JEFFREY H DIEP
Broker in Quincy, MA
License number
Massachusetts 9055388
Issued Date
Jun 26, 2003
Expiration Date
Nov 26, 2007
Type
Salesperson
Address
Address
Quincy, MA 02169
Professional information
Mass Spectrometer For Trace Gas Leak Detection With Suppression Of Undesired Ions
US Patent:
7459677, Dec 2, 2008
Filed:
Feb 15, 2006
Appl. No.:
11/354410
Inventors:
J. Daniel Geist - Boxborough MA, US
Jeffrey Diep - Quincy MA, US
Peter Williams - Phoenix AZ, US
Charles W. Perkins - Boston MA, US
Jeffrey Diep - Quincy MA, US
Peter Williams - Phoenix AZ, US
Charles W. Perkins - Boston MA, US
Assignee:
Varian, Inc. - Palo Alto CA
International Classification:
B01D 59/44
US Classification:
250288, 250282, 250299, 250300
Abstract:
Mass spectrometers for trace gas leak detection and methods for operating mass spectrometers are provided. The mass spectrometer includes an ion source to ionize trace gases, such as helium, a magnet to deflect the ions and a detector to detect the deflected ions. The ion source includes an electron source, such a filament. The method includes operating the electron source at an electron accelerating potential relative to an ionization chamber sufficient to ionize the trace gas but insufficient to form undesired ions, such as triply charged carbon.
High Sensitivity Slitless Ion Source Mass Spectrometer For Trace Gas Leak Detection
US Patent:
2007018, Aug 16, 2007
Filed:
Feb 15, 2006
Appl. No.:
11/354737
Inventors:
J. Geist - Boxborough MA, US
Jeffrey Diep - Quincy MA, US
Peter Williams - Phoenix AZ, US
Charles Perkins - Boston MA, US
Jeffrey Diep - Quincy MA, US
Peter Williams - Phoenix AZ, US
Charles Perkins - Boston MA, US
International Classification:
H01J 49/30, H01J 49/14
US Classification:
250298000, 250427000
Abstract:
A mass spectrometer includes a main magnet having spaced-apart polepieces which define a gap, the main magnet producing a magnetic field in the gap, an ion source to generate ions and to accelerate the ions into the magnetic field in the gap, the ion source located outside the gap, and an ion detector to detect a selected species of the ions generated by the ion source and deflected by the magnetic field. The ion detector is located in the gap at a natural focus point of the selected species of ions. The mass spectrometer may be used in a trace gas leak detector.