Inventors:
Mai A. Ghaly - Bloomington MN, US
James E. Angelo - Savage MN, US
Akhila Tadinada - Bloomington MN, US
Paul J. Choquette - Glendale RI, US
Kenneth R. Burns - Cannon Falls MN, US
Kevin M. Bailey - Belle Plaine MN, US
Assignee:
Seagate Technology LLC - Cupertino CA
International Classification:
G11B 27/36
Abstract:
A method is provided that decides whether a region of data storage units in a data storage system should be scanned for defective data. A current region of data storage units affected by a write operation is determined and which select transducing head of the data storage system that corresponds with the current region is also determined. A scalar value that corresponds with the select transducing head is retrieved. The scalar value related to a condition of the select transducing head based on previously conducted performance tests. An incremented write count of the affected region is scaled by the scalar value to obtain a new increment write count. A defective data scan is performed on the affected region if the new increment write count exceeds a default write count threshold.