T Bell Laboratories - Allentown, PA
Senior Technical Associate AT&T Technology Systems - Allentown, PA
Engineering Associate
Senior Manager FT Verification Agere Systems, LSI Corp - Allentown, PA
Senior Technical Manager DSP Product/Test Engineering, Wireless
Wireless/Consumer Team Leader Lucent Technologies - Allentown, PA
Distinguished Member of Technical Staff AT&T
Consultant for external business opportunities AT&T Bell Laboratories - Allentown, PA
Member of Technical Staff Memory Reliability
Device Engineer AT&T Bell Laboratories - Allentown, PA
Senior Technical Associate AT&T Technology Systems - Allentown, PA
Engineering Associate
Education:
Lafayette College - Easton, PA
Bachelor of Science Pennsylvania State University - Hazleton, PA
Associate in Electrical Engineering Technology
Bachelor of Science Pennsylvania State University - Hazleton, PA
Associate in Electrical Engineering Technology
Method For Quality And Reliability Assurance Testing Of Integrated Circuits Using Differential Iddq Screening In Lieu Of Burn-In
US Patent:
6230293, May 8, 2001
Filed:
Jul 24, 1998
Appl. No.:
9/121991
Inventors:
Sailesh Chittipeddi - Allentown PA
Daryl E. Diehl - Bethlehem PA
Thomas N. Hofacker - Northampton PA
Richard J. Jenkins - Allentown PA
Mamata Patnaik - Windmere FL
Robert T. Smith - Coopersburg PA
Michael J. Toth - New Ringgold PA
Keelathur N. Vasudevan - Macungie PA
Michael Washko - Barto PA
Daryl E. Diehl - Bethlehem PA
Thomas N. Hofacker - Northampton PA
Richard J. Jenkins - Allentown PA
Mamata Patnaik - Windmere FL
Robert T. Smith - Coopersburg PA
Michael J. Toth - New Ringgold PA
Keelathur N. Vasudevan - Macungie PA
Michael Washko - Barto PA
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G01R 3128
US Classification:
714724
Abstract:
A method for quality and reliability assurance testing a lot of fabricated ICs comprising the steps of testing the differential I. sub. ddq of a sample of ICs at a plurality of different voltages, burning-in a sample of ICs, and then testing the functionality of the sample of ICs. The method of the present invention enables the reliability of an entire lot of ICs to be tested by determining an effective screening voltage for differential I. sub. ddq testing of the ICs, thereby eliminating the need both to burn-in and conduct post burn-in testing of all future lots of the ICs. The method of the present invention also enables fabrication facilities and workers to be engaged in other tasks rather than testing of ICs.