James R. Turner
Accountancy in Vienna, VA

3963992, Jun 15, 1976

Aug 14, 1974

5/497483

Norris C. Hekimian - Rockville MD
James F. Turner - Oakton VA

Hekimian Laboratories, Inc. - Rockville MD

H03G 300

330127

An intermodulation distortion analyzer generates two pairs of sinusoidal test tones to serve as a test signal for the channel under test. The two pairs of tones simulate two respective noise band test signals but eliminate the long time averaging required for measurements when noise bands are used. A highly linear AGC circuit employs sampling at an output-controlled duty cycle to maintain a constant reference level for the analyzer. This reference level permits automatic distortion measurements to be read out directly in db below the test signal. An RMS detector circuit for second order intermodulation products employs feedback control to maintain the input signal to a squaring circuit constant. Squaring of the constant level sinusoids produces RMS DC components which can be separated for direct measurement. A distortion circuit provides known levels of second and third order intermodulation in the test signal to permit accurate check out of the analyzer.

4272738, Jun 9, 1981

Apr 25, 1978

5/899936

James F. Turner - Oakton VA

Convex Corporation - Fairfax VA

H03H 703, H04B 314

333 28R

Programmable or fixed delay response shape bulk delay extender circuit for a line conditioner or equalizer system having a cascade set of all pass sections for processing signals in which said sections introduce for different frequencies a delay of said signals, and programming apparatus for selectively neutralizing such delay introduced therein by one or more of the all pass sections to produce various delay response shapes or to effect a complete bypass of the bulk delay extender. The programming apparatus is a multi-position rotary switch having both indication mechanism and controlling mechanism selectively neutralizing delay introduced by one or more of the all pass sections to produce various delay response shapes or effecting a complete bypass of the bulk delay extender. The indication mechanism may include a panel adjacently positioned to the multi-position rotary switch, the panel having data indicative of the effective neutralization of the various selected programs and may also include data indicative of a bypassed or non-bypassed condition of the bulk delay extender.

3940703, Feb 24, 1976

Aug 14, 1974

5/497482

Norris C. Hekimian - Rockville MD
James F. Turner - Oakton VA

Hekimian Laboratories, Inc. - Rockville MD

H03B 2100

328144

An intermodulation distortion analyzer generates two pairs of sinusoidal test tones to serve as a test signal for the channel under test. The two pairs of tones simulate two respective noise band test signals but eliminate the long time averaging required for measurements when noise bands are used. A highly linear AGC circuit employs sampling at an output-controlled duty cycle to maintain a constant reference level for the analyzer. This reference level permits automatic distortion measurements to be read out directly in db below the test signal. An RMS detector circuit for second order intermodulation products employs feedback control to maintain the input signal to a squaring circuit constant. Squaring of the constant level sinusoids produces RMS DC components which can be separated for direct measurement. A distortion circuit provides known levels of second and third order intermodulation in the test signal to permit accurate check out of the analyzer.

D253887, Jan 8, 1980

Jun 28, 1977

5/811457

James F. Turner - Oakton VA
Gary A. Dixon - Dunn Loring VA

D1303

D13 35