CHRISTOPHER D MANN
Nursing at Kingston Pike, Knoxville, TN
License number
Florida 9399910
Issued Date
Jan 28, 2015
Effective Date
Aug 2, 2016
Expiration Date
Jul 31, 2016
Category
Health Care
Type
Registered Nurse
Address
Address
11124 Kingston Pike SUITE 119 # 256, Knoxville, TN 37934
Phone
(406) 579-6627
Professional information
Three Wavelength Quantitative Imaging Systems
US Patent:
7978336, Jul 12, 2011
Filed:
Mar 16, 2009
Appl. No.:
12/381758
Inventors:
Christopher J. Mann - Knoxville TN, US
Philip R. Bingham - Knoxville TN, US
Philip R. Bingham - Knoxville TN, US
Assignee:
UT-Battelle, LLC - Oak Ridge TN
International Classification:
G01B 9/02, G01B 11/02, G01N 21/41, G01N 21/43
US Classification:
356485, 356498, 356503, 356517
Abstract:
An optical system includes more than two optical interferometers that generate interference phenomena between optical waves to measure a plurality of distances, a plurality of thicknesses, and a plurality of indices of refraction of a sample. An electromagnetic detector receives an output of the optical interferometers to render a magnified image of at least a portion of the sample. A controller reduces or eliminates undesired optical signals through a hierarchical phase unwrapping of the output of the electromagnetic detector.
Quantitative Phase-Imaging Systems
US Patent:
8248614, Aug 21, 2012
Filed:
Mar 16, 2009
Appl. No.:
12/405063
Inventors:
Christopher J. Mann - Knoxville TN, US
Philip R. Bingham - Knoxville TN, US
Shaun S. Gleason - Knoxville TN, US
Philip R. Bingham - Knoxville TN, US
Shaun S. Gleason - Knoxville TN, US
Assignee:
UT-Battelle, LLC - Oak Ridge TN
International Classification:
G01B 9/02
US Classification:
356485
Abstract:
An optical system performs imaging in a transmissive and reflective mode. The system includes an optical interferometer that generates interference phenomena between optical waves to measure multiple distances, thicknesses, and indices of refraction of a sample. Measurements are made through a galvanometer that scans a pre-programmed angular arc. An excitation-emission device allows an electromagnetic excitation and emission to pass through an objective in optical communication with the sample. An electromagnetic detector receives the output of the optical interferometer and the excitation-emission device to render a magnified three dimensional image of the sample.
Quantitative Phase-Contrast And Excitation-Emission Systems
US Patent:
8264694, Sep 11, 2012
Filed:
Mar 16, 2009
Appl. No.:
12/405089
Inventors:
Christopher J. Mann - Knoxville TN, US
Philip R. Bingham - Knoxville TN, US
Philip R. Bingham - Knoxville TN, US
Assignee:
UT-Battelle, LLC - Oak Ridge TN
International Classification:
G01B 11/02
US Classification:
356512
Abstract:
An optical system includes an optical interferometer that generates interference phenomena between optical waves to measure multiple distances, thicknesses, and indices of refraction of a sample. An excitation-emission device allows an electromagnetic excitation and emission to pass through an objective in optical communication with the sample. An electromagnetic detector receives the output of the optical interferometer and the excitation-emission device to render a magnified image of the sample. A digital delay generator synchronizes the optical interferometer and excitation-emission device to operate in substantially unison to generate a noninvasive depth of field of the portion of the sample that corrects a plurality of optical aberrations in real-time.