DAVID H SPENCER
Broker in Bedford, MA
License number
Massachusetts 9183
Issued Date
Nov 1, 1964
Expiration Date
Jan 21, 1991
Type
Salesperson
Address
Address
Bedford, MA 01730
Professional information
High Speed Materials Sorting Using X-Ray Fluorescence
US Patent:
6888917, May 3, 2005
Filed:
Feb 11, 2003
Appl. No.:
10/364783
Inventors:
Robert H. Parrish - Nashville TN, US
David B. Spencer - Bedford MA, US
Charles E. Roos - Nashville TN, US
David B. Spencer - Bedford MA, US
Charles E. Roos - Nashville TN, US
Assignee:
Spectramet, LLC - Wilmington DE
International Classification:
G01N023/02
US Classification:
378 58, 378 57, 378 44
Abstract:
A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.
High Speed Materials Sorting Using X-Ray Fluorescence
US Patent:
2006023, Oct 26, 2006
Filed:
Feb 17, 2006
Appl. No.:
11/357432
Inventors:
Edward Sommer - Nashville TN, US
Robert Parrish - Nashville TN, US
David Spencer - Bedford MA, US
Charles Roos - Nashville TN, US
Robert Parrish - Nashville TN, US
David Spencer - Bedford MA, US
Charles Roos - Nashville TN, US
Assignee:
Spectramet, LLC - Wilmington DE
International Classification:
G01N 23/223, G01T 1/36
US Classification:
378044000
Abstract:
A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube.
Sorting Pieces Of Material Based On Photonic Emissions Resulting From Multiple Sources Of Stimuli
US Patent:
7763820, Jul 27, 2010
Filed:
Nov 27, 2007
Appl. No.:
11/986830
Inventors:
David B. Spencer - Bedford MA, US
R. Lynn Conley - Nashville TN, US
Richard E. Hill - Nashville TN, US
Robert H. Parrish - Nashville TN, US
Charles E. Roos - Nashville TN, US
R. Lynn Conley - Nashville TN, US
Richard E. Hill - Nashville TN, US
Robert H. Parrish - Nashville TN, US
Charles E. Roos - Nashville TN, US
Assignee:
Spectramet, LLC - Wilmington DE
International Classification:
B07C 5/00
US Classification:
209576, 209579, 209589, 356316, 356318, 378 45, 378 47
Abstract:
A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i. e. , x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.
High Speed Materials Sorting Using X-Ray Fluorescence
US Patent:
8553838, Oct 8, 2013
Filed:
May 24, 2011
Appl. No.:
13/114223
Inventors:
Edward J. Sommer - Nashville TN, US
Robert H. Parrish - Nashville TN, US
David B. Spencer - Bedford MA, US
Charles E. Roos - Nashville TN, US
Robert H. Parrish - Nashville TN, US
David B. Spencer - Bedford MA, US
Charles E. Roos - Nashville TN, US
Assignee:
Sprectramet, LLC - Bedford MA
International Classification:
G01N 23/223
US Classification:
378 45
Abstract:
A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.
Sorting Pieces Of Material Based On Photonic Emissions Resulting From Multiple Sources Of Stimuli
US Patent:
2013026, Oct 10, 2013
Filed:
Jun 3, 2013
Appl. No.:
13/908534
Inventors:
David B. Spencer - Bedford MA, US
R. Lynn Conley - Antioch TN, US
Richard E. Hill - Nashville TN, US
Robert H. Parrish - Nashville TN, US
Charles E. Roos - Nashville TN, US
R. Lynn Conley - Antioch TN, US
Richard E. Hill - Nashville TN, US
Robert H. Parrish - Nashville TN, US
Charles E. Roos - Nashville TN, US
International Classification:
B07C 5/342
US Classification:
209589
Abstract:
A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.
High Speed Materials Sorting Using X-Ray Fluorescence
US Patent:
6266390, Jul 24, 2001
Filed:
Sep 21, 1999
Appl. No.:
9/400491
Inventors:
Edward J. Sommer - Nashville TN
Robert H. Parrish - Nashville TN
David B. Spencer - Bedford MA
Charles E. Roos - Nashville TN
Robert H. Parrish - Nashville TN
David B. Spencer - Bedford MA
Charles E. Roos - Nashville TN
Assignee:
Spectramet, LLC - Wilmington DE
International Classification:
G01N 23223
US Classification:
378 45
Abstract:
A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.
Composition And Methods For Preparing Liquid-Solid Alloys For Casting And Casting Methods Employing The Liquid-Solid Alloys
US Patent:
3948650, Apr 6, 1976
Filed:
Jul 17, 1973
Appl. No.:
5/379991
Inventors:
Merton C. Flemings - Cambridge MA
Robert Mehrabian - Arlington MA
David B. Spencer - Bedford MA
Robert Mehrabian - Arlington MA
David B. Spencer - Bedford MA
Assignee:
Massachusetts Institute of Technology - Cambridge MA
International Classification:
C22C 102, C22B 406
US Classification:
75135
Abstract:
A metal composition characterized by degenerate dendritic or nodular primary discrete solid particles suspended in a secondary phase having a lower melting point than the primary particles and which secondary phase can be solid or liquid. The method involves raising the temperature of a metal alloy to a value at which the alloy is largely or completely in the molten state. The melt then is subjected to vigorous agitation and the temperature is reduced to increase the portion of the mixture in solid degenerate dendrite or nodular form up to about sixty-five percent, but usually up to about fifty percent, while continuing the agitation. At this juncture the temperature of the liquid-solid composition can be reduced to cause solidification thereof or it can be cast. The solidified composition can be stored and later it can be brought again to the liquid-solid mixture state and then recast.
Method And Apparatus For Sorting Materials According To Relative Composition
US Patent:
8144831, Mar 27, 2012
Filed:
Dec 3, 2010
Appl. No.:
12/960199
Inventors:
Charles E. Roos - Nashville TN, US
David B. Spencer - Bedford MA, US
R. Lynn Conley - Antioch TN, US
David B. Spencer - Bedford MA, US
R. Lynn Conley - Antioch TN, US
Assignee:
Spectramet, LLC - Bedford MA
International Classification:
G01N 23/06, G01N 23/04, G01N 23/02
US Classification:
378 53, 378 57, 378 58
Abstract:
Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.
Method And Apparatus For Sorting Materials According To Relative Composition
US Patent:
2012014, Jun 14, 2012
Filed:
Feb 15, 2012
Appl. No.:
13/397173
Inventors:
Charles E. Roos - Nashville TN, US
David B. Spencer - Bedford MA, US
R. Lynn Conley - Antioch TN, US
David B. Spencer - Bedford MA, US
R. Lynn Conley - Antioch TN, US
Assignee:
SPECTRAMET, LLC - Bedford MA
International Classification:
G01N 23/06
US Classification:
378 53
Abstract:
Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.
Method And Apparatus For Sorting Materials According To Relative Composition
US Patent:
7099433, Aug 29, 2006
Filed:
Mar 1, 2005
Appl. No.:
11/069243
Inventors:
Edward J. Sommer - Nashville TN, US
Charles E. Roos - Nashville TN, US
David B. Spencer - Bedford MA, US
Charles E. Roos - Nashville TN, US
David B. Spencer - Bedford MA, US
Assignee:
Spectramet, LLC - Nashville TN
International Classification:
G01N 23/06, G01N 23/04, G01B 15/02
US Classification:
378 53, 378 57, 378 988, 209589
Abstract:
Disclosed herein is a metal sorting device including an X-ray tube, a dual energy detector array, a microprocessor, and an air ejector array. The device senses the presence of samples in the x-ray sensing region and initiates identifying and sorting the samples. After identifying and classifying the category of a sample, at a specific time, the device activates an array of air ejectors located at specific positions in order to place the sample in the proper collection bin.