MR. JOHN MICHAEL BREHM, AT, MED
Athletic Trainer at Union Centre Blvd, Hamilton, OH

4803639, Feb 7, 1989

Feb 25, 1986

6/832511

Douglas S. Steele - West Chester OH
Larry C. Howington - West Chester OH
James W. Schuler - Oxford OH
Joseph J. Sostarich - Fairfield OH
Charles R. Wojciechowski - West Chester OH
Theodore W. Sippel - Cincinnati OH
Joseph M. Portaz - Hamilton OH
Ralph G. Isaacs - Cincinnati OH
Henry J. Scudder - Medford MA
Thomas G. Kincaid - Lexington MA
Kristina H. V. Hedengren - Schenectady NY
Rudolph A. A. Koegl - Niskayuna NY
John P. Keaveney - Schenectady NY
Joseph Czechowski - Clifton Park NY
John R. Brehm - Cincinnati OH
James M. Brown - Albany NY
David W. Oliver - Schenectady NY
George E. Williams - Schenectady NY
Richard D. Miller - Schenectady NY

General Electric Company - Cincinnati OH

G06F 1520, G01N 2302

364507

An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination.

6895079, May 17, 2005

Aug 20, 2002

10/224174

Thomas William Birdwell - Middletown OH, US
John Robert Brehm - Middletown OH, US
Andrew Joseph Galish - West Chester OH, US

General Electric Company - Schenectady NY

H01J035/30

378137, 378147

An X-ray inspection system includes an X-ray source that generates more than one beam defining an inspection plane, the beams being substantially parallel to each other; an X-ray detector having a plurality of detector arrays, each of which is aligned with one of the beams, and structure for supporting an object between the X-ray source and the X-ray detector. The X-ray source includes an electron gun and a device for steering an electron beam generated by the gun to multiple focal spots on a target.

7065176, Jun 20, 2006

May 28, 2003

10/250010

Kevin Moermond - Cincinnati OH, US
Andy Joseph Galish - West Chester OH, US
John Robert Brehm - Middletown OH, US
Francis Howard Little - Cincinnati OH, US
Dean Fredrich Graber - Hamilton OH, US
Michael Timothy La Tulippe - Fairfield OH, US
Ronald Cecil McFarland - Cincinnati OH, US

General Electric Company - Schenectady NY

G01B 15/06

378 58

A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.