DAVID BONYUET
Engineering in Watertown, MA
License number
Massachusetts 20729
Type
Engineer in Training
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Address
Watertown, MA 02472
Professional information
Methods And Systems For Chemical Composition Measurement And Monitoring Using A Rotating Filter Spectrometer
US Patent:
2010002, Feb 4, 2010
Filed:
Apr 21, 2009
Appl. No.:
12/427485
Inventors:
David Bonyuet - Watertown MA, US
Vidi A. Saptari - Cambridge MA, US
Vidi A. Saptari - Cambridge MA, US
Assignee:
Precisive, LLC - Stoneham MA
International Classification:
G01J 3/28
US Classification:
356326, 356451
Abstract:
The invention relates to methods and systems for measuring and/or monitoring the chemical composition of a sample (e.g., a process stream), and/or detecting specific substances or compounds in a sample, using light spectroscopy such as absorption, emission and fluorescence spectroscopy. In certain embodiments, the invention relates to spectrometers with rotating narrow-band interference optical filter(s) to measure light intensity as a function of wavelength. More specifically, in certain embodiments, the invention relates to a spectrometer system with a rotatable filter assembly with a position detector rigidly attached thereto, and, in certain embodiments, the further use of various oversampling methods and techniques described herein, made particularly useful in conjunction with the rotatable filter assembly. In preferred embodiments, the rotatable filter is tilted with respect to the rotation axis, thereby providing surprisingly improved measurement stability and significantly improved control of the wavelength coverage of the filter spectrometer.
Methods And Systems For Chemical Composition Measurement And Monitoring Using A Rotating Filter Spectrometer
US Patent:
8502981, Aug 6, 2013
Filed:
Apr 20, 2012
Appl. No.:
13/451621
Inventors:
David Bonyuet - Watertown MA, US
Vidi A. Saptari - Cambridge MA, US
Vidi A. Saptari - Cambridge MA, US
Assignee:
Pason Systems Corp. - Calgary, Alberta
International Classification:
G01N 21/25
US Classification:
356418
Abstract:
The invention relates to methods and systems for measuring and/or monitoring the chemical composition of a sample (e. g. , a process stream), and/or detecting specific substances or compounds in a sample, using light spectroscopy such as absorption, emission and fluorescence spectroscopy. In certain embodiments, the invention relates to spectrometers with rotating narrow-band interference optical filter(s) to measure light intensity as a function of wavelength. More specifically, in certain embodiments, the invention relates to a spectrometer system with a rotatable filter assembly with a position detector rigidly attached thereto, and, in certain embodiments, the further use of various oversampling methods and techniques described herein, made particularly useful in conjunction with the rotatable filter assembly. In preferred embodiments, the rotatable filter is tilted with respect to the rotation axis, thereby providing surprisingly improved measurement stability and significantly improved control of the wavelength coverage of the filter spectrometer.