DAVID LOUIS KLEIN
Pilots at Southampton Dr, Palo Alto, CA
License number
California A4897105
Issued Date
May 2016
Expiration Date
May 2018
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
876 Southampton Dr, Palo Alto, CA 94303
Professional information
Optical Measurement System Using Polarized Light
US Patent:
6515745, Feb 4, 2003
Filed:
Oct 19, 2001
Appl. No.:
10/036062
Inventors:
Gerard H. Vurens - Palo Alto CA
David L. Klein - Palo Alto CA
David L. Klein - Palo Alto CA
Assignee:
HDI Instrumentation - Santa Clara CA
International Classification:
G01J 404
US Classification:
356369, 3562372, 356630, 250225
Abstract:
An optical measurement system for evaluating the surface of a substrate or the thickness and optical characteristics of a thin film layer overlying the substrate includes a light source for generating a light beam, a static polarizing element for polarizing the light beam emanating from the light source, and a measurement system for measuring the light reflected from the substrate location. The measurement system includes a static beam splitting element for splitting the light reflected from the substrate into s-polarized light and p-polarized light. The measurement system further includes two optical sensors for separately measuring the amplitude of the s-polarized light and the intensity of the p-polarized light. A control system analyzes the measured amplitude of the s-polarized light and the p-polarized to determine changes in the topography of substrate or changes in the thickness or optical characteristics of the thin film layer.
Optical Measurement System Using Polarized Light
US Patent:
6134011, Oct 17, 2000
Filed:
Sep 15, 1998
Appl. No.:
9/153646
Inventors:
David L. Klein - Palo Alto CA
Gerard H. Vurens - Palo Alto CA
Gerard H. Vurens - Palo Alto CA
Assignee:
HDI Instrumentation - Santa Clara CA
International Classification:
G01J 404
US Classification:
356369
Abstract:
An optical measurement system for evaluating the surface of a substrate or the thickness and optical characteristics of a thin film layer overlying the substrate includes an intensity stabilized light source configured to generate a stabilized light beam, a polarizing element for polarizing the light beam emanating from the light source, and a detection system for measuring the light reflected from the substrate The measurement system includes a polarizing beam-splitter for splitting the light reflected from the substrate into s-polarized light and p-polarized light. The measurement system further includes two optical sensors for separately measuring the amplitude of the s-polarized light and the intensity of the p-polarized light and a third detector for measuring either the phase difference between the s-polarized light and the p-polarized light or the reflection angle of the light reflected from the substrate. A control system analyzes the measured amplitude of the s-polarized light and the p-polarized and either the phase-difference or the reflection angle to determine changes in the topography of substrate or changes in the thickness or optical characteristics of the thin film layer.
High Speed Quantum Efficiency Measurement Apparatus Utilizing Solid State Lightsource
US Patent:
8299416, Oct 30, 2012
Filed:
Mar 1, 2010
Appl. No.:
12/660688
Inventors:
Mark A. Arbore - Los Altos CA, US
David L Klein - Palo Alto CA, US
Leonid A. Vasilyev - Beaverton OR, US
John M. Schmidt - Oakland CA, US
James E. Hudson - Portland OR, US
Gregory S. Horner - Felton CA, US
David L Klein - Palo Alto CA, US
Leonid A. Vasilyev - Beaverton OR, US
John M. Schmidt - Oakland CA, US
James E. Hudson - Portland OR, US
Gregory S. Horner - Felton CA, US
Assignee:
Tau Science Corporation - Felton CA
International Classification:
G01N 21/64, G01J 1/58
US Classification:
2502222, 2504591, 702182
Abstract:
The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50 nm bandwidth, where a portion of the conditioned light source is monitored. Delivery optics are provided to direct the conditioned light to the DUT, a controller drives the conditioned light source in a time dependent operation, and at least one reflectance measurement assembly receives a portion of the conditioned light reflected from the DUT. A time-resolved measurement device includes a current measurement device and/or a voltage measurement device disposed to resolve a current and/or voltage generated in the DUT by each conditioned light source, where a sufficiently programmed computer determines and outputs a QE value for each DUT according to an incident intensity of at least one wavelength of from the conditioned light source and the time-resolved measurement.
Method For Enabling Monitoring Of Power Consumption
US Patent:
7622912, Nov 24, 2009
Filed:
Jun 10, 2008
Appl. No.:
12/136698
Inventors:
Frank J. Adams - Los Altos CA, US
David L. Klein - Palo Alto CA, US
David L. Klein - Palo Alto CA, US
Assignee:
Sunpower Corporation - San Jose CA
International Classification:
G01R 31/28
US Classification:
3241581, 324142, 324107, 324117 H, 307 44, 307 45, 307 64
Abstract:
Power consumption at a site is monitored. An electrical load is connected to a power source by an electrical conductor. A fuel-less energy producing device is electrically connected to a junction along the electrical conductor. A current sensor is electromagnetically coupled to the electrical conductor at a sensing position between the power source and the junction to create a current sensor signal. Sensed current and voltage signals are produced from the current sensor signal. A sensed phase relationship between the sensed signals is determined and compared to a baseline phase relationship to determine the direction of current flow through the conductor. A power source signal, based on the current flowing through the conductor at the sensing position, is created. With some examples a Rogowski type differential current sensor is used. In some examples a single current sensor is used.
Controlling Gas In A Well Plate Reactor
US Patent:
7718134, May 18, 2010
Filed:
Feb 5, 2008
Appl. No.:
12/026450
Inventors:
David L. Klein - Palo Alto CA, US
Stephen G. Boyer - Stockton CA, US
Gregory Andronaco - Palo Alto CA, US
Stephen G. Boyer - Stockton CA, US
Gregory Andronaco - Palo Alto CA, US
Assignee:
Microreactor Technologies, Inc. - Mountain View CA
International Classification:
B01L 3/00
US Classification:
422102
Abstract:
A well plate and its supporting devices provide capabilities found in larger fermenters, such as controlling the oxygen level, the pH level, and temperature of the contents of the well. The well plate includes a plurality of wells, each of which can be independently controlled. Apertures in the wells, for example, provide access for a gas supply and sensors within each well provide data relating to, e. g. , oxygen and/or pH level in the well. A control system controls the gas supply for each well based on the information provided by the sensor within the well. Similarly, temperature control elements, such as a heater or cooler, is placed in thermal contact with the interior of the well, as is a temperature measurement element. A control system can independently control the temperature of the contents of the well based on information provided by the temperature measurement element for that well.
Localized Power Point Optimizer For Solar Cell Installations
US Patent:
2014003, Feb 6, 2014
Filed:
Mar 9, 2012
Appl. No.:
13/416438
Inventors:
David L. KLEIN - Palo Alto CA, US
Jan Mark NOWOROLSKI - Burlingame CA, US
Jan Mark NOWOROLSKI - Burlingame CA, US
International Classification:
H02J 1/00
US Classification:
307 86, 307 43
Abstract:
In one embodiment, a solar cell installation includes several groups of solar cells. Each group of solar cells has a local power point optimizer configured to control power generation of the group. The local power point optimizer may be configured to determine an optimum operating condition for a corresponding group of solar cells. The local power point optimizer may adjust the operating condition of the group to the optimum operating condition by modulating a transistor, such as by pulse width modulation, to electrically connect and disconnect the group from the installation. The local power point optimizer may be used in conjunction with a global maximum power point tracking module.
Detection System For Droplet-Based Assays
US Patent:
2012019, Aug 2, 2012
Filed:
Dec 30, 2011
Appl. No.:
13/341678
Inventors:
Kevin D. Ness - Pleasanton CA, US
Mark A. Arbore - Los Altos CA, US
Jerry E. Hurst - Boulder Creek CA, US
David L. Klein - Palo Alto CA, US
Donald A. Masquelier - Tracy CA, US
Mark A. Arbore - Los Altos CA, US
Jerry E. Hurst - Boulder Creek CA, US
David L. Klein - Palo Alto CA, US
Donald A. Masquelier - Tracy CA, US
International Classification:
G01J 1/00
US Classification:
356213
Abstract:
System, including methods and apparatus, for light detection and signal processing for droplet-based assays.
Well Plate Reactor
US Patent:
7713486, May 11, 2010
Filed:
Feb 1, 2008
Appl. No.:
12/024973
Inventors:
David L. Klein - Palo Alto CA, US
Stephen G. Boyer - Stockton CA, US
Gregory Andronaco - Palo Alto CA, US
Stephen G. Boyer - Stockton CA, US
Gregory Andronaco - Palo Alto CA, US
Assignee:
Microreactor Technologies, Inc. - Mountain View CA
International Classification:
B01L 3/00
US Classification:
422102
Abstract:
A well plate and its supporting devices provide capabilities found in larger fermenters, such as controlling the oxygen level, the pH level, and temperature of the contents of the well. The well plate includes a plurality of wells, each of which can be independently controlled. Apertures in the wells, for example, provide access for a gas supply and sensors within each well provide data relating to, e. g. , oxygen and/or pH level in the well. A control system controls the gas supply for each well based on the information provided by the sensor within the well. Similarly, temperature control elements, such as a heater or cooler, is placed in thermal contact with the interior of the well, as is a temperature measurement element. A control system can independently control the temperature of the contents of the well based on information provided by the temperature measurement element for that well.
Well Plate Reactor
US Patent:
7887766, Feb 15, 2011
Filed:
Mar 29, 2010
Appl. No.:
12/749374
Inventors:
David L. Klein - Palo Alto CA, US
Stephen G. Boyer - Stockton CA, US
Gregory Andronaco - Palo Alto CA, US
Stephen G. Boyer - Stockton CA, US
Gregory Andronaco - Palo Alto CA, US
Assignee:
Pall Microreactor Technologies, Inc. - Mountain View CA
International Classification:
B01L 3/00
US Classification:
422407
Abstract:
A well plate and its supporting devices provide capabilities found in larger fermenters, such as controlling the oxygen level, the pH level, and temperature of the contents of the well. The well plate includes a plurality of wells, each of which can be independently controlled. Apertures in the wells, for example, provide access for a gas supply and sensors within each well provide data relating to, e. g. , oxygen and/or pH level in the well. A control system controls the gas supply for each well based on the information provided by the sensor within the well. Similarly, temperature control elements, such as a heater or cooler, is placed in thermal contact with the interior of the well, as is a temperature measurement element. A control system can independently control the temperature of the contents of the well based on information provided by the temperature measurement element for that well.
Well Plate Reactor
US Patent:
7374725, May 20, 2008
Filed:
Feb 11, 2004
Appl. No.:
10/777581
Inventors:
David L. Klein - Palo Alto CA, US
Stephen G. Boyer - Stockton CA, US
Gregory Andronaco - Palo Alto CA, US
Stephen G. Boyer - Stockton CA, US
Gregory Andronaco - Palo Alto CA, US
Assignee:
Gener8, Inc. - Mountain View CA
International Classification:
B01L 3/00
US Classification:
422102
Abstract:
A well plate and its supporting devices provide capabilities found in larger fermenters, such as controlling the oxygen level, the pH level, and temperature of the contents of the well. The well plate includes a plurality of wells, each of which can be independently controlled. Apertures in the wells, for example, provide access for a gas supply and sensors within each well provide data relating to, e. g. , oxygen and/or pH level in the well. A control system controls the gas supply for each well based on the information provided by the sensor within the well. Similarly, temperature control elements, such as a heater or cooler, is placed in thermal contact with the interior of the well, as is a temperature measurement element. A control system can independently control the temperature of the contents of the well based on information provided by the temperature measurement element for that well.