DR. CHAN M PARK, MD, DDS
Medical Practice at 31 St, Oakland, CA
License number
California 54673
Category
Dentist
Type
Oral and Maxillofacial Surgery
License number
California A109104
Category
Medical Practice
Type
Oral & Maxillofacial Surgery
Address
Address
1411 E 31St St, Oakland, CA 94602
Phone
(510) 437-4101
(510) 437-5128 (Fax)
(510) 437-5128 (Fax)
Personal information
See more information about CHAN M PARK at radaris.comName
Address
Phone
433 S Westmoreland Ave APT 30, Los Angeles, CA 90020
4310 Russell Ave APT 7, Los Angeles, CA 90027
454 Jenny Cir, Corona, CA 92882
4523 Middlebury Cir, Cypress, CA 90630
445 S Ardmore Ave, Los Angeles, CA 90020
Professional information
See more information about CHAN M PARK at trustoria.com
Dr. Chan M Park, Oakland CA - DDS (Doctor of Dental Surgery)
Dr. Chan M Park, Oakland CA - DDS (Doctor of Dental Surgery)
Specialties:
Oral & Maxillofacial Surgery
Address:
1411 E 31St St, Oakland 94602
(510) 437-4101 (Phone), (510) 437-5128 (Fax)
(510) 437-4101 (Phone), (510) 437-5128 (Fax)
Languages:
English
Education:
Medical School
Loma Linda University
Loma Linda University
Chan Muk Park, Oakland CA
Chan Muk Park, Oakland CA
Specialties:
Dentist
Address:
1411 E 31St St, Oakland, CA 94602
2155 Webster St, San Francisco, CA 94115
2155 Webster St, San Francisco, CA 94115
Calibration System For Use With Measuring Systems
Calibration System For Use With Measuring Systems
US Patent:
2002006, May 30, 2002
Filed:
Mar 19, 2001
Appl. No.:
09/813120
Inventors:
Chan Park - Oakland CA, US
International Classification:
G01C015/06, G01B011/26
US Classification:
033/290000
Abstract:
A measuring system includes an optical site reference, such as a reference line within a scope used in surveying, and a calibrated reference scale which provides measurements by optical comparison to the optical site reference. The calibrated reference scale includes centimeter sections which in turn include upper and lower stepped sections. The upper and lower stepped sections are symmetrical with respect to one another such that the upper and lower stepped sections can be easily distinguished from one another from significant distance. Each of the steps of each stepped section indicates a specific, corresponding offset within the stepped section. The symmetry of the upper and lower stepped sections is in the relative positions of the long and short reference members. The calibrated reference scale includes a number of digit reference sections which are spaced a predetermined distance from a reference point along the calibrated reference scale and include an alphanumeric representation of that predetermined distance. The alphanumeric representation has a predetermined height such that the alphanumeric representation itself provides a reference for offsets from a base of the alphanumeric representation. In particular, those alphanumeric representations which have horizontal components place those horizontal components so as to provide relatively evenly spaced references which the digit reference section.
Calibration System For Use With Measuring Systems
Calibration System For Use With Measuring Systems
US Patent:
6202314, Mar 20, 2001
Filed:
Jul 30, 1998
Appl. No.:
9/126633
Inventors:
Chan Y. Park - Oakland CA
International Classification:
G01C 1506, G01B 1126
US Classification:
33290
Abstract:
A measuring system includes an optical site reference, such as a reference line within a scope used in surveying, and a calibrated reference scale which provides measurements by optical comparison to the optical site reference. The calibrated reference scale includes centimeter sections which in turn include upper and lower stepped sections. The upper and lower stepped sections are symmetrical with respect to one another such that the upper and lower stepped sections can be easily distinguished from one another from significant distance. Each of the steps of each stepped section indicates a specific, corresponding offset within the stepped section. The symmetry of the upper and lower stepped sections is in the relative positions of the long and short reference members. The calibrated reference scale includes a number of digit reference sections which are spaced a predetermined distance from a reference point along the calibrated reference scale and include an alphanumeric representation of that predetermined distance. The alphanumeric representation has a predetermined height such that the alphanumeric representation itself provides a reference for offsets from a base of the alphanumeric representation.