LOREN COLE BETTS
Pilots at Dorian Dr, Cotati, CA

7623989, Nov 24, 2009

Sep 29, 2005

11/238452

Loren C. Betts - Rohnert Park CA, US

Agilent Technologies, Inc. - Santa Clara CA

G06F 11/30

702190, 702183, 375130

A test system and method which employs a filter bank to select different spectral components of a pulsed measurement signal. The filter bank utilizes filter nulls to suppress non-selected spectral components. After filtering the selected spectral components, the spectral components are combined to provide for a measurement signal which is analyzed to determine characteristics of a device being tested. The characteristics of the filters can be adjusted in response to a change in the characteristics of a pulsed signal applied to the device under test, so that the selected spectral components will correspond to desired spectral components generated by the pulsed signal applied to the device under test.

7500161, Mar 3, 2009

Jun 1, 2004

10/537031

Joel P Dunsmore - Sebastopol CA, US
Loren C Betts - Rohnert Park CA, US

Agilent Technologies, Inc. - Santa Clara CA

G01R 31/28

714724, 714703, 714 18, 714712, 714718

A test system and methods using the test system correlate measurements of a device under test (DUT) regardless of which test fixture is used for in-fixture testing of the DUT. The test system includes test equipment, a test fixture that interfaces the DUT to the test equipment, a computer and a computer program executed by the computer. The computer program includes instructions that implement determining a port-specific difference array for test fixtures used with the test system. The difference array describes a difference between the test fixtures at a corresponding test port thereof. The method includes determining the difference array, measuring a performance of the DUT in a second test fixture, and applying the difference array such that the measured performance approximates a hypothetical DUT performance for the DUT as if mounted in a first test fixture.

2006000, Jan 5, 2006

Jun 30, 2004

10/883100

Robert Shoulders - Santa Rosa CA, US
Loren Betts - Rohnert Park CA, US

H04B 17/00, H04B 1/10, H04B 1/18

455286000, 455226100, 455067110, 455306000

A receiver channel, test system and method employ adaptive nulling to filter a targeted frequency component from a pulsed signal to produce a filtered pulsed signal. The filtered pulsed signal facilitates measuring pulsed performance parameters of a device under test. The receiver channel includes an adaptive nulling filter having a frequency response with a null that is adjustable in a null location to correspond to a vicinity of the targeted component. The test system includes a pulsed signal source, a test set, and a controller that controls the signal source and the test set. The test set includes the receiver channel with the adaptive nulling filter. The method of adaptive null filtering includes adjusting a location of a null in a frequency response of the adaptive nulling filter to correspond to a vicinity of the targeted component to produce the filtered pulsed signal.

8605850, Dec 10, 2013

Mar 25, 2011

13/071589

Keith F. Anderson - Santa Rosa CA, US
Loren C. Betts - Rohnert Park CA, US

Agilent Technologies, Inc. - Santa Clara CA

H04L 7/00, H04L 25/00, H04L 25/40

375371, 375226, 375228

A method and system of providing a phase reference signal includes generating a reference signal having a reference frequency, modulating the reference signal at a modulation frequency lower than the reference frequency to obtain a modulated drive signal, receiving the modulated drive signal at a phase reference, and generating the phase reference signal based on the modulated drive signal. The phase reference signal including multiple reference tones having corresponding tone frequencies clustered around multiples of the reference frequency. A spacing between adjacent tones of the multiple reference tones is the same as the modulation frequency or an integer multiple of the modulation frequency.

7868607, Jan 11, 2011

Apr 20, 2007

11/738051

Joel P. Dunsmore - Sebastopol CA, US
Sean Hubert - Santa Rosa CA, US
Loren C. Betts - Rohnert Park CA, US
Johan Ericsson - Windsor CA, US

Agilent Technologies, Inc. - Santa Clara CA

G01R 23/14, G01R 27/28

324 7623, 324 7643, 324 7652, 324617

A method is presented where the phase trace is offset for each sweep such that the first point is always at zero degrees. The resulting traces are then averaged. The average reduces the noise in the phase trace and results in a less noisy group delay trace.

7739063, Jun 15, 2010

Nov 14, 2007

11/940296

Loren C. Betts - Rohnert Park CA, US
Daniel B. Gunyan - Rohnert Park CA, US

Agilent Technologies, Inc. - Santa Clara CA

G01R 13/00

702 72

A method for eliminating the systematic measurement errors from a measurement system, for example a vector network analyzer, such that an accurate representation of the behavior of a nonlinear device can be measured or characterized. The cross-frequency phase and absolute amplitude of the measured voltage waves applied to and emanating from the nonlinear device are measured and error corrected. These waves may be used for nonlinear device characterization or modeling.

7545150, Jun 9, 2009

Feb 28, 2007

11/680610

Keith F. Anderson - Santa Rosa CA, US
David V. Blackham - Santa Rosa CA, US
Joel P. Dunsmore - Sebastopol CA, US
Loren C Betts - Rohnert Park CA, US
Nicholas C. Leindecker - Stanford CA, US

Agilent Technologies, Inc. - Santa Clara CA

G01R 35/00

324601, 324615, 324638, 324 7612, 324 7652, 702106

A measurement and correction method provides for a complete full correction of a true-mode system using only the single ended error matrix developed for 4 port correction of single ended measurements. The degree of misalignment of the balanced sources may be determined from these measurements.