DR. JOHN HAYES, PHARMD
Pharmacy at Grant Rd, Tucson, AZ

5200617, Apr 6, 1993

Aug 13, 1992

7/930096

John B. Hayes - Tucson AZ
Jamshid Jahanmir - Tucson AZ
Eric M. Frey - Tucson AZ

Wyko Corporation - Tucson AZ

G01N 2300

250306

A scanning probe microscope includes a base, an inner piezoelectric tube, and an outer PMN translator arrangement including three PMN posts, with first ends of the PMN posts connected to the base. A first end of the inner piezoelectric tube is rigidly connected to second ends of the PMN posts. Inner quadrant conductors are disposed on the inner surfaces of the inner piezoelectric tube, and outer quadrant conductors are disposed on the outer surfaces of the inner piezoelectric tube. Separate x and y scan control voltage signals are applied to corresponding opposed quadrant conductors of the inner piezoelectric tube to control scanning of the free end of the inner tube in the x and y directions. A z scan control voltage is produced by a servo control circuit in response to a probe signal and applied to the PMN posts, which have negligible hysteresis. The servo control circuit refers to a look-up table to correct non-linearities of the PMN posts.

5844675, Dec 1, 1998

May 30, 1997

8/866747

John B. Hayes - Tucson AZ
Eric M. Frey - Tucson AZ

Wyko Corporation - Tucson AZ

G01B 1126, G11B 556

35613903

An interchangeable clamp plate is designed to receive and hold a magnetic-head suspension in a predetermined position in a test clamp of a pitch and roll measuring instrument. The clamp plate comprises a support plate for securing the swage mount of the suspension to a predetermined reference plane and a reference surface integrally formed coplanarly with the support plate in a position within the normal operating range of the optics of the instrument. Each kind of suspension being tested is mounted on a clamp plate conforming to its specific geometry that is adapted for installation in the test instrument prior to measurement. As a result of this configuration, once the instrument is calibrated with respect to the reference surface coplanar with the swage mounting surface, measurement accuracy is inherently maintained during testing. Upon switching to a different kind of suspension, a new clamp plate with a similar integral and coplanar reference surface is installed in the instrument's clamp and used to recalibrate it before test measurements are performed on the new suspension.

5446547, Aug 29, 1995

Apr 29, 1994

8/235105

Bryan W. Guenther - Tucson AZ
Paul J. Caber - Tucson AZ
John B. Hayes - Tucson AZ

Wyko Corporation - Tucson AZ

G01B 1102

356357

A scanning interferometer that utilizes a DC gear motor instead of a PZT translator in closed-loop configuration with an LVTD position sensor. The DC motor is connected to the scanning mechanism so that a rotational motion of the motor shaft produces a translation along the optical axis of either the sample or the objective of the interferometer. During scanning, the motor is driven by the input of a ramp signal into the system. The closed-loop configuration is such that a constant, or nearly constant voltage is applied to the DC motor to produce a constant-speed scan in response to the ramp input. Any non-linearity in the speed of motion is corrected by an adjustment to the motor voltage. At the completion of the scan, the ramp input is removed and the motor is automatically returned to the starting position to satisfy the closed-loop condition. In order to maintain the image in focus on the sensor over the wide range of scanning, a pair of relay lenses is inserted in the optical path between the interferometer and the light detector.

5929987, Jul 27, 1999

Jul 23, 1998

9/121765

John B. Hayes - Tucson AZ

Veeco Corporation - Tucson AZ

G01N 1502

356337

An autocollimator/point-range sensor system produces a linearly polarized light beam that is split into a point-range sensor beam and an autocollimator beam. The linearly polarized point-range sensor beam is utilized to carry out z-position measurements according to prior-art techniques. The autocollimator beam is passed through a quarter-wave plate to introduce a 90-degree phase shift and convert it to circularly polarized light. An analyzer placed in front of the autocollimator detector is positioned such that its transmission axis is offset with respect to the plane of polarization of the linearly polarized point-range sensor beam, thereby blocking any scattered light from the sensor beam while passing a component of the circularly-polarized autocollimator light to reach the detector.

5064286, Nov 12, 1991

May 31, 1990

7/531025

Chiayu Ai - Tucson AZ
John B. Hayes - Tucson AZ

Wyko Corporation - Tucson AZ

G01B 1126

356153

A method and apparatus is disclosed for aligning a reflective surface with an alignment axis in a representative environment of an interferometer. An image of the reflective surface is focused onto a diffuse screen to form a spot image thereon. Rays of the spot image emanating from the diffuse screen are collimated. Some of the collimated rays are focused onto a detector to form a non-inverted image spot. A portion of the collimated rays are intercepted and inverted by means of an image inverter aligned with the alignment axis. The inverted rays are focused onto the detector to form an inverted image spot. The reflecting surface is moved so as to cause the inverted image spot and the non-inverted image spot to coincide, at which point the reflecting surface is aligned with the alignment axis.

5173605, Dec 22, 1992

Mar 9, 1992

7/848106

John B. Hayes - Tucson AZ
Jamshid Jahanmir - Tucson AZ
Eric M. Frey - Tucson AZ

Wyko Corporation - Tucson AZ

G01N 2300

250306

A scanning probe microscope includes a base, an inner piezoelectric tube, and an outer piezoelectric tube, with a first end of the outer piezoelectric tube connected to the base. A first end of the inner piezoelectric tube is rigidly connected to a second end of the outer piezoelectric tube. Thin inner conductors are disposed on the inner surfaces of the inner piezoelectric tube and the outer piezoelectric tube, and quadrant conductors are disposed on the outer surfaces of the inner piezoelectric tube and the outer piezoelectric tube. Separate x, y, and z scan control voltage signals are applied to various quadrant conductors of the inner and outer piezoelectric tubes to control scanning of the free end of the inner tube in the x, y, and z directions, respectively.

7057737, Jun 6, 2006

Aug 29, 2003

10/652903

James E. Millerd - Tucson AZ, US
Neal J. Brock - Tucson AZ, US
John B. Hayes - Tucson AZ, US
James C. Wyant - Tucson AZ, US

4D Technology Corporation - Tucson AZ

G01B 9/02

356495, 356515

A polarizing point-diffraction plate is used to produce common-path test and reference wavefronts with mutually orthogonal polarizations from an input wavefront. The common-path test and reference wavefronts are collimated, phase shifted and interfered, and the resulting interferograms are imaged on a detector. The interference patterns are then processed using conventional algorithms to characterize the input light wavefront.

7230717, Jun 12, 2007

May 4, 2004

10/838694

Neal J. Brock - Tucson AZ, US
James E. Millerd - Tucson AZ, US
James C. Wyant - Tucson AZ, US
John B. Hayes - Tucson AZ, US

4D Technology Corporation - Tucson AZ

G01B 11/02, G01B 9/02

356495, 356521

A phase-difference sensor measures the spatially resolved difference in phase between orthogonally polarized reference and test wavefronts. The sensor is constructed as a pixelated phase-mask aligned to and imaged on a pixelated detector array. Each adjacent pixel of the phase-mask measures a predetermined relative phase shift between the orthogonally polarized reference and test beams. Thus, multiple phase-shifted interferograms can be synthesized at the same time by combining pixels with identical phase-shifts. The multiple phase-shifted interferograms can be combined to calculate standard parameters such as modulation index or average phase step. Any configuration of interferometer that produces orthogonally polarized reference and object beams may be combined with the phase-difference sensor of the invention to provide, single-shot, simultaneous phase-shifting measurements.

5995215, Nov 30, 1999

Jul 8, 1997

8/889675

John B. Hayes - Tucson AZ

Wyko Corporation - Tucson AZ

G01B 1126

356153

An optical crossed grating is used to calibrate a conventional autocollimator operated with a single-frequency light source. Since a collimated monochromatic beam is diffracted at a number of well known angles after being reflected from the grating, an array of spots is formed on the detector surface that makes it possible to calibrate the autocollimator in a single operation. Because the angle of the diffracted light is determined only by the spacing in the grid, the calibration accuracy is insensitive to temperature variations and to the position of the grid on the sample stage. The calibration scaling values are calculated simply by measuring the spot spacings on the detector surface in relation to the diffraction angles corresponding to the grid spacing.

4955719, Sep 11, 1990

Dec 9, 1988

7/282473

John B. Hayes - Tucson AZ

Wyko Corporation - Tucson AZ

G01B 902, G01B 522

356359

An interferometer includes a thin, absorbing pellicle in the path of a test beam to attenuate the test beam so that its intensity is approximately equal to the intensity of a reference beam. The pellicle reflects less than about six percent of the test beam, thereby avoiding spurious reflections that produce spurious fringes.