JOHN L BOTELHO
Gas Fitter in Fall River, MA
License number
Massachusetts 1838
Issued Date
Sep 14, 2004
Expiration Date
May 1, 2018
Type
Apprentice Gas Fitter
Address
Address
Fall River, MA 02724
Personal information
See more information about JOHN L BOTELHO at radaris.comName
Address
Phone
615 Pokross St FL 1, Fall River, MA 02724
615 Pokross St #1, Fall River, MA 02724
5 Katherine St #2, New Bedford, MA 02744
626 Birch St APT 1, Fall River, MA 02724
639 Robeson St, Fall River, MA 02720
Professional information
See more information about JOHN L BOTELHO at trustoria.com
Micro Kelvin Probes And Micro Kelvin Probe Methodology
Micro Kelvin Probes And Micro Kelvin Probe Methodology
US Patent:
7397255, Jul 8, 2008
Filed:
Jun 21, 2006
Appl. No.:
11/425490
Inventors:
John Sousa Botelho - Fall River MA, US
Assignee:
Paricon Technology Corporation - Fall River MA
International Classification:
G01R 31/02
US Classification:
324755, 324719, 324765
Abstract:
A micro Kelvin probe assembly and method of accomplishing a micro Kelvin measurement that determines the resistance or impedance of a device under test (DUT) that has two spaced contacts. An ammeter is used to flow current through the DUT, and a voltmeter is used to measure the voltage drop across the DUT. There is a printed circuit board (PCB) carrying two pairs of contacts, with a trace leading to each contact. Anisotropic conductive elastomer (ACE) material as an electrical interposer is placed in electrical contact with each of the PCB contacts. The DUT is placed on the ACE such that each DUT contact is directly opposite one pair of PCB contacts. The ammeter is connected to one trace leading to one contact of each pair of PCB contacts to flow current through the DUT, and the voltmeter is connected to the other trace leading to the other contact of each pair of PCB contacts, so that voltmeter can measure the voltage drop across the DUT without an effect caused by the interposer.
Micro Kelvin Probes And Micro Kelvin Probe Methodology With Concentric Pad Structures
Micro Kelvin Probes And Micro Kelvin Probe Methodology With Concentric Pad Structures
US Patent:
7408367, Aug 5, 2008
Filed:
Jun 11, 2007
Appl. No.:
11/760917
Inventors:
Roger E. Weiss - Foxboro MA, US
John Sousa Botelho - Fall River MA, US
John Sousa Botelho - Fall River MA, US
Assignee:
Paricon Technologies Corporation - Fall River MA
International Classification:
G01R 31/02
US Classification:
324755, 324719, 324765
Abstract:
A micro Kelvin probe assembly and method of accomplishing a micro Kelvin measurement that determines the resistance or impedance of a device under test (DUT) that has two spaced contacts. An ammeter is used to flow current through the DUT, and a voltmeter is used to measure the voltage drop across the DUT. There is a printed circuit board (PCB) carrying two pairs of contacts, with a trace leading to each contact. Anisotropic conductive elastomer (ACE) material as an electrical interposer is placed in electrical contact with each of the PCB contacts. The DUT is placed on the ACE such that each DUT contact is directly opposite one pair of PCB contacts. The ammeter is connected to one trace leading to one contact of each pair of PCB contacts to flow current through the DUT, and the voltmeter is connected to the other trace leading to the other contact of each pair of PCB contacts, so that voltmeter can measure the voltage drop across the DUT without an effect caused by the interposer. In a further embodiment, the PCB contacts are arranged in concentric circles to provide a contact surface area that is relatively constant and more tolerant of misalignment with the DUT contacts.