JOHN DEGREE HENION
Pilots at Iradell Rd, Trumansburg, NY

License number
New York A0825088
Issued Date
Jan 2017
Expiration Date
Jan 2019
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
435 Iradell Rd, Trumansburg, NY 14886

Professional information

John Henion Photo 1

Thermal-Assisted Electrospray Interface (Taesi) For Lc/Ms

US Patent:
4935624, Jun 19, 1990
Filed:
Jun 3, 1988
Appl. No.:
7/202768
Inventors:
John D. Henion - Trumansburg NY
Edgar D. Lee - Ithaca NY
Thomas R. Covey - Ithaca NY
Assignee:
Cornell Research Foundation, Inc. - Ithaca NY
International Classification:
H01J 4910
US Classification:
250288
Abstract:
A Thermal-Assisted Electrospray Interface (TAESI) used in series between a liquid chromatograph and a mass analyzer gives increased sensitivity for detection of components in a liquid stream at high flow rates up to 2 milliliters per minute. Liquid exiting the liquid chromatograph is sprayed through a stainless steel capillary tube while being heated externally and under an applied voltage of about 3 KV. The combination of thermal energy and electric field potential disperses the liquid into a fine mist which is then directed at atmospheric pressure into the ionization chamber of a mass spectrometer. Such a system, optionally may additionally contain a high velocity gas flow neubulization means. The TAESI interface may be used without the electric field; however at flow rates of from 500 to 1000. mu. L/min the use of both electric field and thermal energy increases the sensitivity by two orders of magnitude over the interface used without the electric field.


John Henion Photo 2

Atmospheric Pressure Ion Interface For A Mass Analyzer

US Patent:
5352892, Oct 4, 1994
Filed:
Jan 26, 1993
Appl. No.:
8/009063
Inventors:
Alex Mordehai - Ithaca NY
Gerard Hopfgartner - Ithaca NY
John D. Henion - Trumansburg NY
Assignee:
Cornell Research Foundation, Inc. - Ithaca NY
International Classification:
B01D 5944, H01J 4900
US Classification:
250288
Abstract:
A novel atmospheric pressure ionization device for the transport of charged particle produced by at atmospheric pressure to a mass analyzer includes a liquid shield between the particle source and the sample inlet into the mass analyzer. The liquid shield may be in the form of a disk with a central aperture and acts as a spray splitter and aerofocusing device which increases the flow rate of a liquid sample into the analyzer. The mass analyzer is located in a high vacuum region and an intermediate low vacuum region is provided between the sample inlet and the analyzer. An ion optical system includes electrostatic lens assemblies in said vacuum regions for transporting charged particles from the inlet to the analyzer.


John Henion Photo 3

Differentially Pumped Ion Trap Mass Spectrometer

US Patent:
5268572, Dec 7, 1993
Filed:
Sep 23, 1992
Appl. No.:
7/948394
Inventors:
Alex Mordehai - Ithaca NY
John D. Henion - Trumansburg NY
Assignee:
Cornell Research Foundation, Inc. - Ithaca NY
International Classification:
H01J 4924, H01J 4942
US Classification:
250289
Abstract:
An ion trap mass spectrometer includes an ion trap region separated from an electron multiplier region by a baffle, and separate turbomolecular pumps for pumping each region to a different pressure level. The ion trap region can therefore be pumped to a higher pressure level than ca be used for the electron multiplier region, and the result and increase in pressure of damping gas in the ion trap region increases the sensitivity of the device.


John Henion Photo 4

Atmospheric Pressure Ionization (Api) Interface Structures For A Mass Spectrometer

US Patent:
2010007, Apr 1, 2010
Filed:
Sep 23, 2009
Appl. No.:
12/565320
Inventors:
Thomas Corso - Groton NY, US
John D. Henion - Trumansburg NY, US
Assignee:
ADVION BIOSCIENCES, INC. - Ithaca NY
International Classification:
H01J 49/04
US Classification:
250288, 250292
Abstract:
Atmospheric pressure ionization (API) interface structures such as API interface structures for mass spectrometers and related components, systems and methods are described herein.


John Henion Photo 5

Ion Spray Apparatus And Method

US Patent:
4861988, Aug 29, 1989
Filed:
Sep 30, 1987
Appl. No.:
7/103056
Inventors:
John D. Henion - Trumansburg NY
Thomas R. Covey - Houston TX
Andries P. Bruins - Leek, NL
Assignee:
Cornell Research Foundation, Inc. - Ithaca NY
International Classification:
B01D 5944
US Classification:
290288
Abstract:
A device for interfacing between a microbore liquid chromatograph and a mass analyser. In such a device, liquid from the liquid chromatograph is sprayed through a stainless steel capillary tube into the atmospheric pressure ionization chamber of a mass spectrometer. A voltage of e. g. , plus or minus 3 KV is applied to the stainless steel tube, and a nebulizing gas, e. g. nitrogen, is directed at high velocity past the tube tip through another tube encircling the stainless steel tube. The combination of the nebulizing gas and the electric potential disperses the liquid at room temperature into a fine mist providing an increased and more stable ion signal without thermal decomposition of the compounds being analysed.


John Henion Photo 6

Solid-Phase Extraction (Spe) Tips And Methods Of Use

US Patent:
8546752, Oct 1, 2013
Filed:
Dec 3, 2010
Appl. No.:
12/960037
Inventors:
John D. Henion - Trumansburg NY, US
Thomas Kurz - Ithaca NY, US
Assignee:
Advion Inc. - Ithaca NY
International Classification:
H01J 49/26
US Classification:
250288, 250282
Abstract:
Methods and systems for extraction of analytes from samples for analysis using mass spectrometers are described herein.


John Henion Photo 7

Mechanical Holder For Surface Analysis

US Patent:
8445842, May 21, 2013
Filed:
Jul 30, 2012
Appl. No.:
13/561358
Inventors:
Daniel Eikel - Trumansburg NY, US
John D. Henion - Trumansburg NY, US
Christopher Alpha - Ithaca NY, US
Jason Scott Vega - Ithaca NY, US
Assignee:
Advion, Inc. - Ithaca NY
International Classification:
G01N 1/00, G01N 1/28, H01J 49/26
US Classification:
250281, 250288, 250428, 7386491, 436174, 422527, 422561
Abstract:
A mechanical holder that provides for a confined sampling region for extraction and removal of chemical substances contained in a dried blood spot or other spot of sample is described herein.


John Henion Photo 8

Mechanical Holder For Surface Analysis

US Patent:
8294087, Oct 23, 2012
Filed:
May 4, 2011
Appl. No.:
13/100383
Inventors:
Daniel Eikel - Lansing NY, US
John D. Henion - Trumansburg NY, US
Christopher Alpha - Ithaca NY, US
Jason Scott Vega - Ithaca NY, US
Assignee:
Advion, Inc. - Ithaca NY
International Classification:
G01N 1/00, G01N 1/28, H01J 49/26
US Classification:
250282, 250281, 250288, 250428, 7386491, 436174
Abstract:
A mechanical holder that provides for a confined sampling region for extraction and removal of chemical substances contained in a dried blood spot or other spot of sample is described herein.