Inventors:
Jason Randolph Allen - Niskayuna NY, US
Jared Michael Crosby - Scotia NY, US
Christopher Joseph Uhl - Cincinnati OH, US
Michael Orlando Cimini - Cincinnati OH, US
Bianca Mary McCartt - Cincinnati OH, US
James Walter Caddell - Milford OH, US
Jared Reece Reynolds - Fort Thomas KY, US
Robert William Tait - Niskayuna NY, US
Andrew Frank Ferro - West Chester OH, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01F 1/34, G01N 25/00, G06F 15/00
Abstract:
A thermal inspection system includes a fluid source configured to supply a warm flow and a cool flow, indirectly or directly, to internal passage(s) of a component. The system includes an imager configured to capture a time series of images corresponding to a transient thermal response of the component to the warm and cool flows. The system further includes at least one flow meter configured to measure the warm and cool flows supplied to the component and a processor operably connected to the imager. The processor determines the transient thermal response of the component around a transition time. The flow supplied to the component switches from the warm flow to the cool flow at the transition time. The processor compares the transient thermal response around the transition time with one or more baseline values or with an acceptable range of values to determine if the component meets a desired specification.