DAVID S GOLDSTEIN, M.D.
Osteopathic Medicine at State Route 27, Edison, NJ

License number
New Jersey MA040384
Category
Osteopathic Medicine
Type
Internal Medicine
License number
New Jersey MA040384
Category
Osteopathic Medicine
Type
Critical Care Medicine
License number
New Jersey MA040384
Category
Osteopathic Medicine
Type
Pulmonary Disease
Address
Address
2 State Route 27 SUITE 301, Edison, NJ 08820
Phone
(732) 549-7380

Personal information

See more information about DAVID S GOLDSTEIN at radaris.com
Name
Address
Phone
David Goldstein, age 60
49 Twin Rivers Dr, East Windsor, NJ 08520
(609) 443-6164
David Goldstein, age 68
4 Harvest Ct, Jackson, NJ 08527
(732) 979-5280
David Goldstein, age 71
49 Duffield Dr, South Orange, NJ 07079
David Goldstein, age 54
4 Steven Ter, West Orange, NJ 07052
(973) 325-1812
David Goldstein, age 64
44 Taylor Ave #B, East Brunswick, NJ 08816
(732) 613-7424

Organization information

See more information about DAVID S GOLDSTEIN at bizstanding.com

Pulmonary Internists - David S Goldstein MD

2 State Rte 27 STE 301, Edison, NJ 08820

Categories:
Internal Medicine Physicians & Surgeons, Physicians & Surgeons, Pulmonary & Respiratory Physicians & Surgeons
Phone:
(732) 549-7380 (Phone)

Professional information

David S Goldstein Photo 1

David S Goldstein, Edison NJ

Specialties:
Pulmonologist
Address:
2 State Route 27, Edison, NJ 08820
Education:
Yeshiva University, Albert Einstein College of Medicine - Doctor of Medicine
Montefiore Medical Center - Fellowship - Pulmonary Disease (Internal Medicine)
Jacobi Medical Center - Residency - Internal Medicine
Board certifications:
American Board of Internal Medicine Certification in Internal Medicine, American Board of Internal Medicine Sub-certificate in Critical Care Medicine (Internal Medicine), American Board of Internal Medicine Sub-certificate in Pulmonary Disease (Internal Medicine), American Board of Internal Medicine Sub-certificate in Sleep Medicine (Internal Medicine)


David S Goldstein Photo 2

Dr. David S Goldstein, Edison NJ - MD (Doctor of Medicine)

Specialties:
Critical Care Medicine, Pulmonology, Sleep Medicine
Address:
Sleep Disorder Center Of NJ
2 Lincoln Ave SUITE 301, Edison 08837
(908) 789-4244 (Phone)
6535 N Charles St SUITE 625, Towson 21204
(410) 825-5454 (Phone)
Pulmonary Internists PA
3 Hospital Plz SUITE 205, Old Bridge 08857
(732) 360-2255 (Phone)
Pulmonary Internists PA
2 State Route 27 SUITE 301, Edison 08820
(732) 549-7380 (Phone)
2253 South Ave SUITE 7, Scotch Plains 07076
(908) 789-4244 (Phone)
Certifications:
Critical Care Medicine, 1999, Internal Medicine, 1983, Pulmonary Disease, 1986, Sleep Medicine, 2007
Awards:
Healthgrades Honor Roll
Languages:
English, Spanish
Hospitals:
Sleep Disorder Center Of NJ
2 Lincoln Ave SUITE 301, Edison 08837
Pulmonary Internists PA
2 State Route 27 SUITE 301, Edison 08820
Pulmonary Internists PA
3 Hospital Plz SUITE 205, Old Bridge 08857
2253 South Ave SUITE 7, Scotch Plains 07076
6535 N Charles St SUITE 625, Towson 21204
Robert Wood Johnson University Hospital
1 Robert Wood Johnson Pl, New Brunswick 08903
Education:
Medical School
Albert Einstein College Of Medicine Of Yeshiva University
Graduated: 1980
Bronx Muni Hospital Center Einstei
Einstein
Graduated: 1985


David Goldstein Photo 3

Method For Etching Of Silicon Carbide Semiconductor Using Selective Etching Of Different Conductivity Types

US Patent:
6034001, Mar 7, 2000
Filed:
Feb 17, 1994
Appl. No.:
8/198511
Inventors:
Joseph S. Shor - Flushing NY
Anthony D. Kurtz - Teaneck NJ
David Goldstein - Edison NJ
Assignee:
Kulite Semiconductor Products, Inc. - Leonia NJ
International Classification:
H01L 2348, H01L 2352, H01L 2940
US Classification:
438931
Abstract:
A method for selective conductivity etching of a silicon carbide (SiC) semiconductor includes forming a p-type SiC layer on a substrate layer, forming an n-type SiC layer on the p-type SiC layer, and photoelectrochemically etching selected portions of the n-type SiC layer by applying a bias voltage to the n-type SiC layer in a hydrofluoric acid (HF) solution while exposing the layer to a pattern of UV light. The bias potential is selected so that the n-type SiC layer will photo-corrode and the p-type SiC layer will be inert and act as an etch stop. The light pattern exposure of the n-type SiC layer may be done by applying a photolithographic mask to the layer, by projecting a collimated light beam through a patterned mask, or by scanning with a focused micrometer-sized laser beam on the semiconductor surface.


David Goldstein Photo 4

High Temperature Transducers And Methods Of Fabricating The Same Employing Silicon Carbide

US Patent:
5165283, Nov 24, 1992
Filed:
May 2, 1991
Appl. No.:
7/694490
Inventors:
Anthony D. Kurtz - Teaneck NJ
David Goldstein - Edison NJ
Joseph S. Shor - Flushing NY
Assignee:
Kulite Semiconductor Products, Inc. - Leonia NJ
International Classification:
G01L 906
US Classification:
73727
Abstract:
There is disclosed an apparatus and structure for a pressure transducer employing silicon carbide and utilizing p-type SiC as a diaphragm with n-type mesa SiC force sensing resistors integrally formed on the surface of the diaphragm. The p-type SiC diaphragm is positioned on top of an annular ring of silicon which is formed from a silicon wafer utilized as the supporting wafer for the process. The structure depicted is a given conductivity SiC diaphragm having opposite conductivity SiC resistors positioned thereon and fabricated by processing techniques utilizing selective etching properties of SiC.