DAVID CRAIG SMITH, PAC
Nursing at Bascom Ave, San Jose, CA

6691249, Feb 10, 2004

Mar 22, 2000

09/533115

Lee A. Barford - San Jose CA
David R. Smith - San Jose CA

Agilent Technologies, Inc. - Palo Alto CA

G06F 1100

714 25, 714 26, 714 46, 714 57

A diagnosis engine for diagnosing a device having a plurality of components receives test results of a set of tests on the device where at least one test has failed, and a model giving the coverage of the tests on the components of the device and information describing probabilistic dependencies between the tests. The diagnosis engine includes a specifier to specify a number N of components that may be simultaneously bad, N being an integer, and a computer to compute, within floating point computation errors, a likelihood that each of subsets of the components having size less than or equal to N are the bad components.

7897867, Mar 1, 2011

Feb 13, 2008

12/069993

William P. Mulligan - San Jose CA, US
Michael J. Cudzinovic - Sunnyvale CA, US
Thomas Pass - San Jose CA, US
David Smith - San Jose CA, US
Neil Kaminar - Boulder Creek CA, US
Keith McIntosh - Newport Beach, AU
Richard M. Swanson - Los Altos CA, US

SunPower Corporation - San Jose CA

H01L 31/00

136256, 136252

A solar cell that is readily manufactured using processing techniques which are less expensive than microelectronic circuit processing. In preferred embodiments, printing techniques are utilized in selectively forming masks for use in etching of silicon oxide and diffusing dopants and in forming metal contacts to diffused regions. In a preferred embodiment, p-doped regions and n-doped regions are alternately formed in a surface of the wafer through use of masking and etching techniques. Metal contacts are made to the p-regions and n-regions by first forming a seed layer stack that comprises a first layer such as aluminum that contacts silicon and functions as an infrared reflector, second layer such titanium tungsten that acts as diffusion barrier, and a third layer functions as a plating base. A thick conductive layer such as copper is then plated over the seed layer, and the seed layer between plated lines is removed. A front surface of the wafer is preferably textured by etching or mechanical abrasion with an IR reflection layer provided over the textured surface.

6130046, Oct 10, 2000

Aug 31, 1998

9/144514

Earl A. Hubbell - Los Angeles CA
David P. Smith - San Jose CA

Affymetrix, Inc. - Santa Clara CA

C12Q 160, G01N 3348, C12P 1934, C07H 2100

435 6

Techniques for designing polymer probes to verify the integrity of the probe synthesis are provided. Multiple probes with identical sequences are designed so that the probes will be formed utilizing at least one different monomer addition cycle. Based on the probes affinity to a control target, variations (e. g. , errors) in probe synthesis may be identified.

7388147, Jun 17, 2008

Apr 10, 2003

10/412711

William P. Mulligan - San Jose CA, US
Michael J. Cudzinovic - Sunnyvale CA, US
Thomas Pass - San Jose CA, US
David Smith - San Jose CA, US
Richard M. Swanson - Los Altos CA, US

Sunpower Corporation - San Jose CA

H01L 31/00

136256, 136261, 438 98, 205123, 205157

In a solar cell having p doped regions and n doped regions alternately formed in a surface of a semiconductor wafer in offset levels through use of masking and etching techniques, metal contacts are made to the p regions and n regions by first forming a base layer contacting the p doped regions and n doped regions which functions as an antireflection layer, and then forming a barrier layer, such as titanium tungsten or chromium, and a conductive layer such as copper over the barrier layer. Preferably the conductive layer is a plating layer and the thickness thereof can be increased by plating.

2006019, Sep 7, 2006

Aug 22, 2005

11/210213

Richard Swanson - Los Altos CA, US
Denis De Ceuster - Woodside CA, US
Vikas Desai - Cupertino CA, US
Douglas Rose - Mt. View CA, US
David Smith - San Jose CA, US
Neil Kaminar - Santa Cruz CA, US

H01L 31/00, H02N 6/00

136244000, 136261000

In one embodiment, harmful solar cell polarization is prevented or minimized by providing a conductive path that bleeds charge from a front side of a solar cell to the bulk of a wafer. The conductive path may include patterned holes in a dielectric passivation layer, a conductive anti-reflective coating, or layers of conductive material formed on the top or bottom surface of an anti-reflective coating, for example. Harmful solar cell polarization may also be prevented by biasing a region of a solar cell module on the front side of the solar cell.

2003020, Oct 30, 2003

Apr 25, 2002

10/132626

Jonathan Li - Redwood City CA, US
David Smith - San Jose CA, US
Lee Barford - San Jose CA, US
John Heumann - Loveland CO, US

G06N005/00

707/100000

Hierarchical classification of samples. First stage classification identifies most members of the majority class and removes them from further consideration. Second stage classification then focuses on discriminating between the minority class and the greatly reduced number of majority class samples lying near the decision boundary.

2008021, Sep 4, 2008

May 12, 2008

12/119063

William P. Mulligan - San Jose CA, US
Michael J. Cudzinovic - Sunnyvale CA, US
Thomas Pass - San Jose CA, US
David Smith - San Jose CA, US
Richard M. Swanson - Los Altos Hills CA, US

SUNPOWER CORPORATION - San Jose CA

H01L 31/04, H01L 31/00

136256, 136252, 438 98, 257E31001

In a solar cell having p doped regions and n doped regions alternately formed in a surface of a semiconductor wafer in offset levels through use of masking and etching techniques, metal contacts are made to the p regions and n regions by first forming a base layer contacting the p doped regions and n doped regions which functions as an antireflection layer, and then forming a barrier layer, such as titanium tungsten or chromium, and a conductive layer such as copper over the barrier layer. Preferably the conductive layer is a plating layer and the thickness thereof can be increased by plating.

2005021, Sep 29, 2005

Oct 27, 2004

10/975245

Earl Hubbell - Los Angeles CA, US
David Smith - San Jose CA, US

AFFYMETRIX, INC., a Corporation of the state of California - Santa Clara CA

G06F017/50, G06F019/00, G01N033/48, G01N033/50, H01L021/00

702019000, 438001000, 716004000

Techniques for designing polymer probes to verify the integrity of the probe synthesis are provided. Multiple probes with identical sequences are designed so that the probes will be formed utilizing at least one different monomer addition cycle. Based on the probes affinity to a control target, variations (e.g., errors) in probe synthesis may be identified.