Edmund H Smith
Accountancy in Wilmington, DE
License number
Delaware CC-0000031
Issued Date
Jan 18, 1940
Category
Accountancy
Type
C.P.A. Certificate
Address
Address
2
Wilmington, DE 19808
Professional information
On-Line Web Inspection System
US Patent:
4237539, Dec 2, 1980
Filed:
Nov 21, 1977
Appl. No.:
5/853421
Inventors:
Michael J. Piovoso - Newark DE
Edmund H. Smith - Wilmington DE
William E. Wolf - Newark DE
Edmund H. Smith - Wilmington DE
William E. Wolf - Newark DE
Assignee:
E. I. Du Pont de Nemours and Company - Wilmington DE
International Classification:
G01N 2184, G06F 1520
US Classification:
364552
Abstract:
An automatic on-line computer-aided inspection system for a running web utilizing a transverse web scanning means, detection means incorporating feature extraction and processing circuitry for generating unique output signals corresponding to said web scanning characteristic of web features of inspection interest, means converting the output signals to digital data words input sequentially to a digital computer, said computer applying one or more algorithms to said words, thereby calibrating the values of said features of said words, comparing said calibrated feature values to at least one set of product-qualifying values held in memory, and means responsive to the computer classifying the web as acceptable or non-acceptable as regards areas of preselected marketable size in the web.
Optical-Electrical Web Inspection System
US Patent:
3958127, May 18, 1976
Filed:
Aug 9, 1974
Appl. No.:
5/496319
Inventors:
Mark E. Faulhaber - Wilmington DE
Edmund H. Smith - Wilmington DE
Edmund H. Smith - Wilmington DE
Assignee:
E. I. Du Pont de Nemours and Company - Wilmington DE
International Classification:
G01N 2132
US Classification:
250563
Abstract:
An automatically calibrated flying spot web inspection system adapted to detect transverse (or roll mark) defects and discriminate these defects from other defect types. Electronic circuit means responsive to a beam of radiation in either the reflection mode or the transmission mode detect and discriminate these defects from the other types.
Defect Identification With Normalizing Of Gain Function In Optical-Electrical Inspection
US Patent:
4005281, Jan 25, 1977
Filed:
May 14, 1975
Appl. No.:
5/577394
Inventors:
Mark Edwin Faulhaber - Wilmington DE
Edmund Haislett Smith - Wilmington DE
Edmund Haislett Smith - Wilmington DE
Assignee:
E. I. Du Pont de Nemours and Company - Wilmington DE
International Classification:
G06F 1500
US Classification:
2351513
Abstract:
Method and apparatus for defect identification with normalizing of the optical-electrical inspection system gain function of scans across a full width of running product web in order to facilitate defect amplitude discrimination within the uneven portions of repetitive scan signals, and then, after accumulating a preselected number of gain-normalized scans, identifying protracted duration defect-related signals by amplitude discrimination.
Scanning Beam Displacement Compensation Control System
US Patent:
4203672, May 20, 1980
Filed:
Nov 18, 1976
Appl. No.:
5/743003
Inventors:
Edmund H. Smith - Wilmington DE
Assignee:
E. I. Du Pont de Nemours and Company - Wilmington DE
International Classification:
G01N 2118, G01B 1126
US Classification:
356431
Abstract:
An electro-optical system for the repetitive repositioning of a cyclically moving beam of radiation to a preselected point in space, particularly as applied to electro-optical web inspection.
Binary Patterned Web Inspection
US Patent:
4166541, Sep 4, 1979
Filed:
Aug 30, 1977
Appl. No.:
5/829248
Inventors:
Edmund H. Smith - Wilmington DE
Assignee:
E. I. Du Pont de Nemours and Company - Wilmington DE
International Classification:
B07C 500
US Classification:
209587
Abstract:
An electro-optical inspection system for a binary patterned web which automatically determines registration and the quality of subjects of inspection by comparison with a master pattern stored in the memory of a computer and then passes or rejects individual subjects of inspection depending on the outcome of the comparison effected.
Apparatus For On-Line Defect Zoning
US Patent:
4211132, Jul 8, 1980
Filed:
Nov 21, 1977
Appl. No.:
5/853420
Inventors:
Lee H. Nichols - Wilmington DE
Edmund H. Smith - Wilmington DE
Edmund H. Smith - Wilmington DE
Assignee:
E. I. Du Pont de Nemours and Company - Wilmington DE
International Classification:
B26D 530
US Classification:
83 71
Abstract:
A non-marking type method and apparatus for optimizing the recovery, at on-line speeds, of salvageable sheet product from a large width web, utilized in conjunction with a radiation scanning type inspection system.