John Clyde Stover
Engineers in Bozeman, MT
License number
Colorado 12156
Issued Date
Sep 22, 1973
Renew Date
Apr 2, 1983
Expiration Date
Apr 2, 1983
Type
Professional Engineer
Address
Address
PO Box 382, Bozeman, MT 59715
Professional information
Apparatus And Process For Measuring Gap And Mismatch
US Patent:
5416590, May 16, 1995
Filed:
Apr 19, 1993
Appl. No.:
8/049478
Inventors:
John C. Stover - Bozeman MT
Donald R. Bjork - Bozeman MT
Donald A. Rudberg - Bozeman MT
Mark E. Southwood - Bozeman MT
Brett D. Swimley - Bozeman MT
Donald R. Bjork - Bozeman MT
Donald A. Rudberg - Bozeman MT
Mark E. Southwood - Bozeman MT
Brett D. Swimley - Bozeman MT
Assignee:
TMA Technologies, Inc. - Bozeman MT
International Classification:
G01B 1114
US Classification:
356375
Abstract:
A hand-held apparatus and process for measuring the gap and mismatch of two adjacent surfaces. The apparatus includes two strobe lights positioned within a hand-held housing. An optical interface within the housing directs a portion of the light generated by each light source into substantially parallel planes which are projected out of the opening of the housing at converging angles onto the surfaces to be measured. A camera within the housing captures the resulting image and generates a signal corresponding to the image. A signal processor which includes a frame grabber card processes the signal generated by the array of detectors to thereby calculate the amount of gap and mismatch between the surfaces being measured.
Surface Inspection And Characterization System And Process
US Patent:
5406082, Apr 11, 1995
Filed:
Nov 27, 1992
Appl. No.:
7/982293
Inventors:
Lee H. Pearson - Bear River City UT
John Stover - Bozeman MT
Mary Knighton - Bozeman MT
Brett Swimley - Bozeman MT
John Stover - Bozeman MT
Mary Knighton - Bozeman MT
Brett Swimley - Bozeman MT
Assignee:
Thiokol Corporation - Ogden UT
International Classification:
G01N 2135, G01N 2147
US Classification:
25033901
Abstract:
A system and process for obtaining near real time, non-destructive inspection and characterization of surfaces. The system includes an infrared light source which is directed on a surface to be inspected. A portion of the reflected light is gathered and directed through an optical filter arrangement which separates the light into a plurality of sets of wavelengths which correspond to particular physical properties of the thin film, such as absorbance. The intensity of each set of wavelengths is detected by optical detectors and the resulting signals analyzed to characterize the surface.
Modular Scatterometer With Interchangeable Scanning Heads
US Patent:
5196906, Mar 23, 1993
Filed:
Jun 29, 1990
Appl. No.:
7/547468
Inventors:
John C. Stover - Bozeman MT
James A. Bender - Bozeman MT
Marvin L. Bernt - Bozeman MT
Donald R. Bjork - Bozeman MT
Paul D. Chausse - Bozeman MT
Daniel R. Cheever - Bozeman MT
Kelly H. Kirchner - Bozeman MT
Tod F. Schiff - Bozeman MT
Vincent C. Skurdal - Bozeman MT
James A. Bender - Bozeman MT
Marvin L. Bernt - Bozeman MT
Donald R. Bjork - Bozeman MT
Paul D. Chausse - Bozeman MT
Daniel R. Cheever - Bozeman MT
Kelly H. Kirchner - Bozeman MT
Tod F. Schiff - Bozeman MT
Vincent C. Skurdal - Bozeman MT
Assignee:
TMA Technologies, Inc. - Bozeman MT
International Classification:
G01N 2147
US Classification:
356446
Abstract:
An optical measurement device produces quality light scatter measurements using Bidirectional Reflective Distribution Function (BRDF) techniques to analyze data generated from an accurate, portable, relatively inexpensive scatterometer. The scatterometer is provided with interchangeable scanning heads, each scanning head being equipped with ROM data storage containing certain configuration information about the scanning head. The use of the interchangeable scanning heads allows the present invention to make measurements of light scatter for a wide variety of applications and samples under a variety of environmental conditions where scatter measurement has previously not been feasible.