Inventors:
Kristoph D. Krug - Framingham MA
William F. Aitkenhead - Sharon MA
Richard F. Eilbert - Lincoln MA
Jeffrey H. Stillson - Nashua NH
Jay A. Stein - Framingham MA
Assignee:
Vivid Technologies, Inc. - Woburn MA
International Classification:
G01N 2310
Abstract:
An X-ray inspection device for detecting a specific material of interest (typically contraband, for example, weapons, drugs, money, explosives) in items of various sizes and shapes includes an X-ray source system located at an inspection region and constructed to expose the examined item to at least one beam of X-ray radiation, one or more x-ray detection systems located at the inspection region and constructed to detect x-ray radiation modified by the examined item. The X-ray inspection device also includes one or more dimension detectors constructed to measure a selected dimension of the examined item, an interface system connected to receive X-ray data and dimension data, and a computer programmed to utilize the data for recognition of the specific material of interest and to indicate its presence in the examined item. The X-ray detection systems detect transmitted and/or scattered X-ray radiation utilizing several different geometries. There may be one or more X-ray back-scatter detection systems, or one or more X-ray forward-scatter detection systems detecting X-ray radiation scattered at different angles from different surfaces of the examined item.