Inventors:
Lou Dietz - Mountain View CA, US
Kurt Kuhlmann - San Jose CA, US
Lokesh Tatke - Sunnyvale CA, US
Suraj Somwanshi - Cupertino CA, US
Christopher Todd - San Jose CA, US
Glenn Stark - Scotts Valley CA, US
Barry Rodriguez - San Jose CA, US
Gregory Loney - Los Altos CA, US
Bikash Sabata - Beverly Hills CA, US
Ronald L. Allen - San Jose CA, US
Suhas Patil - Pune, IN
Sujit Chivate - Pune, IN
Prashanth Ravindran - Pune, IN
Sanford Barsky - Columbus OH, US
Assignee:
Ventana Medical Systems, Inc. - Tucson AZ
International Classification:
H04N 7/18
Abstract:
Provided herein are systems methods including a design of a microscope slide scanner for digital pathology applications which provides high quality images and automated batch-mode operation at low cost. The instrument architecture is advantageously based on a convergence of high performance, yet low cost, computing technologies, interfaces and software standards to enable high quality digital microscopy at very low cost. Also provided is a method based in part on a stitching method that allows for dividing an image into a number of overlapping tiles and reconstituting the image with a magnification without substantial loss of accuracy. A scanner is employed in capturing snapshot images. The method allows for overlapping images captured in consecutive snapshots.