David Evan Allred
Land Surveyors in Provo, UT
License number
Utah 178009-9925
Issued Date
Oct 17, 1989
Expiration Date
Dec 31, 1999
Category
Engineer/Land Surveyor
Type
Engineer in Training - Obsolete
Address
Address
Provo, UT
Professional information
Professor At Brigham Young University
Position:
Professor at Brigham Young University
Location:
Provo, Utah Area
Industry:
Research
Work:
Brigham Young University
since Aug 1987
-
Professor
American Vacuum Society
1977 - 2010
-
Member
UserTrust
1997 - 2009
-
board of director
Moxtek
1987 - 2009
-
consultant
Energy Conversion Devices
1980 - 1987
-
Senior Scientist
Optical Science Center
1977 - 1980
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Research Associate
Education:
Princeton University 1971 - 1976
Interests:
thin films, solid state, Mars simulation research,
cross country skiing, biking, family
Honor & Awards:
http://www.physics.byu.edu/faculty/Allred/CV/cv.htm
High Throughput Reflectivity And Resolution X-Ray Dispersive And Reflective Structures For The 100 Ev To 5000 Ev Energy Range And Method Of Making The Devices
US Patent:
5485499, Jan 16, 1996
Filed:
Aug 5, 1994
Appl. No.:
8/286693
Inventors:
Hans K. Pew - Orem UT
David D. Allred - Provo UT
David D. Allred - Provo UT
Assignee:
Moxtek, Inc. - Orem UT
International Classification:
G01T 132
US Classification:
378 84
Abstract:
X-ray dispersive and reflective structures utilizing special materials which exhibit improved performance in the specific ranges of interest. The structures are formed of alternating thin layers of uranium, uranium compound or uranium alloy and another spacer material consisting of elements or compounds with low absorptance chosen to match the wavelength of interest. These low index of refraction elements or compounds are those best suited for water window microscopy and nitrogen analysis, or are similar elements or compounds best suited for carbon analysis, boron analysis, and x-ray lithography. The structures are constructed using standard thin layer deposition techniques such as evaporation, sputtering, and CVD, or by novel methods which allow thinner and smoother layers to be deposited.
X-Ray Wave Diffraction Optics Constructed By Atomic Layer Epitaxy
US Patent:
5458084, Oct 17, 1995
Filed:
Dec 9, 1993
Appl. No.:
8/164362
Inventors:
James M. Thorne - Provo UT
James K. Shurtleff - Sandy UT
David D. Allred - Provo UT
Raymond T. Perkins - Provo UT
James K. Shurtleff - Sandy UT
David D. Allred - Provo UT
Raymond T. Perkins - Provo UT
Assignee:
Moxtek, Inc. - Provo UT
International Classification:
C30B 2516
US Classification:
117 89
Abstract:
X-ray wave diffraction devices are constructed using atomic layer epetaxy. A crystalline substrate is prepared with one or more surface areas on which multiple pairs of layers of material are to be deposited. These layers are then formed by atomic layer epetaxy on the surface areas of the substrate, one on top of another, with the material of each layer of each pair being selected to have a different index of refraction from that of the material of the other layer of each pair. The layers are formed so that the thickness of each layer of a pair is substantially the same as that of the corresponding layer of every other pair and so that x-ray waves impinging on the layers may be reflected therefrom. Layer pairs having a thickness of about 20 angstroms or less are formed on the substrate.
Coating For Preventing Corrosion To Beryllium X-Ray Windows And Method Of Preparing
US Patent:
5226067, Jul 6, 1993
Filed:
Mar 6, 1992
Appl. No.:
7/847588
Inventors:
David D. Allred - Provo UT
Fang Yuan - Provo UT
Irwin Rudich - Wilton CT
Fang Yuan - Provo UT
Irwin Rudich - Wilton CT
Assignee:
Brigham Young University - Provo UT
Multilayer Optics and X-Ray Technology, Inc. - Provo UT
Multilayer Optics and X-Ray Technology, Inc. - Provo UT
International Classification:
G21K 100
US Classification:
378161
Abstract:
An optical device for interacting with x-ray radiation, wherein the device includes an optical element configured for use as part of a spectroscopy tube, proportional counter, Geiger counter, optical detector or similar optical instrument. An exposed surface of the optical element is coated with at least one bonded layer of boron hydride composition to protect against abrasion, corrosion and other forms of degradation, as well as to provide enhanced sealing of the Z material against leakage. Methods of bonding the desired coating to the optical element are also disclosed.
Rotatable Panels On An Exterior Of A Structure That Directs Solar Energy Within The Structure
US Patent:
2012006, Mar 22, 2012
Filed:
Sep 21, 2010
Appl. No.:
12/886724
Inventors:
David R. Hall - Provo UT, US
Craig Boswell - Provo UT, US
Eric Gardner - Provo UT, US
David Allred - Provo UT, US
Craig Boswell - Provo UT, US
Eric Gardner - Provo UT, US
David Allred - Provo UT, US
International Classification:
E04D 13/18, F24J 2/00
US Classification:
126621, 126714
Abstract:
In one aspect of the present invention, a structure comprises a plurality of reflective panels secured to the structure. Each reflective panel has an axis of rotation. A processing element controls an orientation of each reflective panel about its axis of rotation to direct solar energy within the structure.
Rotatable Panels On An Exterior Of A Structure That Directs Solar Energy Within The Structure
US Patent:
2012006, Mar 22, 2012
Filed:
Sep 30, 2010
Appl. No.:
12/894491
Inventors:
David R. Hall - Provo UT, US
Craig Boswell - Provo UT, US
Eric Gardner - , US
David Allred - Provo UT, US
Craig Boswell - Provo UT, US
Eric Gardner - , US
David Allred - Provo UT, US
International Classification:
F24J 2/38, H01L 31/00, F24J 2/46
US Classification:
126600, 126623, 136252
Abstract:
In one aspect of the present invention, a structure comprises a plurality of reflective panels secured to the structure. Each reflective panel has an axis of rotation. A processing element controls an orientation of each reflective panel about its axis of rotation to direct solar energy within the structure.