Keith Wesley Quick
Engineers at Johnson Ave, Loveland, CO
License number
Colorado 33237
Issued Date
Jan 22, 1999
Renew Date
Nov 1, 2015
Expiration Date
Oct 31, 2017
Type
Professional Engineer
Address
Address
551 Johnson Ave, Loveland, CO 80537
Personal information
See more information about Keith Wesley Quick at radaris.comName
Address
Phone
551 Johnson Ave, Loveland, CO 80537
7069 Allens Park Dr, Colorado Springs, CO 80922
PO Box 7081, Pueblo, CO 81007
1633 Saratoga Rd, Pueblo, CO 81001
2151 S Quentin Way APT P102, Aurora, CO 80014
Professional information
Apparatus And Method For Handling An Integrated Circuit
US Patent:
6364386, Apr 2, 2002
Filed:
Oct 27, 1999
Appl. No.:
09/428152
Inventors:
Keith W Quick - Loveland CO
Stephen J Duey - Thornton CO
Stephen J Duey - Thornton CO
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
B25J 1506
US Classification:
294 641, 294907, 901 40, 901 47, 29743, 414737
Abstract:
An apparatus and method are provided for picking up an integrated circuit and for facilitating the optical testing thereof. The apparatus comprises a pick-up mechanism that includes a vacuum chamber. The vacuum chamber is defined by an upper portion, an expandable member, and a lower portion. The lower portion defines a suction orifice that is moveable with a movement of the expandable member. An optical pathway is defined by the vacuum chamber, the optical pathway passing through the suction orifice and onto an integrated circuit that is held against the suction orifice via a vacuum pressure applied to the vacuum chamber.
Apparatus And Method For Handling An Integrated Circuit
US Patent:
6394520, May 28, 2002
Filed:
Oct 30, 2001
Appl. No.:
10/000614
Inventors:
Keith W Quick - Loveland CO
Stephen J Duey - Thornton CO
Stephen J Duey - Thornton CO
Assignee:
Agilent Technologies, Inc. - Palo Alto CA
International Classification:
B25J 1506
US Classification:
294 641, 294907, 29743, 414737, 901 40, 901 47
Abstract:
An apparatus and method are provided for picking up an integrated circuit and for facilitating the optical testing thereof. The apparatus comprises a pick-up mechanism that includes a vacuum chamber. The vacuum chamber is defined by an upper portion, an expandable member, and a lower portion. The lower portion defines a suction orifice that is moveable with a movement of the expandable member. An optical pathway is defined by the vacuum chamber, the optical pathway passing through the suction orifice and onto an integrated circuit that is held against the suction orifice via a vacuum pressure applied to the vacuum chamber.