DAVID EDWARD MURRAY, CRNA
Nursing at Bicentennial Way, Santa Rosa, CA

License number
California 702116
Category
Nursing
Type
Registered Nurse
License number
California 3982
Category
Nursing
Type
Nurse Anesthetist, Certified Registered
Address
Address 2
401 Bicentennial Way, Santa Rosa, CA 95403
7662 Baldocchi Way, Windsor, CA 95492
Phone
(707) 393-4000
(503) 319-9855

Personal information

See more information about DAVID EDWARD MURRAY at radaris.com
Name
Address
Phone
David Murray, age 66
4779 62Nd St, San Diego, CA 92115
David Murray
4738 Muscatel Ave, Rosemead, CA 91770
(626) 285-1112
David Murray
4811 Bayview Dr, Copperopolis, CA 95228
(209) 814-8188
David Murray
4673 W Vartikian Ave, Fresno, CA 93722
(559) 271-8511
David Murray
493 E Walnut St, Pasadena, CA 91101

Professional information

See more information about DAVID EDWARD MURRAY at trustoria.com
David Murray Photo 1
Apparatus And Method For Performing Failure Diagnostic Testing Of Electronic Equipment

Apparatus And Method For Performing Failure Diagnostic Testing Of Electronic Equipment

US Patent:
2008005, Mar 6, 2008
Filed:
Nov 21, 2006
Appl. No.:
11/562400
Inventors:
Phillipe A. Melman - Occidental CA, US
Kim Chung Thi Thanh - Rohnert Park CA, US
David W. Murray - Windsor CA, US
James M. Dematteis - Davis CA, US
International Classification:
G06F 11/00
US Classification:
714 25
Abstract:
An apparatus and method for automated diagnostic testing of an electronic device assembly so that functional testing, collection of test results, diagnosis for identifying potentially failed components in the device assembly is a software controlled automated process. In one embodiment of the present invention, a component-level block diagram is coupled to the controllable devices in the device assembly so that an operator can set up and conduct the functional testing of the device assembly. The diagram is also updated with the generated test data for displaying to the user potentially failed components and other information for helping the user to diagnose and to troubleshoot the situation.


David Murray Photo 2
Equipment Testing System And Method Having Scaleable Test Line Limits

Equipment Testing System And Method Having Scaleable Test Line Limits

US Patent:
2008012, May 29, 2008
Filed:
Sep 1, 2006
Appl. No.:
11/515258
Inventors:
David W. Murray - Windsor CA, US
Kim Chung Thi Thanh - Rohnert Park CA, US
International Classification:
G06F 19/00, G06F 15/00, G01R 31/02
US Classification:
702119, 702185
Abstract:
A method is provided for performing a diagnostic test of a piece of equipment, the equipment including a plurality of components and an embedded diagnostic tool, each component including a respective fault report store. The method comprises setting initial test limits; running a diagnostic test; testing whether the test limits need to be re-scaled, and if so, then (i) re-scaling the test limits, and (ii) re-running the diagnostic test.


David Murray Photo 3
David Murray - Santa Rosa, CA

David Murray - Santa Rosa, CA

Work:
Taco Bell - Rohnert Park, CA
Shift Manager
Taco Bell - Santa Rosa, CA
Administration/ Ticket Seller
McDonalds - Rohnert Park, CA
Shift Manager
Priceless Drug Store - Granite Bay, CA
Customer Service
Education:
Kaplan University
A.A.S. in Accounting


David Murray Photo 4
Development Environment And Basic Tenets For Enabling Robust Embedded Diagnostics In Rf Systems

Development Environment And Basic Tenets For Enabling Robust Embedded Diagnostics In Rf Systems

US Patent:
2008007, Apr 3, 2008
Filed:
Sep 1, 2006
Appl. No.:
11/515061
Inventors:
David W. Murray - Windsor CA, US
Kim Chung Thi Thanh - Rohnert Park CA, US
International Classification:
G01R 31/08
US Classification:
324527
Abstract:
For a communication system that employs interconnected communication components and defines a communication pathway running through the communication components and through interconnections therebetween, the communication pathway having test points, an apparatus for performing diagnostic tests on the communication system comprises testing agents residing on-board the communication components, and a test controller, coupled for communication over the communication pathway. The test controller includes a test signal apparatus coupled to send a test signal over the communication pathway, detectors, coupled to the test points, for sensing communication activity at the test points responsive to the test signal, and a communication activity analyzer, coupled to receive communication activity information from the detectors, for analyzing the received communication activity information to identify a fault and isolate a communication component containing the fault.


David Murray Photo 5
Method And System For Performing Embedded Diagnostic Application At Subassembly And Component Level

Method And System For Performing Embedded Diagnostic Application At Subassembly And Component Level

US Patent:
2008008, Apr 17, 2008
Filed:
Sep 1, 2006
Appl. No.:
11/515060
Inventors:
David W. Murray - Windsor CA, US
Kim Chung Thi Thanh - Rohnert Park CA, US
International Classification:
G01R 31/02
US Classification:
324754
Abstract:
A method for performing a diagnostic test on a piece of equipment comprises performing a component level diagnostic test on the piece of equipment, the component level diagnostic test employing a component-level model of the piece of equipment; using the results of the component-level diagnostic test to determine whether a faulty component of the piece of equipment can be identified; and, if the component-level diagnostic test identifies a faulty component, then performing a sub-component level diagnostic test on the identified faulty sub-component, the sub-component level diagnostic test employing a sub-component level model of the identified failed component.


David Murray Photo 6
System And Method For Storing Embedded Diagnostic Test Failure Reports On A Faulty Component

System And Method For Storing Embedded Diagnostic Test Failure Reports On A Faulty Component

US Patent:
2008012, May 29, 2008
Filed:
Sep 1, 2006
Appl. No.:
11/514426
Inventors:
David W. Murray - Windsor CA, US
Kim Chung Thi Thanh - Rohnert Park CA, US
Bruce A. Erickson - Santa Rosa CA, US
David M. Gallegos - Albany CA, US
Alan N. Wight - Petaluma CA, US
International Classification:
G06F 11/28
US Classification:
714 37, 714E11178
Abstract:
A method is provided for performing a diagnostic test on a piece of equipment, the equipment including a plurality of components, each of the components including a diagnostic test result store. The method comprises executing a diagnostic test by means of a diagnostic apparatus embedded within the piece of equipment, determining, based on the results of the diagnostic test, that one of the components is diagnosed to be faulty, preparing a report of results of the diagnostic test within the diagnostic test store of the faulty component; and storing the report in a test report store on-board the diagnosed faulty component.


David Murray Photo 7
Measurement And Calibration Method For Embedded Diagnostic Systems

Measurement And Calibration Method For Embedded Diagnostic Systems

US Patent:
2008008, Apr 3, 2008
Filed:
Sep 1, 2006
Appl. No.:
11/515056
Inventors:
David W. Murray - Windsor CA, US
Kim Chung Thi Thanh - Rohnert Park CA, US
Bruce A. Erickson - Santa Rosa CA, US
International Classification:
G01R 31/28, G06F 11/00
US Classification:
714742
Abstract:
An apparatus for performing an embedded diagnostic test on a piece of equipment, the equipment including a plurality of components and defining various pathways through respective subsets of the components, comprises an input stimulus generator for generating stimulus signals, coupled to provide the stimulus signals as input to the functionality of the equipment, respective ones of the stimulus signals exercising respective ones of the subsets of components; wherein the stimulus signals include a subset of core stimulus signals, such that a given one of the pathways includes a plurality of segments, different ones of the core stimulus signals exercising different ones of the segments of the given one of the pathways.


David Murray Photo 8
Method For Normalized Test Line Limits With Measurement Uncertainty

Method For Normalized Test Line Limits With Measurement Uncertainty

US Patent:
2008015, Jun 26, 2008
Filed:
Sep 1, 2006
Appl. No.:
11/515057
Inventors:
David Murray - Windsor CA, US
Kim Thanh - Rohnert Park CA, US
International Classification:
G06F 19/00, G06F 17/40
US Classification:
702108000, 702127000, 702001000, 702182000, 702113000, 702117000, 702085000, 702187000
Abstract:
A method is provided for performing a diagnostic test on a piece of equipment, the equipment including a plurality of components and defining various pathways through respective subsets of the components, the equipment having an operator. The method comprises setting test limits, performing the test and obtaining test results, and determining whether the test results fall within the test limit. When the test results fall outside the test limits, it is determined whether the test limits are aligned. If not, then the test results are disregarded.