Jerry Zweigenbaum
Electrician in Middletown, DE
License number
Delaware TH-0000297
Issued Date
Oct 27, 2003
Expiration Date
Oct 27, 2004
Category
Electrical Examiners
Type
Homeowner's Permit
Address
Address
2
Middletown, DE 19709
Professional information
Determination Of Chemical Empirical Formulas Of Unknown Compounds Using Accurate Ion Mass Measurement Of All Isotopes
US Patent:
7855356, Dec 21, 2010
Filed:
Nov 26, 2008
Appl. No.:
12/324351
Inventors:
Jerry A. Zweigenbaum - Middletown DE, US
Earl M. Thurman - Almerta, ES
Imma Ferrer - Almerla, ES
Earl M. Thurman - Almerta, ES
Imma Ferrer - Almerla, ES
Assignee:
Agilent Technologies, Inc. - Santa Clara CA
International Classification:
G01N 33/48
US Classification:
250281, 250282, 702 19, 702 23
Abstract:
A method of determining an empirical formula of an analyte ion from a measured mass spectrum including a main peak and one or more isotope peaks. The method comprises comparing a relative isotopic intensity of the measured isotope peak to a calculated relative isotopic intensity of an isotopic ion of a proposed empirical formula and comparing a relative mass defect of the measured isotope peak to a calculated relative mass defect of the isotopic ion of the proposed empirical formula. The proposed empirical formula is identified as a potential candidate for the analyte ion based on these comparisons.
Determination Of Chemical Empirical Formulas Of Unknown Compounds Using Accurate Ion Mass Measurement Of All Isotopes
US Patent:
2007011, May 24, 2007
Filed:
Nov 4, 2005
Appl. No.:
11/267721
Inventors:
Jerry Zweigenbaum - Middletown DE, US
Earl Thurman - Almeria, ES
Imma Ferrer - Almeria, ES
Earl Thurman - Almeria, ES
Imma Ferrer - Almeria, ES
International Classification:
B01D 59/44
US Classification:
250282000
Abstract:
A method of determining an empirical formula of an analyte ion from a measured mass spectrum including a main peak and one or more isotope peaks. The method comprises comparing a relative isotopic intensity of the measured isotope peak to a calculated relative isotopic intensity of an isotopic ion of a proposed empirical formula and comparing a relative mass defect of the measured isotope peak to a calculated relative mass defect of the isotopic ion of the proposed empirical formula. The proposed empirical formula is identified as a potential candidate for the analyte ion based on these comparisons.