JAMES M BECKER, M.D.
Radiology at Newton St, Boston, MA
License number
Massachusetts 71589
Category
Radiology
Type
Surgery
Address
Address
88 E Newton St, Boston, MA 02118
Phone
(617) 638-8600
(617) 638-8607 (Fax)
(617) 638-8607 (Fax)
Personal information
See more information about JAMES M BECKER at radaris.comName
Address
Phone
5 Village Way, Brockton, MA 02301
Organization information
See more information about JAMES M BECKER at bizstanding.comBoston Medical Center - James M Becker MD
88 E Newton St, Boston, MA 02118
Categories:
General Surgeons, Physicians & Surgeons
Phone:
(617) 638-8605 (Phone)
Professional information
Senior Brass Repair Technician At Osmun Music
Position:
Senior Brass Repair Technician at Osmun Music
Location:
Greater Boston Area
Industry:
Music
Work:
Osmun Music
-
Senior Brass Repair Technician
James M Becker, Newton MA
Specialties:
Surgery, Colon & Rectal Surgery
Work:
Newton-Wellesley Hospital
2000 Washington St, Lunenburg, MA 01462 James J Carter
930 Commonwealth Ave, Boston, MA 02215
2000 Washington St, Lunenburg, MA 01462 James J Carter
930 Commonwealth Ave, Boston, MA 02215
Education:
Case Western Reserve University(1975)
Apparatus And Method For Performing Amplitude Calibration In An Electronic Circuit Tester
US Patent:
5929628, Jul 27, 1999
Filed:
Dec 5, 1996
Appl. No.:
8/760537
Inventors:
James H. Becker - Boston MA
Kenneth F. Coop - Walpole MA
Kenneth F. Coop - Walpole MA
Assignee:
Teradyne, Inc. - Boston MA
International Classification:
G01R 3128
US Classification:
3241581
Abstract:
An electronic circuit tester, having an amplitude calibration feature, for accurately measuring signals produced by an electronic device under test, including a plurality of channels, data acquisition circuitry, an internal calibration source, and a digital filter. The internal calibration source is calibrated to a known standard. The tester then uses the internal calibration source to measure a signal amplitude error introduced by the channels and data acquisition circuitry. Next, the digital filter is automatically adjusted to correct the signal amplitude error, thereby presenting corrected data samples to a test computer for subsequent analysis.
Fast Undersampling
US Patent:
5768155, Jun 16, 1998
Filed:
Dec 6, 1996
Appl. No.:
8/760887
Inventors:
James H. Becker - Boston MA
Assignee:
Teradyne, Inc. - Boston MA
International Classification:
G01R 2300
US Classification:
364572
Abstract:
A method of operating automatic test equipment for sampling an electronic signal produced by a device under test, whereby an effective sampling frequency, FEFF, is determined such that FEFF=NFREP, where N is a desired number of data samples and FREP is the repetition frequency of the electronic signal. At least one replication of the electronic signal is then sampled at a rate equal to FACT, where FACT is equal to FEFF/K, and K is a positive integer value other than one. The value, K, and the number of data samples, N, have no common multiplicative values. As a result, the set of data samples, obtained after sampling at least one replication of the electronic signal at the rate FACT, contains all of the data samples that would be obtained by sampling one replication of the electronic signal at the rate FEFF. The set of data samples can then be reordered to facilitate subsequent analysis of the data samples by the automatic test equipment.