CHAN H. PARK, MD
Radiology at Morse Ave, Sacramento, CA

License number
California A75545
Category
Radiology
Type
Diagnostic Radiology
Address
Address 2
2025 Morse Ave, Sacramento, CA 95825
1800 Harrison St FL 7, Oakland, CA 94612
Phone
(916) 973-5000
(510) 625-6262

Personal information

See more information about CHAN H. PARK at radaris.com
Name
Address
Phone
Chan Park, age 66
433 S Westmoreland Ave APT 30, Los Angeles, CA 90020
Chan Park
4310 Russell Ave APT 7, Los Angeles, CA 90027
Chan Park, age 57
454 Jenny Cir, Corona, CA 92882
Chan Park, age 80
4523 Middlebury Cir, Cypress, CA 90630
Chan Park
445 S Ardmore Ave, Los Angeles, CA 90020
(714) 425-6509

Professional information

Chan Hyoung Park Photo 1

Chan Hyoung Park, Sacramento CA

Specialties:
Radiologist
Address:
2025 Morse Ave, Sacramento, CA 95825
Education:
University of Michigan, Medical School - Doctor of Medicine
Board certifications:
American Board of Radiology Certification in Diagnostic Radiology (Radiology)


Chan M Park Photo 2

Dr. Chan M Park, Oakland CA - DDS (Doctor of Dental Surgery)

Specialties:
Oral & Maxillofacial Surgery
Address:
1411 E 31St St, Oakland 94602
(510) 437-4101 (Phone), (510) 437-5128 (Fax)
Languages:
English
Education:
Medical School
Loma Linda University


Chan H Park Photo 3

Dr. Chan H Park, Sacramento CA - MD (Doctor of Medicine)

Specialties:
Diagnostic Radiology
Address:
2025 Morse Ave, Sacramento 95825
(916) 973-5000 (Phone)
Certifications:
Diagnostic Radiology, 2004
Awards:
Healthgrades Honor Roll
Languages:
English
Hospitals:
2025 Morse Ave, Sacramento 95825
Kaiser Permanente Sacramento Medical Center
2025 Morse Ave, Sacramento 95825
Education:
Medical School
University Of Michigan Medical School
Graduated: 1999
University Of California Davis Med Center
Graduated: 2004


Chan Muk Park Photo 4

Chan Muk Park, Oakland CA

Specialties:
Dentist
Address:
1411 E 31St St, Oakland, CA 94602
2155 Webster St, San Francisco, CA 94115


Chan Park Photo 5

Calibration System For Use With Measuring Systems

US Patent:
2002006, May 30, 2002
Filed:
Mar 19, 2001
Appl. No.:
09/813120
Inventors:
Chan Park - Oakland CA, US
International Classification:
G01C015/06, G01B011/26
US Classification:
033/290000
Abstract:
A measuring system includes an optical site reference, such as a reference line within a scope used in surveying, and a calibrated reference scale which provides measurements by optical comparison to the optical site reference. The calibrated reference scale includes centimeter sections which in turn include upper and lower stepped sections. The upper and lower stepped sections are symmetrical with respect to one another such that the upper and lower stepped sections can be easily distinguished from one another from significant distance. Each of the steps of each stepped section indicates a specific, corresponding offset within the stepped section. The symmetry of the upper and lower stepped sections is in the relative positions of the long and short reference members. The calibrated reference scale includes a number of digit reference sections which are spaced a predetermined distance from a reference point along the calibrated reference scale and include an alphanumeric representation of that predetermined distance. The alphanumeric representation has a predetermined height such that the alphanumeric representation itself provides a reference for offsets from a base of the alphanumeric representation. In particular, those alphanumeric representations which have horizontal components place those horizontal components so as to provide relatively evenly spaced references which the digit reference section.


Chan Park Photo 6

Calibration System For Use With Measuring Systems

US Patent:
6202314, Mar 20, 2001
Filed:
Jul 30, 1998
Appl. No.:
9/126633
Inventors:
Chan Y. Park - Oakland CA
International Classification:
G01C 1506, G01B 1126
US Classification:
33290
Abstract:
A measuring system includes an optical site reference, such as a reference line within a scope used in surveying, and a calibrated reference scale which provides measurements by optical comparison to the optical site reference. The calibrated reference scale includes centimeter sections which in turn include upper and lower stepped sections. The upper and lower stepped sections are symmetrical with respect to one another such that the upper and lower stepped sections can be easily distinguished from one another from significant distance. Each of the steps of each stepped section indicates a specific, corresponding offset within the stepped section. The symmetry of the upper and lower stepped sections is in the relative positions of the long and short reference members. The calibrated reference scale includes a number of digit reference sections which are spaced a predetermined distance from a reference point along the calibrated reference scale and include an alphanumeric representation of that predetermined distance. The alphanumeric representation has a predetermined height such that the alphanumeric representation itself provides a reference for offsets from a base of the alphanumeric representation.