Inventors:
John S. Benway - Northbrook IL
Donald R. Patterson - Plainfield IL
James M. Berry - Deerfield IL
Assignee:
Magnetrol International Incorporated - Downers Grove IL
International Classification:
G01S 1300
US Classification:
342124, 342118, 342165, 342173, 342174, 342195, 324332, 73304 R
Abstract:
A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.