Inventors:
Marwan M. Hassoun - Davis CA, US
Moises E. Robinson - Austin TX, US
David E. Tetzlaff - Minneapolis MN, US
Assignee:
XILINX, Inc. - San Jose CA
International Classification:
H03K 19/003
Abstract:
A method and apparatus to provide various mechanisms to improve yield of an integrated circuit (IC) employing serial input/output (I/O) communication devices. A single error correction model provides one spare transceiver per group of primary transceivers, whereby reconfiguration of the IC isolates the defective transceiver and configures the replacement transceiver for operation in its place. A multiple error correction model is also provided, whereby multiple replacement transceivers may be configured to replace multiple defective transceivers. The replacement mechanism may occur during various phases of the IC, such as during wafer testing, final testing, or post-deployment testing.