EDWARD W NICHOLS
Engineers in Reisterstown, MD

License number
Pennsylvania PE013942E
Category
Engineers
Type
Professional Engineer
Address
Address 2
Reisterstown, MD 21136
Pennsylvania

Professional information

Edward Nichols Photo 1

Device For Characterizing Wide Angle Beams

US Patent:
4712914, Dec 15, 1987
Filed:
Jan 10, 1986
Appl. No.:
6/817705
Inventors:
Michael A. Cross - Severna Park MD
Edward W. Nichols - Reisterstown MD
Assignee:
Westinghouse Electric Corp. - Pittsburgh PA
International Classification:
G01J 100
US Classification:
356121
Abstract:
A system for characterizing miniature optical sources such as laser diodes is disclosed. In its most convenient form the system includes an optical system for collecting a wide angle beam and collimating the beam into substantially parallel rays. In the substantially parallel beam, equal area angular portions of the wide angle beam should correspond to equal areas in the parallel beam. Optical sensors are utilized to generate signals indicative of the intensity of the parallel optical beam. Digital processing is included to calculate the characteristics of the optical beam from the intensity samples of the parallel beam. In one embodiment, a reflecting plane is positioned between the source and the optical system so that Lloyd's fringes are produced in a measurement plane.


Edward Nichols Photo 2

Multifunction Electro-Optical System Test Tool

US Patent:
5017004, May 21, 1991
Filed:
Dec 22, 1988
Appl. No.:
7/288387
Inventors:
Michael A. Cross - Severna Park MD
Edward W. Nichols - Reisterstown MD
Assignee:
Westinghouse Electric Corp. - Pittsburgh PA
International Classification:
G01J 100
US Classification:
356121
Abstract:
An electro-optical test tool for testing an input laser beam includes a collecting optics system of attenuating and collimating lenses enabling the test tool to test high powered, high PRF laser sources. A processor controlled CCPD sensor array provides a shuttered laser beam video signal which can be processed using a non-linear technique to improve the dynamic range of the system. Additionally, boresight error correcting capabilities are provided as well as range finding techniques.


Edward Nichols Photo 3

Optical Beam Analyzer

US Patent:
4693600, Sep 15, 1987
Filed:
Oct 23, 1986
Appl. No.:
6/922797
Inventors:
Michael A. Cross - Severna Park MD
Edward W. Nichols - Reisterstown MD
Assignee:
Westinghouse Electric Corp. - Pittsburgh PA
International Classification:
G01J 100
US Classification:
356121
Abstract:
A system for analyzing the characteristics of a light beam is disclosed. Functionally, the system includes an optical system for collecting the light beam to be analyzed. An array of light-sensitive elements is positioned at the focal plane of the optical system. A digital system sequentially samples the output signals of the light sensors and processes the resulting data to generate signals indicative of the characteristics of the light beam.


Edward Nichols Photo 4

High Energy Laser Beam Replica Producing Method And System

US Patent:
4746205, May 24, 1988
Filed:
Jan 30, 1987
Appl. No.:
7/009842
Inventors:
Michael A. Cross - Severna Park MD
Edward W. Nichols - Reisterstown MD
Assignee:
Westinghouse Electric Corp. - Pittsburgh PA
International Classification:
G02B 700, G02B 2710, G02B 508, G02B 510
US Classification:
350574
Abstract:
An attenuated fiducial replica of the far field pattern of a high energy laser beam is obtained by a system and method wherein a first fraction of an incident high energy beam is deflected from one reflective surface of a holey plate and the diffracted orders of the beam are transmitted from the holes to a concave reflector, which reflects diffracted orders toward an opposite reflective surface of the holey plate. A zinc selenide partially reflective member is disposed on-axis between the rear reflective surface and the concave surface for re-reflecting successive fractional portions of the reflected beam a selected number of times to attenuate the beam converging upon a focal plane from an effective focal distance greater than the physical length of the optical system.