DANIEL RALPH NEAL
Pilots at Eric Alan, Sedillo, NM

License number
New Mexico A5074670
Issued Date
May 2016
Expiration Date
May 2018
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
17 Eric Alan, Sedillo, NM 87059

Professional information

Daniel Neal Photo 1

Treatment Planning Method And System For Controlling Laser Refractive Surgery

US Patent:
2012017, Jul 5, 2012
Filed:
Dec 30, 2011
Appl. No.:
13/341385
Inventors:
Thomas D. Raymond - Edgewood NM, US
Daniel R. Neal - Tijeras NM, US
Assignee:
AMO Wavefront Sciences, LLC - Santa Ana CA
International Classification:
A61B 3/107, A61F 9/01, A61B 3/10
US Classification:
606 5, 351246, 351205
Abstract:
Improved devices, systems, and methods for diagnosing, planning treatments of, and/or treating the refractive structures of an eye of a patient incorporate results of prior refractive corrections into a planned refractive treatment of a particular patient by driving an effective treatment vector function based on data from the prior eye treatments. The exemplary effective treatment vector employs an influence matrix which may allow improved refractive corrections to be generated so as to increase the overall accuracy of laser eye surgery (including LASIK, PRK, and the like), customized intraocular lenses (IOLs), refractive femtosecond treatments, and the like.


Daniel Neal Photo 2

Tomographic Wavefont Analysis System And Method Of Mapping An Optical System

US Patent:
6634750, Oct 21, 2003
Filed:
Jun 13, 2002
Appl. No.:
10/167439
Inventors:
Daniel R. Neal - Tijeras NM
Richard J. Copland - Albuquerque NM
Assignee:
WaveFront Sciences, Inc. - Albuquerque NM
International Classification:
A61B 310
US Classification:
351211
Abstract:
A method of measuring aberrations of a three-dimensional structure of an optical system, such as an eye, includes creating a plurality of light beams, optically imaging the light beams and projecting the light beams onto different locations in an optical system, receiving scattered light from each of the locations, and detecting individual wavefronts of the scattered light. The plurality of light beams may be created and projected simultaneously or sequentially. A system for measuring aberrations of a three-dimensional structure of an optical system includes a light source creating a plurality of light beams, an optical imaging system optically imaging the light beams and projecting the light beams onto different locations in the target optical system, and a wavefront sensor receiving scattered light from each of the locations and detecting individual wavefronts of the scattered light.


Daniel Neal Photo 3

Monolithically Integrated Solid State Laser And Waveguide Using Spin-On Glass

US Patent:
5463649, Oct 31, 1995
Filed:
Aug 6, 1993
Appl. No.:
8/102907
Inventors:
Carol I. H. Ashby - Edgewood NM
John P. Hohimer - Albuquerque NM
Daniel R. Neal - Tijeras NM
G. Allen Vawter - Albuquerque NM
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
H01S 306, H01S 30941, H01S 317
US Classification:
372 40
Abstract:
A monolithically integrated photonic circuit combining a semiconductor source of excitation light with an optically active waveguide formed on the substrate. The optically active waveguide is preferably formed of a spin-on glass to which are added optically active materials which can enable lasing action, optical amplification, optical loss, or frequency conversion in the waveguide, depending upon the added material.


Daniel Neal Photo 4

Compact Binocular Adaptive Optics Phoropter

US Patent:
2012000, Jan 5, 2012
Filed:
Jul 2, 2010
Appl. No.:
12/829691
Inventors:
Daniel R. Neal - Tijeras NM, US
Assignee:
AMO Wavefront Sciences, LLC - Santa Ana CA
International Classification:
A61B 3/08, A61B 3/02
US Classification:
351201, 351239, 351233, 351246
Abstract:
A binocular vision apparatus allows a patient to view objects through the apparatus with polychromatic light and monochromatic aberration correction, such that the chromatic aberration of the eye can be combined with the monochromatic aberration correction, so as to provide a more accurate determination of vision quality. The binocular vision apparatus provides left and right viewing optics that can substantially maintain the line of sight of each eye, such that objects can be viewed in a room with 3D depth perception corresponding to the distance of the object from the patient. As both near and far objects can be viewed with binocular aberration correction, the patient can alternate binocular viewing between near and far vision with chromatic aberration so as to evaluate a proposed treatment such as a presbyopia correction.


Daniel Neal Photo 5

Optical Diagnosis Using Measurement Sequence

US Patent:
2011014, Jun 23, 2011
Filed:
Oct 21, 2010
Appl. No.:
12/909756
Inventors:
Daniel R. Neal - Tijeras NM, US
Thomas D. Raymond - Edgewood NM, US
Leander Zickler - Mountain View CA, US
Assignee:
AMO Wavefront Sciences, LLC - Santa Ana CA
International Classification:
A61B 3/103, A61B 3/10, A61B 3/11
US Classification:
351205, 351246
Abstract:
Devices, systems, and methods that facilitate optical analysis, particularly for the diagnosis and treatment of refractive errors of the eye. An optical diagnostic method for an eye includes obtaining a sequence of aberration measurements of the eye, identifying an outlier aberration measurement of the sequence of aberration measurements, and excluding the outlier aberration measurement from the sequence of aberration measurements to produce a qualified sequence of aberration measurements. The sequence of aberrations measurements can be obtained by using a wavefront sensor. An optical correction for the eye can be formulated in response to the qualified sequence of aberration measurements.


Daniel Neal Photo 6

Systems And Methods Of Phase Diversity Wavefront Sensing

US Patent:
8118429, Feb 21, 2012
Filed:
Oct 28, 2008
Appl. No.:
12/259381
Inventors:
Thomas D. Raymond - Edgewood NM, US
Paul Pulaski - Albuquerque NM, US
Stephen W. Farrer - Albuquerque NM, US
Daniel R. Neal - Tijeras NM, US
Alan H. Greenaway - Edinburgh, GB
David M. Faichnie - Glasgow, GB
Heather I. Campbell Dalgarno - West Lothian, GB
Graham N. Craik - Edinburgh, GB
Assignee:
AMO Wavefront Sciences, LLC. - Santa Ana CA
International Classification:
A61B 3/10, G02B 5/18
US Classification:
351205, 351213, 359566
Abstract:
A phase diversity wavefront sensor includes an optical system including at least one optical element for receiving a light beam; a diffractive optical element having a diffractive pattern defining a filter function, the diffractive optical element being arranged to produce, in conjunction with the optical system, images from the light beam associated with at least two diffraction orders; and a detector for detecting the images and outputting image data corresponding to the detected images. In one embodiment, the optical system, diffractive optical element, and detector are arranged to provide telecentric, pupil plane images of the light beam. A processor receives the image data from the detector, and executes a Gerchberg-Saxton phase retrieval algorithm to measure the wavefront of the light beam.


Daniel Neal Photo 7

System And Method Of Measuring And Mapping Three Dimensional Structures

US Patent:
7553022, Jun 30, 2009
Filed:
Jul 27, 2007
Appl. No.:
11/829184
Inventors:
Daniel R. Neal - Tijeras NM, US
Richard James Copland - Albuquerque NM, US
David A. Neal - Albuquerque NM, US
Assignee:
AMO Wavefront Sciences, LLC - Albuquerque NM
International Classification:
A61B 3/00
US Classification:
351246, 351221, 351212, 351216
Abstract:
A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.


Daniel Neal Photo 8

One Dimensional Wavefront Distortion Sensor Comprising A Lens Array System

US Patent:
5493391, Feb 20, 1996
Filed:
Jul 11, 1994
Appl. No.:
8/273569
Inventors:
Daniel R. Neal - Tijeras NM
Robert B. Michie - Albuquerque NM
Assignee:
Sandia Corporation - Albuquerque NM
International Classification:
G01J 100, G01J 120
US Classification:
356121
Abstract:
A 1-dimensional sensor for measuring wavefront distortion of a light beam as a function of time and spatial position includes a lens system which incorporates a linear array of lenses, and a detector system which incorporates a linear array of light detectors positioned from the lens system so that light passing through any of the lenses is focused on at least one of the light detectors. The 1-dimensional sensor determines the slope of the wavefront by location of the detectors illuminated by the light. The 1 dimensional sensor has much greater bandwidth that 2 dimensional systems.


Daniel Neal Photo 9

Beam Characterization By Wavefront Sensor

US Patent:
5936720, Aug 10, 1999
Filed:
Jul 7, 1998
Appl. No.:
9/111620
Inventors:
Daniel R. Neal - Tijeras NM
W. J. Alford - Albuquerque NM
James K. Gruetzner - Albuquerque NM
International Classification:
G01J 100
US Classification:
356121
Abstract:
An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.


Daniel Neal Photo 10

Method And System For Measuring The Curvature Of An Optical Surface

US Patent:
7570351, Aug 4, 2009
Filed:
Jun 30, 2006
Appl. No.:
11/478433
Inventors:
Zino Altman - Newtown PA, US
Daniel R. Neal - Tijeras NM, US
Richard James Copland - Albuquerque NM, US
Assignee:
Amo Wavefront Sciences, LLC. - Santa Ana CA
International Classification:
G01B 9/00
US Classification:
356124
Abstract:
A system and method of measuring the curvature of a surface of a object operate by illuminating the object surface with a light pattern having a known size to produce a virtual reflected image from the object surface; measuring a size of the virtual reflected image produced by the object surface from the light pattern; and calculating a curvature of the object surface from the known size of the light pattern and the size of the virtual reflected image.