John Edward Herczeg
Engineers at Huron Ct, Boulder, CO
License number
Colorado 56101
Issued Date
Aug 21, 1989
Renew Date
Aug 21, 1989
Type
Engineer Intern
Address
Address
78 Huron Ct, Boulder, CO 80303
Professional information
Method For Improving A Printed Circuit Board Development Cycle
US Patent:
2008014, Jun 19, 2008
Filed:
Jan 22, 2008
Appl. No.:
12/009938
Inventors:
Chris R. Jacobsen - Fort Collins CO, US
Kenneth P. Parker - Fort Collins CO, US
John E. Herczeg - Boulder CO, US
Kenneth P. Parker - Fort Collins CO, US
John E. Herczeg - Boulder CO, US
International Classification:
G06F 17/50
US Classification:
716 8
Abstract:
Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probes insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred probing location and any associated alternate probing locations for said respective nets. Fixture probes are preferably inserted in the PCB tester fixture design at respective preferred probing locations to exactly align with corresponding preferred test pads of a PCB implemented in accordance with the PCB design should the PCB be mounted in a printed circuit board tester fixture implemented in accordance with the PCB tester fixture design.
Printed Circuit Board Development Cycle Using Probe Location Automation And Bead Probe Technology
US Patent:
2006012, Jun 15, 2006
Filed:
Dec 10, 2004
Appl. No.:
11/009117
Inventors:
Chris Jacobsen - Fort Collins CO, US
Kenneth Parker - Fort Collins CO, US
John Herczeg - Boulder CO, US
Kenneth Parker - Fort Collins CO, US
John Herczeg - Boulder CO, US
International Classification:
G06F 17/50, G01R 31/02
US Classification:
716004000, 324754000, 324758000
Abstract:
Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probes insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred probing location and any associated alternate probing locations for said respective nets. Fixture probes are preferably inserted in the PCB tester fixture design at respective preferred probing locations to exactly align with corresponding preferred test pads of a PCB implemented in accordance with the PCB design should the PCB be mounted in a printed circuit board tester fixture implemented in accordance with the PCB tester fixture design.
Method And System For Implicitly Encoding Preferred Probing Locations In A Printed Circuit Board Design For Use In Tester Fixture Build
US Patent:
2006012, Jun 15, 2006
Filed:
Dec 10, 2004
Appl. No.:
11/010074
Inventors:
Chris Jacobsen - Fort Collins CO, US
Kenneth Parker - Fort Collins CO, US
John Herczeg - Boulder CO, US
Kenneth Parker - Fort Collins CO, US
John Herczeg - Boulder CO, US
International Classification:
G01R 31/02
US Classification:
324754000
Abstract:
Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probe insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred and alternate probing locations for said respective nets. Fixture probes are preferably inserted in the PCB tester fixture design at respective preferred probing locations such that tips of said respective fixture probes exactly align with corresponding preferred test pads of a PCB implemented in accordance with the PCB design should the PCB be mounted in a printed circuit board tester fixture implemented in accordance with the PCB tester fixture design.