JONATHAN HOLMES TAPPAN
Pilots at Thomas Hayes Ln, San Diego, CA
License number
California A2705410
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
11914 Thomas Hayes Ln, San Diego, CA 92126
Professional information
Reliability Of Vias And Diagnosis By E-Beam Probing
US Patent:
2002018, Dec 12, 2002
Filed:
Jun 8, 2001
Appl. No.:
09/877885
Inventors:
William Xia - San Diego CA, US
Martin Villafana - San Diego CA, US
Jonathan Tappan - San Diego CA, US
Tim Watson - San Diego CA, US
Michael Campbell - Encinitas CA, US
Martin Villafana - San Diego CA, US
Jonathan Tappan - San Diego CA, US
Tim Watson - San Diego CA, US
Michael Campbell - Encinitas CA, US
International Classification:
G01R031/305
US Classification:
324/751000
Abstract:
Electronic devices, such as IC devices, are tested by determining a failure net within the electronic device that is causing a device failure. After identifying the failure net, the failure net is locally stressed. The stress is applied so that only the net being tested is subjected to the stress, and the remaining nets and components of the device are not stressed. A change in a signal produced by the failure net is observed while the failure net is being subjected to the stress. Testing in this manner assists in identifying the failure net as a failure source of the device.