DR. CHARLES DON MEYER, PHD
Social Work at Calle Rinconada, Santa Barbara, CA

2002009, Jul 18, 2002

Oct 30, 2001

09/999681

Craig Prater - Santa Barbara CA, US
Charles Meyer - Santa Barbara CA, US
Chanmin Su - Ventura CA, US
James Massie - Santa Barbara CA, US
Kenneth Babcock - Santa Barbara CA, US
Mary Turner - Tucson AZ, US

VEECO INSTRUMENTS INC.

G01N022/00

073/024020

An integrated cantilever sensor array system that accurately detects and measures the presence of target substances in various environmental conditions. The integrated cantilever sensor array system comprises a cantilever sensor measurement head, a cantilever sensor system for measuring the oscillatory properties of the cantilevers and a measurement chamber. The measurement head includes a cantilever array having at least one cantilever, a light source and a detector positioned to detect incoming light reflected by the cantilevers within the cantilever array. The cantilever sensor system measures the oscillatory properties generated by the cantilevers within the cantilever array. The system includes the cantilever array and a detection system that measures a signal related to the bending of the cantilever. In addition, optional components such as a high frequency clock, Q-Control, may be added to more accurately measure the oscillation of the cantilevers within the cantilever array. The measurement chamber includes a flow cell, a cantilever sensor array mounted within the flow cell. The flow cell is designed to minimize dead volume and unwanted air bubbles within the cell, which may reduce accuracy of measurement.

5705814, Jan 6, 1998

Aug 30, 1995

8/521584

James M. Young - Santa Barbara CA
Craig B. Prater - Santa Barbara CA
David A. Grigg - Santa Barbara CA
Charles R. Meyer - Santa Barbara CA
William H. Hertzog - Santa Barbara CA
John A. Gurley - Santa Barbara CA
Virgil B. Elings - Santa Barbara CA

Digital Instruments, Inc. - Santa Barbara CA

H01J 3700

250306

A scanning probe microscope and method having automated exchange and precise alignment of probes, wherein one or more additional stored probes for installation onto a probe mount are stored in a storage cassette or a wafer, a selected probe is aligned to a detection system, and the aligned probe is then clamped against the probe mount. Clamping is performed using a clamp which is disabled when removing a replacement probe from the storage cassette, enabled when installing the probe on the probe mount and disabled when releasing the probe at a later time for subsequent probe exchange. Probe alignment is automated using signals from the probe detection system or by forming an optical image of the probe using a camera or similar technique and determining probe positioning using pattern recognition processing of the probe image to allow probe removal and exchange without operator intervention. Techniques for error checking are employed to ensure proper probe installation and operation.

5314254, May 24, 1994

Nov 3, 1992

7/970875

Frank D. Yashar - Santa Barbara CA
Charles R. Meyer - Santa Barbara CA
John A. Gurley - Santa Barbara CA

Digital Instruments - Santa Barbara CA

F16C 2902, F16C 2912

384 49

A stiffener assembly which provides for improved performance of a movable stage arrangement. Often, it is desired to provide a movable stage arrangement in which a stage moves linearly with respect to a stationary base. In many applications, it is necessary for the stage to move to successive rest positions, with movement of the stage inhibited at each of the reset positions. The stiffener of the present invention allows for controlled movement of a stage along its direction of travel, with the stiffener inhibiting undesired movement when the stage is at a rest position. In one form, a stiffener extends in the direction of travel of the stage, with one end of the stiffener assembly mounted to the stationary base, and the other end urged into frictional contact with the movable stage by a force applicator. As a result, the stiffener is placed in frictional contact with the movable stage. The coupling of the stage to the stiffener is insufficient to impede desired movement of the stage, however undesired movement at rest positions of the stage are avoided.

7665349, Feb 23, 2010

May 19, 2005

11/132959

Paul I. Mininni - Montreal, CA
Jason R. Osborne - Lompoc CA, US
James M. Young - Santa Barbara CA, US
Charles R. Meyer - Santa Barbara CA, US

Veeco Instruments Inc. - Plainview NY

G01Q 10/00, G01Q 60/24

73105

A method and apparatus of engaging a probe with a sample surface including automatically reducing the spacing between a probe of a probe based instrument and a sample from an initial separation to one in which the probe is positioned for obtaining a sample surface measurement in less than ten seconds without damaging either the probe or the sample. The method includes oscillating the probe, measuring at least one parameter of probe oscillation and then engaging the probe and the sample by generally continuously controlling the reducing step based on the measuring step to reduce the separation from an initial separation to an engage position. In addition to feeding back directly on the tip-sample interaction, a direct communication line is provided between the processor used to generate control signals that govern the engage and a conventional motion controller. In an alternative, a coarse positioning actuator and a fine positioning actuator in which the control of both is coordinated under feedback to place the probe in the engaged position, and wherein the close approach phase of the algorithm is controlled by a dedicated real time controller.

2005012, Jun 9, 2005

Oct 28, 2004

10/975792

Craig Prater - Santa Barbara CA, US
Charles Meyer - Santa Barbara CA, US
Chanmin Su - Ventura CA, US
James Massie - Santa Barbara CA, US
Kenneth Babcock - Santa Barbara CA, US
Mary Turner - Tucson AZ, US

G01N021/35

250343000, 250339130

An integrated cantilever sensor array system that accurately detects and measures the presence of target substances in various environmental conditions. The integrated cantilever sensor array system comprises a cantilever sensor measurement head, a cantilever sensor system for measuring the oscillatory properties of the cantilevers and a measurement chamber. The measurement head includes a cantilever array having at least one cantilever, a light source and a detector positioned to detect incoming light reflected by the cantilevers within the cantilever array. The cantilever sensor system measures the oscillatory properties generated by the cantilevers within the cantilever array. The system includes the cantilever array and a detection system that measures a signal related to the bending of the cantilever. In addition, optional components such as a high frequency clock, Q-Control, may be added to more accurately measure the oscillation of the cantilevers within the cantilever array. The measurement chamber includes a flow cell, a cantilever sensor array mounted within the flow cell. The flow cell is designed to minimize dead volume and unwanted air bubbles within the cell, which may reduce accuracy of measurement.

7607342, Oct 27, 2009

Apr 26, 2006

11/380338

Lin Huang - Goleta CA, US
Charles Meyer - Santa Barbara CA, US

Vecco Instruments, Inc. - Santa Barara CA

G01B 5/28, G01N 13/16

73105

A cantilever probe-based instrument is controlled to reduce the lateral loads imposed on the probe as a result of probe/sample interaction. In a preferred embodiment, the probe tip and/or sample are driven to move laterally relative to one another as a function of cantilever deflection in order to compensate for lateral tip motion that would otherwise be caused by cantilever deflection. In the case of a probe having a passive cantilever, the sample and/or the probe as a whole are driven to move laterally to obtain the desired magnitude of compensation as direct function of cantilever deflection. In the case of a probe having an active cantilever, the sample or probe may be moved as a function of cantilever drive signal, or the cantilever may be controlled to bend as a function of cantilever drive signal so that the tip moves to obtain the desired magnitude of compensation.

2012029, Nov 22, 2012

Apr 27, 2012

13/458725

Johannes H. Kindt - Ehlingen, DE
Daniel Lyons - Goleta CA, US
Charles Meyer - Goleta CA, US
Russ Mead - Goleta CA, US

BRUKER NANO INC. - Santa Barbara CA

G01Q 90/00

850 63

A cleaning station for thoroughly cleaning the AFM component surfaces that are exposed to fluid during imaging of a sample supported in a fluid medium is disclosed. The cleaning station is designed to selectively expose the AFM component surfaces to cleansing agents, such as soap/detergent and water, plasma cleaning, etc., and cleaning tools, such as brushes, while protecting fluid sensitive components from exposure to the cleansing agents. The preferred embodiments are particularly beneficial for scanners in which the fluid sensitive components (actuator, sensor, connector, etc.) are integrated in the same device to which the cantilever holder is attached.