JOHN CUMMINS HATHAWAY
Pilots at Emmons Rd, Falmouth, MA

License number
Massachusetts A0799219
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
16 Emmons Rd, Falmouth, MA 02540

Personal information

See more information about JOHN CUMMINS HATHAWAY at radaris.com
Name
Address
Phone
John Hathaway
4 Fairview Dr, Westford, MA 01886
John Hathaway
39 Benson Rd, Stoughton, MA 02072
John Hathaway
9 Bartlett St, Leominster, MA 01453
John Hathaway
6 Maplehurst Rd, Littleton, MA 01460
John Hathaway
9 Bartlett St, Leominster, MA 01453

Professional information

See more information about JOHN CUMMINS HATHAWAY at trustoria.com
John Hathaway Photo 1
Sample Mount For X-Ray Diffraction

Sample Mount For X-Ray Diffraction

US Patent:
4278883, Jul 14, 1981
Filed:
Dec 27, 1979
Appl. No.:
6/108260
Inventors:
John C. Hathaway - Falmouth MA
Lawrence J. Poppe - E. Falmouth MA
Assignee:
The United States of America as represented by the Secretary of the
Interior - Washington DC
International Classification:
G01N 2320
US Classification:
250277CH
Abstract:
A sample mount assembly for use with an X-ray diffractometer. The assembly includes a holder with an opening extending therethrough, an insert to fit into the holder through its opening, a substrate filter layer, and the exposed sample layer mounted on the filter. The holder's opening is larger at its lower surface than at its upper surface such, that the insert which is shaped as a four side truncated pyramid, can be placed into the holder from its lower surface but not through its upper surface opening. The layer filter with its mounted sample layer is sandwiched between the insert and holder to allow the sample to be exposed to incident X-rays through the holder's upper surface. Plastic tape or some other securing mechanism is used to secure the holder to the insert at the holder's lower surface. The result is a mount that allows easy installation and removal with automatic sample changers for X-ray diffraction of the membranes with no vertical offset and a flat, even, sample upper surface.