MATTHEW STEVEN FISHER
Pilots at Choquette Dr, Austin, TX
License number
Texas A5097749
Issued Date
Nov 2012
Expiration Date
Nov 2017
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
1408 Choquette Dr, Austin, TX 78757
Professional information
Apparatus, System, And Method For Increasing Measurement Accuracy In A Particle Imaging Device Using Light Distribution
US Patent:
2012000, Jan 5, 2012
Filed:
Jun 30, 2010
Appl. No.:
12/827837
Inventors:
Wayne Dennis Roth - Leander TX, US
Matthew S. Fisher - Austin TX, US
Matthew S. Fisher - Austin TX, US
International Classification:
G06K 9/00, H04N 7/18
US Classification:
348135, 382103, 2504581, 348E07085
Abstract:
An apparatus, system, and method for increasing measurement accuracy in imaging cytometry. The system may include a light detector configured to measure light emitted by a particle in response to a first light source, and processor coupled to the light detector. The processor may be configured create a first image by taking a first measurement of light and create a second image by interpolating the first image, where the second image has higher resolution than the first image. The processor may be configured to determine a difference between pixels of the second image and an expected distribution and discard the first measurement of light if the difference is above a predetermined threshold.
Image Pattern Matching Utilizing Discrete Curve Matching With A Mapping Operator
US Patent:
7139432, Nov 21, 2006
Filed:
Oct 3, 2002
Appl. No.:
10/264118
Inventors:
Lothar Wenzel - Round Rock TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Assignee:
National Instruments Corporation - Austin TX
International Classification:
G06K 9/00
US Classification:
382217, 382199, 382203
Abstract:
System and method for determining the presence of an object of interest in a target image. Regions of a target image may be located that match an object of interest, e. g. , in a template image, with respect to various information, e. g. , luminance, color and/or other types of boundary information. The invention includes improved methods for mapping point sequences (e. g. , pixel sequences) or curves to new point sets or curves for curve matching. The method determines the presence of an object of interest in a target image despite of or using various types of topological transformations of the object of interest in the target image. One or more mapping operators are determined based on template curves and/or example target curves. Pattern matching is performed on one or more target images using the mapping operator(s) to generate pattern matching results, and the pattern matching results output.
Apparatus, System, And Method For Increasing Measurement Accuracy In A Particle Imaging Device
US Patent:
8274656, Sep 25, 2012
Filed:
Jun 30, 2010
Appl. No.:
12/827800
Inventors:
Wayne Dennis Roth - Leander TX, US
Matthew S. Fisher - Austin TX, US
Matthew S. Fisher - Austin TX, US
Assignee:
Luminex Corporation - Austin TX
International Classification:
G01N 21/53
US Classification:
356337, 356 73, 356341, 3562373
Abstract:
An apparatus, system, and method for increasing measurement accuracy in imaging cytometry. The system may include a light detector configured to measure light emitted by a first particle and light emitted by a second particle, where the measured light from the second particle at least partially overlaps the measured light from the first particle in an overlap region. Additionally, the system may include a processor coupled to the light detector, where the processor is configured to determine a contribution of light from the first particle in the overlap region and determine a contribution of light from the second particle in the overlap region. The processor may also be configured to subtract the contribution of light from the second particle from the contribution of light from the first particle and determine the intensity of light emitted by the first particle.
Generating A Curve Matching Mapping Operator By Analyzing Objects Of Interest And Background Information
US Patent:
7136505, Nov 14, 2006
Filed:
Oct 3, 2002
Appl. No.:
10/264059
Inventors:
Lothar Wenzel - Round Rock TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Assignee:
National Instruments Corporation - Austin TX
International Classification:
G06K 9/00
US Classification:
382103, 382173
Abstract:
System and method for determining a mapping operator for use in a pattern matching application, where the mapping operator enhances differences between respective objects of interest and background objects, e. g. , objects not of interest. First and second information is received regarding an object of interest and objects that may appear with the object of interest in an acquired target data set, respectively. The mapping operator is determined using the first information and the second information by determining a template discrete curve characterizing the object of interest, determining one or more target discrete curves characterizing the background objects, and generating a mapping operator that enhances differences between the mapped template discrete curve and the mapped target discrete curves. The operator is stored in a memory and is operable to be used in a pattern matching application to locate instances of the object of interest in acquired target data sets or images.
Pattern Matching Utilizing Discrete Curve Matching With Multiple Mapping Operators
US Patent:
7133538, Nov 7, 2006
Filed:
Oct 3, 2002
Appl. No.:
10/263601
Inventors:
Lothar Wenzel - Round Rock TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Assignee:
National Instruments Corporation - Austin TX
International Classification:
G06K 9/00
US Classification:
382103, 382209
Abstract:
System and method for determining the presence of an object of interest in a target image. Regions of a target image may be located that match an object of interest, e. g. , in a template image, with respect to various information, e. g. , luminance, color and/or other types of boundary information. The invention includes improved methods for mapping point sets or curves to new point sets or curves for curve matching. The method determines the presence of an object of interest in a target image despite of or using various types of topological transformations of the object of interest in the target image. A plurality of mapping operators are determined based on template curves and/or example target curves, e. g. , background object curves. Pattern matching is performed on one or more target images using the mapping operators to generate pattern matching results, and the pattern matching results output.
Pattern Matching System Utilizing Discrete Curve Matching With A Mapping Operator
US Patent:
7171048, Jan 30, 2007
Filed:
Oct 3, 2002
Appl. No.:
10/263560
Inventors:
Lothar Wenzel - Round Rock TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Assignee:
National Instruments Corporation - Austin TX
International Classification:
G06K 9/62
US Classification:
382209
Abstract:
System and method for determining the presence of an object of interest in a target data set. Portions of a target data set may be located that match an object of interest, e. g. , in a template data set, with respect to various information, e. g. , edge or boundary information. The invention includes improved methods for mapping point sets or curves to new point sets or curves for curve matching. The method determines the presence of an object of interest in a target data set despite of or using various types of topological transformations of the object of interest in the target data set. One or more mapping operators are determined based on template curves and/or example target curves. Pattern matching is performed on one or more target data sets using the mapping operator(s) to generate pattern matching results, and the pattern matching results output.
Efficient Re-Sampling Of Discrete Curves
US Patent:
7120301, Oct 10, 2006
Filed:
Oct 3, 2002
Appl. No.:
10/264109
Inventors:
Lothar Wenzel - Round Rock TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Ram Rajagopal - Austin TX, US
Satish V. Kumar - Austin TX, US
Darren R. Schmidt - Cedar Park TX, US
Kevin M. Crotty - Austin TX, US
Matthew S. Fisher - Austin TX, US
Dinesh Nair - Austin TX, US
Assignee:
National Instruments Corporation - Austin TX
International Classification:
G06K 9/62
US Classification:
382209, 382251
Abstract:
System and method for re-sampling discrete curves, thereby efficiently characterizing point sets or curves in a space. The method may also provide improved means for mapping point sets or curves to new point sets or curves for curve matching. A weight vector or function is determined based on a plurality of discrete curves, e. g. , from one or more template data sets or images. The weight function enhances differences between weighted discrete curves. A set of orthonormal polynomials is determined based on the computed weight function, where the set of orthonormal polynomials comprises a set of orthogonal eigenfunctions of a Sturm-Liouville differential equation. Values for a plurality of zeros for one of the set of orthonormal polynomials is determined that comprise resampling points for the plurality of discrete curves. Each of the plurality of discrete curves is resampled based on the determined values of the plurality of zeros.
Methods And Systems For Image Data Processing
US Patent:
2013012, May 23, 2013
Filed:
Oct 17, 2012
Appl. No.:
13/653789
Inventors:
Matthew S. Fisher - Austin TX, US
International Classification:
G01N 21/64
US Classification:
2504591, 2504581, 2502081
Abstract:
Embodiments of the computer-implemented methods, storage mediums, and systems may be configured to determine locations of particles within a first image of the particles. The particles may have fluorescence-material associated therewith. The embodiments may include calculating a transform parameter, and the transform parameter may define an estimated movement in the locations of the particles between the first image of the particles and a second image of the particles. The embodiments may further including applying the transform parameter to the locations of the particles within the first image to determine movement locations of the particles within the second image.
Geometric Pattern Matching Using Dynamic Feature Combinations
US Patent:
7340089, Mar 4, 2008
Filed:
Jan 10, 2005
Appl. No.:
11/032423
Inventors:
Dinesh Nair - Austin TX, US
Matthew S. Fisher - Austin TX, US
Satish V. Kumar - Austin TX, US
Bruce Smyth - Hollis NH, US
Subramanian Ramamoorthy - Austin TX, US
Matthew S. Fisher - Austin TX, US
Satish V. Kumar - Austin TX, US
Bruce Smyth - Hollis NH, US
Subramanian Ramamoorthy - Austin TX, US
Assignee:
National Instruments Corporation - Austin TX
International Classification:
G06K 9/62
US Classification:
382159, 382199, 382203, 382209, 706 20, 706 25
Abstract:
A geometric pattern matching method to locate instances of a template image in a target image using a plurality of models with different feature combinations. A learning phase involves learning geometric information about the template image and creating a model for each of a plurality of different respective parent features. Each model comprises a relationship tree from the respective parent feature to one or more other child features, and hence each model may have different feature combinations. In a matching phase, the method may examine a plurality of different models to determine matches in the target image being analyzed. The matching phase may select different models dynamically based on prior matching results.