Inventors:
Christopher M. League - Madison AL, US
International Classification:
G01R 31/02, G01R 31/3187, G01R 31/26
Abstract:
A fault diagnostic circuit () and associated method of operation are described for testing an FET device () for a gate-drain short failure () by floating the FET gate during a predetermined test period and then comparing () the FET output voltage () at the source to a predetermined threshold voltage (V) which may be selected as a percentage of the power supply voltage (V) for the FET device to determine if the FET output voltage is greater than the threshold voltage, in which case a device fault is signaled ().