DAVID PETERSON TETZLAFF, MD
Osteopathic Medicine at 28 St, Minneapolis, MN
License number
Minnesota 42365
Category
Osteopathic Medicine
Type
Internal Medicine
Address
Address
920 E 28Th St, Minneapolis, MN 55407
Phone
(612) 863-1893
(612) 262-4813
(612) 262-4194 (Fax)
(612) 262-4813
(612) 262-4194 (Fax)
Personal information
See more information about DAVID PETERSON TETZLAFF at radaris.comName
Address
Phone
5920 Scenic Heights Dr, Minnetonka, MN 55345
4467 W 137Th St, Savage, MN 55378
1046 Avanti Dr, Saint Paul, MN 55118
1745 Duluth St, Saint Paul, MN 55109
1558 Mcafee St, Saint Paul, MN 55106
Professional information
See more information about DAVID PETERSON TETZLAFF at trustoria.com
Systems &Amp; Hardware Architect
Systems &Amp; Hardware Architect
Position:
Hardware Architect at Seagate Technology
Location:
Greater Minneapolis-St. Paul Area
Industry:
Design
Work:
Seagate Technology
since 2008
-
Hardware Architect
KeyEye Communications
2006 - 2008
-
Principal Engineer & Senior Engineering Director
Xilinx
1999 - 2006
-
Principal Engineer & Engineering Director
Rosemount
1992 - 1999
-
Principal Engineer
Honeywell
1987 - 1992
-
Staff Engineer
Cardiac Pacemakers
1981 - 1987
-
Principal Engineer
Education:
University of Minnesota-Twin Cities 1976 - 1980
MSEE, Electrical Engineering, Computer Science University of Minnesota-Twin Cities 1972 - 1976
BSEE, Electrical Engineering, Computer Science
MSEE, Electrical Engineering, Computer Science University of Minnesota-Twin Cities 1972 - 1976
BSEE, Electrical Engineering, Computer Science
Dr. David P Tetzlaff, Minneapolis MN - MD (Doctor of Medicine)
Dr. David P Tetzlaff, Minneapolis MN - MD (Doctor of Medicine)
Specialties:
Internal Medicine, Pediatrics
Address:
Abbott NW Hospitalists Service
800 E 28Th St SUITE 11326, Minneapolis 55407
(612) 863-5567 (Phone)
800 E 28Th St SUITE 11326, Minneapolis 55407
(612) 863-5567 (Phone)
Certifications:
Internal Medicine, 2012, Pediatrics, 2002
Awards:
Healthgrades Honor Roll
Languages:
English
Hospitals:
Abbott NW Hospitalists Service
800 E 28Th St SUITE 11326, Minneapolis 55407
Abbott Northwestern Hospital
800 East 28Th St, Minneapolis 55407
800 E 28Th St SUITE 11326, Minneapolis 55407
Abbott Northwestern Hospital
800 East 28Th St, Minneapolis 55407
Education:
Medical School
University Of Minnesota Medical School
Graduated: 1998
Fairview University Med Center
University Of Minnesota Medical School
Graduated: 1998
Fairview University Med Center
Physician At Allina Hospitals &Amp; Clinics
Physician At Allina Hospitals &Amp; Clinics
Position:
physician at Allina Hospitals & Clinics
Location:
Greater Minneapolis-St. Paul Area
Industry:
Hospital & Health Care
Work:
Allina Hospitals & Clinics
-
physician
David Peterson Tetzlaff, Minneapolis MN
David Peterson Tetzlaff, Minneapolis MN
Specialties:
Pediatrics, Hospitalist, Internal Medicine
Work:
Abbott Northwestern Hospitalist Service
800 E 28Th St, Minneapolis, MN 55407
800 E 28Th St, Minneapolis, MN 55407
Education:
University of Minnesota, Twin Cities (1998)
Method And Apparatus For A Redundant Transceiver Architecture
Method And Apparatus For A Redundant Transceiver Architecture
US Patent:
7408380, Aug 5, 2008
Filed:
May 16, 2006
Appl. No.:
11/435427
Inventors:
Marwan M. Hassoun - Davis CA, US
Moises E. Robinson - Austin TX, US
David E. Tetzlaff - Minneapolis MN, US
Moises E. Robinson - Austin TX, US
David E. Tetzlaff - Minneapolis MN, US
Assignee:
XILINX, Inc. - San Jose CA
International Classification:
H03K 19/003
US Classification:
326 38, 326 10
Abstract:
A method and apparatus to provide various mechanisms to improve yield of an integrated circuit (IC) employing serial input/output (I/O) communication devices. A single error correction model provides one spare transceiver per group of primary transceivers, whereby reconfiguration of the IC isolates the defective transceiver and configures the replacement transceiver for operation in its place. A multiple error correction model is also provided, whereby multiple replacement transceivers may be configured to replace multiple defective transceivers. The replacement mechanism may occur during various phases of the IC, such as during wafer testing, final testing, or post-deployment testing.