John W Elmer
Engineers at Deer Mdw Dr, Danville, CA

6677011, Jan 13, 2004

Mar 2, 2001

09/798729

John W. Elmer - Danville CA
Robert L. Bridges - Knoxville TN

The Regents of the University of California - Oakland CA

B29D 2200

428 341, 428 357

Fluid-forming compositions in a container attached to enclosed adjacent sheets are heated to relatively high temperatures to generate fluids (gases) that effect inflation of the sheets. Fluid rates to the enclosed space between the sheets can be regulated by the canal from the container. Inflated articles can be produced by a continuous, rather than batch-type, process.

7244950, Jul 17, 2007

Jun 21, 2005

11/158481

John W. Elmer - Danville CA, US
Todd A. Palmer - Livermore CA, US
Alan T. Teruya - Livermore CA, US

The Regents of the University of California - Oakland CA

G01N 27/00

250397, 324 713

The present invention relates to a probe for determining the orientation of electron beams being profiled. To accurately time the location of an electron beam, the probe is designed to accept electrons from only a narrowly defined area. The signal produced from the probe is then used as a timing or triggering fiducial for an operably coupled data acquisition system. Such an arrangement eliminates changes in slit geometry, an additional signal feedthrough in the wall of a welding chamber and a second timing or triggering channel on a data acquisition system. As a result, the present invention improves the accuracy of the resulting data by minimizing the adverse effects of current slit triggering methods so as to accurately reconstruct electron or ion beams.

7288772, Oct 30, 2007

Apr 27, 2005

11/116697

John W. Elmer - Danville CA, US
Todd A. Palmer - Livermore CA, US
Alan T. Teruya - Livermore CA, US
Chris C. Walton - Berkeley CA, US

The Regents of the University of California - Oakland CA

G01J 1/00, G03C 5/00, G01R 13/00

250397, 250305, 250306, 250396 R, 2504911

An apparatus for characterization of a micro beam comprising a micro modified Faraday cup assembly including a first layer of material, a second layer of material operatively connected to the first layer of material, a third layer of material operatively connected to the second layer of material, and a fourth layer of material operatively connected to the third layer of material. The first layer of material comprises an electrical conducting material and has at least one first layer radial slit extending through the first layer. An electrical ground is connected to the first layer. The second layer of material comprises an insulating material and has at least one second layer radial slit corresponding to the first layer radial slit in the first layer of material. The second layer radial slit extends through the second layer. The third layer of material comprises a conducting material and has at least one third layer radial slit corresponding to the second layer radial slit in the second layer of material.

7348568, Mar 25, 2008

Jun 22, 2005

11/159978

John W. Elmer - Danville CA, US
Todd A. Palmer - Livermore CA, US
Alan T. Teruya - Livermore CA, US

Lawrence Livermore Natonal Security, LLC - Livermore CA

G01K 1/16

250397

A system for characterizing high power electron beams at power levels of 10 kW and above is described. This system is comprised of a slit disk assembly having a multitude of radial slits, a conducting disk with the same number of radial slits located below the slit disk assembly, a Faraday cup assembly located below the conducting disk, and a start-stop target located proximate the slit disk assembly. In order to keep the system from over-heating during use, a heat sink is placed in close proximity to the components discussed above, and an active cooling system, using water, for example, can be integrated into the heat sink. During use, the high power beam is initially directed onto a start-stop target and after reaching its full power is translated around the slit disk assembly, wherein the beam enters the radial slits and the conducting disk radial slits and is detected at the Faraday cup assembly. A trigger probe assembly can also be integrated into the system in order to aid in the determination of the proper orientation of the beam during reconstruction. After passing over each of the slits, the beam is then rapidly translated back to the start-stop target to minimize the amount of time that the high power beam comes in contact with the slit disk assembly.

6300755, Oct 9, 2001

May 26, 1999

9/320226

John W. Elmer - Danville CA
Alan T. Teruya - Livermore CA

Regents of The University of California - Oakland CA

G01N 2700

324 713

An improved tomographic technique for determining the power distribution of an electron or ion beam using electron beam profile data acquired by an enhanced modified Faraday cup to create an image of the current density in high and low power ion or electron beams. A refractory metal disk with a number of radially extending slits, one slit being about twice the width of the other slits, is placed above a Faraday cup. The electron or ion beam is swept in a circular pattern so that its path crosses each slit in a perpendicular manner, thus acquiring all the data needed for a reconstruction in one circular sweep. The enlarged slit enables orientation of the beam profile with respect to the coordinates of the welding chamber. A second disk having slits therein is positioned below the first slit disk and inside of the Faraday cup and provides a shield to eliminate the majority of secondary electrons and ions from leaving the Faraday cup. Also, a ring is located below the second slit disk to help minimize the amount of secondary electrons and ions from being produced.

7902503, Mar 8, 2011

Aug 8, 2008

12/188398

Alan T. Teruya - Livermore CA, US
John W. Elmer - Danville CA, US
Todd A. Palmer - State College PA, US

Lawrence Livermore National Security, LLC - Livermore CA

H01J 47/00

250305, 250306, 250307, 2504921, 2504923, 2504931, 2503361, 250324, 324 711, 324 713

A diagnostic system for characterization of an electron beam or an ion beam includes an electrical conducting disk of refractory material having a circumference, a center, and a Faraday cup assembly positioned to receive the electron beam or ion beam. At least one slit in the disk provides diagnostic characterization of the electron beam or ion beam. The at least one slit is located between the circumference and the center of the disk and includes a radial portion that is in radial alignment with the center and a portion that deviates from radial alignment with the center. The electron beam or ion beam is directed onto the disk and translated to the at least one slit wherein the electron beam or ion beam enters the at least one slit for providing diagnostic characterization of the electron beam or ion beam.

2007021, Sep 13, 2007

Mar 2, 2006

11/367846

John Elmer - Danville CA, US
Todd Palmer - Livermore CA, US
Alan Teruya - Livermore CA, US

B23K 26/00, H01J 3/14

219121640, 250398000, 250492300

The present invention relates to a method and system for automatically focusing an electron beam. Such an invention is based on a Faraday Cup diagnostic system, often a Modified Faraday Cup (MFC) system that enables tomographic reconstruction of the beam so as to measure beam parameters. Such a reconstruction method and system is automated using a servo-feedback loop to determine, for example, power distributions of the beam so as to provide appropriate adjustments to system controls to enable desired beam focus conditions.

2011012, May 26, 2011

Nov 1, 2010

12/917028

John W. Elmer - Danville CA, US
Alan T. Teruya - Livermore CA, US

G01T 1/00

2503361

A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.

7378830, May 27, 2008

Jun 23, 2005

11/166716

Alan T. Teruya - Livermore CA, US
John W. Elmer - Danville CA, US
Todd A. Palmer - Livermore CA, US
Chris C. Walton - Berkeley CA, US

Lawrence Livermore National Security, LLC - Livermore CA

G01N 27/00

324 713, 324 7611, 324751

A micro beam Faraday cup assembly includes a refractory metal layer with an odd number of thin, radially positioned traces in this refractory metal layer. Some of the radially positioned traces are located at the edge of the micro modified Faraday cup body and some of the radially positioned traces are located in the central portion of the micro modified Faraday cup body. Each set of traces is connected to a separate data acquisition channel to form multiple independent diagnostic networks. The data obtained from the two diagnostic networks are combined and inputted into a computed tomography algorithm to reconstruct the beam shape, size, and power density distribution.

6264880, Jul 24, 2001

Jul 22, 1998

9/120762

John W. Elmer - Danville CA
Robert L. Bridges - Knoxville TN

The Regents of the University of California - Oakland CA

B29C 4416

264572

Fluid-forming compositions in a container attached to enclosed adjacent sheets are heated to relatively high temperatures to generate fluids (gases) that effect inflation of the sheets. Fluid rates to the enclosed space between the sheets can be regulated by the canal from the container. Inflated articles can be produced by a continuous, rather than batch-type, process.