Jung Won Kim
Professional Planners in Columbus, OH

License number
New Jersey 33LI00594600
Issued Date
Oct 16, 2006
Expiration Date
May 31, 2018
Category
Professional Planners
Type
Professional Planner
Address
Address
Columbus, OH

Professional information

Jung Kim Photo 1

Research Director, Columbus 2020

Position:
Research Director, Columbus 2020 at Columbus Chamber
Location:
Columbus, Ohio
Industry:
Research
Work:
Columbus Chamber - Columbus, Ohio Area since Nov 2010 - Research Director, Columbus 2020 Community Research Partners - Columbus, Ohio Area Dec 2007 - Nov 2010 - Director of Community Data Services State of New Jersey - Office of Smart Growth - New Jersey Aug 2004 - Nov 2007 - Principal Planner Strategic Planning Advice - London, United Kingdom Sep 2002 - Sep 2003 - Economics & Planning Associate Urban Data Solutions - Greater New York City Area Aug 2000 - Mar 2001 - CAD Specialist
Education:
London School of Economics and Political Science 2001 - 2002
MS, Regional and Urban Planning
Northwestern University 1996 - 2000
BA, Urban Studies, Sociology


Jung Kim Photo 2

Methods And Systems For Ultra-Precise Measurement And Control Of Object Motion In Six Degrees Of Freedom By Projection And Measurement Of Interference Fringes

US Patent:
7705996, Apr 27, 2010
Filed:
Jul 18, 2006
Appl. No.:
11/488931
Inventors:
Jung H. Kim - Columbus OH, US
Chia-Hsiang Menq - Powell OH, US
Assignee:
Ohio State University - Columbus OH
International Classification:
G01B 9/02
US Classification:
356508
Abstract:
A system and method for active visual measurement and servo control using laterally sampled white light interferometry (L-SWLI) for real-time visual tracking of six-degree-of-freedom (6 DOF) rigid body motion with near-nanometer precision. The visual tracking system is integrated with a 6 DOF motion stage to realize an ultra precision six-axis visual servo control system. Use of L-SWLI obtains the complete pose of the target object from a single image frame to enable real-time tracking. Six-degree-of-freedom motions are obtained by measuring the fringe pattern on multiple surfaces of the object or from a single surface with additional information gained from conventional image processing techniques.