GARY ROY JONES, JR
Pilots at Ft Benton Dr, Austin, TX
License number
Texas A2776246
Issued Date
Dec 2016
Expiration Date
Jun 2017
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
5701 Fort Benton Dr, Austin, TX 78735
Professional information
Electrical Engineer
Position:
Electrical Engineering Consultant at Independent Contractor
Location:
Austin, Texas
Industry:
Research
Work:
Independent Contractor
- Austin TX since 2010
-
Electrical Engineering Consultant
Freescale Semiconductor
- Austin TX 2005 - 2009
-
Systems & Applications Engineer
EF Johnson
- Irving TX 2004 - 2005
-
Electrical Engineering Consultant
Motorola, Inc.
- Fort Worth TX 2002 - 2003
-
Principal Staff Engineer
Motorola Inc.
- Plantation FL 1994 - 2002
-
Principal Staff Engineer
Motorola Inc.
- Plantation FL 1990 - 1994
-
Staff Engineer
Motorola Inc.
- Fort Worth TX 1988 - 1990
-
Staff Engineer
Motorola Inc.
- Fort Worth TX 1984 - 1988
-
Senior Engineer
Datapoint
- Fort Worth TX 1982 - 1984
-
Test Engineer
ITT North Telecommunications Switching Division
- Tennessee 1976 - 1982
-
Test Systems Design Engineer
WLAC-TV (now WTVF-TV)
- Nashville TN 1975 - 1976
-
Staff Engineer
Motorola Inc.
- Plantation FL 1974 - 1975
-
Engineer
United States Air Force
- United States, Greece, Turkey 1966 - 1972
-
Cryptography Specialist
State of Tennessee
- Greater Nashville Area 1964 - 1965
-
Engineer
Education:
...University of Tennessee-Knoxville
..University of Maryland College Park
.Cumberland University
.New Horizons
International Telephone & Telegraph
USAF - Cryptography
..University of Maryland College Park
.Cumberland University
.New Horizons
International Telephone & Telegraph
USAF - Cryptography
Inpatient Physical Therapist At Warm Springs - A Subsidiary Of Post Acute Medical
Position:
Inpatient Physical Therapist at Warm Springs - a subsidiary of Post Acute Medical
Location:
Austin, Texas Area
Industry:
Hospital & Health Care
Work:
Warm Springs - a subsidiary of Post Acute Medical
- Luling, Tx since Aug 2011
-
Inpatient Physical Therapist
Education:
Texas State University-San Marcos 2003 - 2011
Doctor of Physical Therapy, Physical Therapy
Doctor of Physical Therapy, Physical Therapy
V.p. Investments-Financial Advisor
Position:
Vice President-Investments at JPMorgan Chase
Location:
Austin, Texas Area
Industry:
Investment Management
Work:
JPMorgan Chase
- 15004 Avery Ranch Blvd. Austin Tx 78717 since Sep 2007
-
Vice President-Investments
Education:
SWTSU
Interests:
New Technology, Classic Cars, Triathlon, Running, Biking ,Swimming.
Catering Manager At Embassy Suites San Marcos
Position:
Catering Manager at Embassy Suites San Marcos
Location:
Austin, Texas Area
Industry:
Hospitality
Work:
Embassy Suites San Marcos
-
Catering Manager
Frozen Food Manager
Position:
Frozen Food Manager at Randalls
Location:
Austin, Texas Area
Industry:
Retail
Work:
Randalls
since Nov 2007
-
Frozen Food Manager
J.p. Morgan Private Client Advisor At Chase Private Client
Position:
J.P. Morgan Private Client Advisor at Chase Private Client
Location:
Austin, Texas Area
Industry:
Investment Management
Work:
Chase Private Client
since Aug 2007
-
J.P. Morgan Private Client Advisor
Education:
SWTSU
Gary Jones
Location:
Austin, Texas Area
Industry:
Computer & Network Security
Method And Apparatus For Overlay Control Using Multiple Targets
US Patent:
6815232, Nov 9, 2004
Filed:
Nov 26, 2002
Appl. No.:
10/305305
Inventors:
Gary K Jones - Austin TX
Christopher A Bode - Austin TX
Richard D Edwards - Austin TX
Christopher A Bode - Austin TX
Richard D Edwards - Austin TX
Assignee:
Advanced Micro Devices, Inc. - Austin TX
International Classification:
H01L 2166
US Classification:
438 14
Abstract:
A method includes measuring a first overlay error between a first process layer and a second process layer using a first overlay target formed on the second process layer. A second overlay error between the first process layer and a third process layer is measured using a second overlay target formed on the third process layer. At least one parameter of an operating recipe for performing a photolithography process on the first process layer is determined based on the first and second overlay error measurements. A system includes a metrology tool and a controller. The metrology tool is configured to measure a first overlay error between a first process layer and a second process layer using a first overlay target formed on the second process layer and measure a second overlay error between the first process layer and a third process layer using a second overlay target formed on the third process layer. The controller is configured to determine at least one parameter of an operating recipe for performing a photolithography process on the first process layer based on the first and second overlay error measurements.
Prioritizing An Application Of Correction In A Multi-Input Control System
US Patent:
6912436, Jun 28, 2005
Filed:
Sep 30, 2002
Appl. No.:
10/261156
Inventors:
Gary Jones - Austin TX, US
Christopher A. Bode - Austin TX, US
Richard D. Edwards - Austin TX, US
Matthew A. Purdy - Austin TX, US
Christopher A. Bode - Austin TX, US
Richard D. Edwards - Austin TX, US
Matthew A. Purdy - Austin TX, US
Assignee:
Advanced Micro Devices, Inc. - Austin TX
International Classification:
G06F019/00
US Classification:
700121, 700 95, 700117, 438 5
Abstract:
A method and an apparatus for selectively applying correction to a process control. Manufacturing data relating to the processing of a workpiece is acquired. The manufacturing data includes metrology data relating to the processed workpiece. An adjustment for at least a first or a second control input parameter is determined based upon the manufacturing data. The first and second control input parameters are organized to isolate the first control input parameter from the second control input parameter for adjusting at least one of the first and the second control input parameters, using a controller.
Gary Jones
Location:
Austin, Texas Area
Industry:
Semiconductors