HOMER D ECKHARDT
Engineering in Lincoln Center, MA
License number
Massachusetts 25598
Issued Date
Dec 17, 1971
Expiration Date
Jun 30, 2018
Type
Aeronautical Engineer
Address
Address
Lincoln Center, MA 01773
Professional information
Apparatus For Measuring Bulk Materials And Surface Conditions For Flat And Curved Parts
US Patent:
2001001, Aug 23, 2001
Filed:
Dec 28, 2000
Appl. No.:
09/750413
Inventors:
Neil Goldfine - Newton MA, US
David Clark - Arlington MA, US
Homer Eckhardt - Lincoln MA, US
David Clark - Arlington MA, US
Homer Eckhardt - Lincoln MA, US
Assignee:
JENTEK Sensors, Inc. - Watertown MA
International Classification:
G01N027/72
US Classification:
324/242000, 324/243000, 324/239000
Abstract:
A meandering winding magnetometer (MWM) includes a meandering primary winding and at least one sensing winding or coil on a membrane to be pressed against a test surface. The membrane may be supported on a flexible carrier which is translatable into a probe. Abutments in the probe press the carrier against the test surface but allow the carrier and membrane to conform to the test surface. One MWM circuit includes meandering primary and secondary windings. The return leads from the secondary winding return to connector pads in close alignment with the test array, while leads from the primary winding are spaced at least one wavelength from the array. In another MWM circuit, individual sensing loops are positioned within the meandering primary winding. The MWM circuit may be provided on an adhesive tape which may be cut to length.
Apparatus For Measuring Bulk Materials And Surface Conditions For Flat And Curved Parts
US Patent:
5966011, Oct 12, 1999
Filed:
Jul 27, 1998
Appl. No.:
9/122980
Inventors:
Neil J. Goldfine - Newton MA
David C. Clark - Arlington MA
Homer D. Eckhardt - Lincoln MA
David C. Clark - Arlington MA
Homer D. Eckhardt - Lincoln MA
Assignee:
Jentek Sensors, Inc. - Watertown MA
International Classification:
G01N 2772, G01N 2782, G01R 3312
US Classification:
324242
Abstract:
A meandering winding magnetometer (MWM) includes a meandering primary winding and at least one sensing winding or coil on a membrane to be pressed against a test surface. The membrane may be supported on a flexible carrier which is translatable into a probe. Abutments in the probe press the carrier against the test surface but allow the carrier and membrane to conform to the test surface. One MWM circuit includes meandering primary and secondary windings. The return leads from the secondary winding return to connector pads in close alignment with the test array, while leads from the primary winding are spaced at least one wavelength from the array. In another MWM circuit, individual sensing loops are positioned within the meandering primary winding. The MWM circuit may be provided on an adhesive tape which may be cut to length.
Meandering Winding Test Circuit
US Patent:
5793206, Aug 11, 1998
Filed:
Aug 23, 1996
Appl. No.:
8/702276
Inventors:
Neil J. Goldfine - Newton MA
David C. Clark - Arlington MA
Homer D. Eckhardt - Lincoln MA
David C. Clark - Arlington MA
Homer D. Eckhardt - Lincoln MA
Assignee:
JENTEK Sensors, Inc. - Watertown MA
International Classification:
G01N 2772, G01N 2782, G01R 3312, G01B 710
US Classification:
324242
Abstract:
A meandering winding magnetometer (MWM) includes a meandering primary winding and at least one sensing winding or coil on a membrane to be pressed against a test surface. The membrane may be supported on a flexible carrier which is translatable into a probe. Abutments in the probe press the carrier against the test surface but allow the carrier and membrane to conform to the test surface. One MWM circuit includes meandering primary and secondary windings. The return leads from the secondary winding return to connector pads in close alignment with the test array, while leads from the primary winding are spaced at least one wavelength from the array. In another MWM circuit, individual sensing loops are positioned within the meandering primary winding. The MWM circuit may be provided on an adhesive tape which may be cut to length.