MATTHEW R HAMMER, MD
Radiology at Harry Hines Blvd, Dallas, TX
License number
Texas P9363
Category
Radiology
Type
Pediatric Radiology
License number
Texas P9363
Category
Radiology
Type
Diagnostic Radiology
Address
Address
5323 Harry Hines Blvd, Dallas, TX 75390
Phone
(214) 648-7770
Personal information
See more information about MATTHEW R HAMMER at radaris.comName
Address
Phone
5525 Country Club Rd E, Longview, TX 75602
7511 Delafield Ln, Austin, TX 78752
10317 Salida Dr, Austin, TX 78749
1088 Ashford Ln, Midlothian, TX 76065
2125 Kingsdale Dr, Deer Park, TX 77536
Professional information
Grid Holder For Stem Analysis In A Charged Particle Instrument
US Patent:
2010002, Feb 4, 2010
Filed:
Jul 31, 2009
Appl. No.:
12/533565
Inventors:
Matthew Hammer - Dallas TX, US
Gonzalo Amador - Dallas TX, US
Gonzalo Amador - Dallas TX, US
Assignee:
Omniprobe, Inc. - Dallas TX
International Classification:
H01J 37/26, H01J 37/20
US Classification:
250311, 25044211
Abstract:
A grid holder for STEM analysis in a charged-particle instrument has a base jaw and a pivoting jaw. Both jaws have a substantially congruent inclined portion. The base jaw has a flat portion for mounting the holder on the sample carousel of a charged-particle instrument, such as a dual beam FIB. The inclined portion of the jaws is inclined to the flat portion of the holder at an angle A approximately equal to the difference between 90 degrees and the angle between the electron beam and the ion beam in the charged-particle instrument. The inclined portion of the jaws has a pocket for receiving and holding a sample grid. When a sample is mounted on the grid and the grid is held by the grid holder, the sample will be correctly oriented for ion-beam thinning when the sample carousel is horizontal. The thinned sample may then be placed perpendicular to the electron beam for STEM analysis by tilting the sample carousel by the same angle A.
Method For Stem Sample Inspection In A Charged Particle Beam Instrument
US Patent:
8247768, Aug 21, 2012
Filed:
Oct 1, 2010
Appl. No.:
12/896281
Inventors:
Lyudmila Zaykova-Feldman - Dallas TX, US
Thomas M. Moore - Dallas TX, US
Gonzalo Amador - Dallas TX, US
Matthew Hammer - Dallas TX, US
Thomas M. Moore - Dallas TX, US
Gonzalo Amador - Dallas TX, US
Matthew Hammer - Dallas TX, US
Assignee:
Omniprobe, Inc. - Dallas TX
International Classification:
G01N 23/00
US Classification:
250307, 250309, 25044211
Abstract:
A method for sample examination in a dual-beam FIB calculates a first angle as a function of second, third and fourth angles defined by the geometry of the FIB and the tilt of the specimen stage. A fifth angle is calculated as a function of the stated angles, where the fifth angle is the angle between the long axis of an excised sample and the projection of the axis of the probe shaft onto the X-Y plane. The specimen stage is rotated by the calculated fifth angle, followed by attachment to the probe tip and lift-out. The sample may then be positioned perpendicular to the axis of the FIB electron beam for STEM analysis by rotation of the probe shaft through the first angle.
Method For Stem Sample Inspection In A Charged Particle Beam Instrument
US Patent:
7834315, Nov 16, 2010
Filed:
Mar 3, 2008
Appl. No.:
12/041217
Inventors:
Lyudmila Zaykova-Feldman - Dallas TX, US
Thomas M. Moore - Dallas TX, US
Gonzalo Amador - Dallas TX, US
Matthew Hammer - Dallas TX, US
Thomas M. Moore - Dallas TX, US
Gonzalo Amador - Dallas TX, US
Matthew Hammer - Dallas TX, US
Assignee:
Omniprobe, Inc. - Dallas TX
International Classification:
G01N 23/00
US Classification:
250307, 25049221, 324760, 850 10
Abstract:
A method for sample examination in a dual-beam FIB calculates a first angle as a function of second, third and fourth angles defined by the geometry of the FIB and the tilt of the specimen stage. A fifth angle is calculated as a function of the stated angles, where the fifth angle is the angle between the long axis of an excised sample and the projection of the axis of the probe shaft onto the X-Y plane. The specimen stage is rotated by the calculated fifth angle, followed by attachment to the probe tip and lift-out. The sample may then be positioned perpendicular to the axis of the FIB electron beam for STEM analysis by rotation of the probe shaft through the first angle.
Method For Stem Sample Inspection In A Charged Particle Beam Instrument
US Patent:
8168949, May 1, 2012
Filed:
Oct 1, 2010
Appl. No.:
12/896274
Inventors:
Lyudmila Zaykova-Feldman - Dallas TX, US
Thomas M. Moore - Dallas TX, US
Gonzalo Amador - Dallas TX, US
Matthew Hammer - Dallas TX, US
Thomas M. Moore - Dallas TX, US
Gonzalo Amador - Dallas TX, US
Matthew Hammer - Dallas TX, US
Assignee:
Omniprobe, Inc. - Dallas TX
International Classification:
G01N 23/00
US Classification:
250307, 250310, 702 81
Abstract:
A method for sample examination in a dual-beam FIB calculates a first angle as a function of second, third and fourth angles defined by the geometry of the FIB and the tilt of the specimen stage. A fifth angle is calculated as a function of the stated angles, where the fifth angle is the angle between the long axis of an excised sample and the projection of the axis of the probe shaft onto the X-Y plane. The specimen stage is rotated by the calculated fifth angle, followed by attachment to the probe tip and lift-out. The sample may then be positioned perpendicular to the axis of the FIB electron beam for STEM analysis by rotation of the probe shaft through the first angle.