JONATHAN Z LIN
Broker in Winchester, MA
License number
Massachusetts 148965
Issued Date
Apr 28, 2011
Expiration Date
Jan 13, 2014
Type
Broker
Address
Address
Winchester, MA 01890
Professional information
Method And Apparatus For Measuring A Position Of A Particle In A Flow
US Patent:
2013007, Mar 28, 2013
Filed:
Oct 26, 2012
Appl. No.:
13/662197
Inventors:
Massachusetts Institute of Technology - Cambridge MA, US
Antonio Sanchez-Rubio - Lexington MA, US
Ronald H. Hoffeld - Cambridge MA, US
Jonathan Z. Lin - Winchester MA, US
Nicholas M.F. Judson - Baltimore MD, US
George S. Haldeman - Melrose MA, US
Vincenzo Daneu - Woburn MA, US
Antonio Sanchez-Rubio - Lexington MA, US
Ronald H. Hoffeld - Cambridge MA, US
Jonathan Z. Lin - Winchester MA, US
Nicholas M.F. Judson - Baltimore MD, US
George S. Haldeman - Melrose MA, US
Vincenzo Daneu - Woburn MA, US
Assignee:
MASSACHUSETTS INSTITUTE OF TECHNOLOGY - Cambridge MA
International Classification:
G01N 21/53
US Classification:
356343, 356338
Abstract:
Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known.An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location.However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.
Method And Apparatus For Measuring A Position Of A Particle In A Flow
US Patent:
7821636, Oct 26, 2010
Filed:
May 18, 2007
Appl. No.:
11/804593
Inventors:
Thomas H. Jeys - Lexington MA, US
Antonio Sanchez-Rubio - Lexington MA, US
Ronald H. Hoffeld - Cambridge MA, US
Jonathan Z. Lin - Winchester MA, US
Nicholas M. F. Judson - Baltimore MD, US
George S. Haldeman - Melrose MA, US
Vincenzo Daneu - Woburn MA, US
Antonio Sanchez-Rubio - Lexington MA, US
Ronald H. Hoffeld - Cambridge MA, US
Jonathan Z. Lin - Winchester MA, US
Nicholas M. F. Judson - Baltimore MD, US
George S. Haldeman - Melrose MA, US
Vincenzo Daneu - Woburn MA, US
Assignee:
Massachusetts Institute of Technology - Cambridge MA
International Classification:
G01N 21/00
US Classification:
356342, 250573, 250575, 356337, 356615, 356624, 382103
Abstract:
Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.
Method And Apparatus For Measuring A Position Of A Particle In A Flow
US Patent:
8319965, Nov 27, 2012
Filed:
Aug 6, 2010
Appl. No.:
12/851866
Inventors:
Thomas H. Jeys - Lexington MA, US
Antonio Sanchez-Rubio - Lexington MA, US
Ronald H. Hoffeld - Cambridge MA, US
Jonathan Z. Lin - Winchester MA, US
Nicholas M. F. Judson - Baltimore MD, US
George S. Haldeman - Melrose MA, US
Vincenzo Daneu - Woburn MA, US
Antonio Sanchez-Rubio - Lexington MA, US
Ronald H. Hoffeld - Cambridge MA, US
Jonathan Z. Lin - Winchester MA, US
Nicholas M. F. Judson - Baltimore MD, US
George S. Haldeman - Melrose MA, US
Vincenzo Daneu - Woburn MA, US
Assignee:
Massachusetts Institute of Technology - Cambridge MA
International Classification:
G01N 21/00
US Classification:
356342, 250573, 250575, 356614, 356615, 356621, 382103
Abstract:
Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.