JUAN C MARTINEZ
Electrician at Sunnycrest St, Houston, TX

License number
Texas 29915
Expiration Date
Jun 20, 2017
Category
Journeyman Electrician
Address
Address
6025 Sunnycrest St, Houston, TX 77087
Phone
(832) 340-8752

Professional information

Juan Martinez Photo 1

Realtor

Specialties:
Buyer's Agent, Listing Agent, Relocation, Foreclosure
Work:
17315 Fm 529 Rd, Houston 77095
Links:
Website


Juan Martinez Photo 2

Sr. Human Resources Specialist At Steel &Amp; Pipe Supply Company

Position:
SR. Human Resources Specialist at Steel & Pipe Supply Company
Location:
Houston, Texas Area
Industry:
Human Resources
Work:
Steel & Pipe Supply Company since Jan 2013 - SR. Human Resources Specialist Transaction Packing, Inc - Houston, Texas Area Aug 2012 - Nov 2012 - Human Resources Generalist NetVersant Nov 2010 - Aug 2012 - Human Resources Generalist Dr Pepper Bottling Company of Texas Oct 2009 - Oct 2010 - Associate Human Resources Manager Stanford Financial Group Oct 2001 - May 2009 - Human Resources Information Systems Specialist Morado Productions Nov 2000 - Oct 2001 - Co Owner Texas Department of Transportation Nov 1998 - Nov 2000 - Human Resources Specialist Texas Department of Human Services Sep 1990 - Nov 1998 - Human Resources Clerk III
Languages:
Spanish


Juan Martinez Photo 3

Juan Martinez - Houston, TX

Work:
Vendor Surveillance
NACE Level 3 Quality Assurance Inspector
EnTech Engineering United
Contract Work as Consultant/Inspector
ITI International
QA Inspector
National Oilwell Varco
Coatings Department Manager
WISCO and QC Consulting LLC - Houston, TX
QA/QC Consultant
Basic industries
Quality Control Supervisor
Industrial Specialists, L.L.C - Dickinson, TX
QA/QC Technician
OFFSHORE Meaux Surface Protection Inc - Lafayette, LA
Blaster/ Painter/ relieve Foreman
Protherm Services Group, LLC
Blaster/ Painter/crew leader/journeyman
Education:
NACE international - Houston, TX
N.A.C.E. Certified Coating Inspector Level.3-peer review in Corrosion Protection
World Spec
SNT-TC-1A MPT Magnetic particle Testing in NDT
NACE International
N.A.C.E Protective Coating Specialist level 2 in - January 2010
Lone Star College
Lone star College Supervision course in Supervision course
Skills:
N.A.C.E. Certified Coating Inspector Level.3-peer review (Current) Expires-Renew /2015


Juan Martinez Photo 4

Tech At Getronics

Position:
Tech at Getronics
Location:
Houston, Texas Area
Industry:
Information Technology and Services
Work:
Getronics - Tech
Education:
Houston Community College


Juan Martinez Photo 5

Food Processing Technician At Frito Lay

Position:
Food Processing Technician at Frito Lay
Location:
Houston, Texas Area
Industry:
Consumer Goods
Work:
Frito Lay - Food Processing Technician


Juan Martinez Photo 6

Pipe Foreman At Jacobs Engineering

Position:
Pipe Foreman at Jacobs Engineering
Location:
Houston, Texas Area
Industry:
Management Consulting
Work:
Jacobs Engineering - Pipe Foreman


Juan Martinez Photo 7

Human Resources Professional

Location:
Houston, Texas Area
Industry:
Human Resources


Juan Martinez Photo 8

Juan Martinez - Houston, TX

Work:
caco manufacturing
Shipping and Receiving Clerk


Juan Martinez Photo 9

Semiconductor Device Testing

US Patent:
7446552, Nov 4, 2008
Filed:
Mar 9, 2007
Appl. No.:
11/684045
Inventors:
Francisco Cano - Missouri City TX, US
Juan C. Martinez - Houston TX, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G01R 31/26
US Classification:
324765
Abstract:
An apparatus and method to test components in a semiconductor test structure. On a semiconductor wafer, a test module implemented in one or more scribe lines between a plurality of semiconductor dies is used to test components in the semiconductor test structure. The test module may, for example, test electrical characteristics of chains of vias, transistors, and functional devices, such as oscillators. The test module contains a scan chain control coupled through a plurality of pass gates to each component to be tested. The scan chain control sequentially closes the pass gates to separately test the components in the semiconductor test structure. The test module further interfaces with an external testing device and the results of each test are compared with the expected results to identify faulty components.


Juan Martinez Photo 10

Semiconductor Device Testing

US Patent:
7446553, Nov 4, 2008
Filed:
Aug 21, 2007
Appl. No.:
11/842205
Inventors:
Francisco Cano - Missouri City TX, US
Juan C. Martinez - Houston TX, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G01R 31/02
US Classification:
324765
Abstract:
An apparatus and method to test components in a semiconductor test structure. On a semiconductor wafer, a test module implemented in one or more scribe lines between a plurality of semiconductor dies is used to test components in the semiconductor test structure. The test module may, for example, test electrical characteristics of chains of vias, transistors, and functional devices, such as oscillators. The test module contains a scan chain control coupled through a plurality of pass gates to each component to be tested. The scan chain control sequentially closes the pass gates to separately test the components in the semiconductor test structure. The test module further interfaces with an external testing device and the results of each test are compared with the expected results to identify faulty components.