CARL JOSEPH MAYER
Pilots at 156 Ter, Overland Park, KS

License number
Kansas A2864234
Issued Date
Aug 2016
Expiration Date
Aug 2018
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
3606 W 156Th Ter, Overland Park, KS 66224

Personal information

See more information about CARL JOSEPH MAYER at radaris.com
Name
Address
Phone
Carl Mayer
6304 College Blvd, Overland Park, KS 66211
Carl Mayer
3606 W 156Th Ter, Overland Park, KS 66224
Carl Mayer
7027 Hadley St, Shawnee Mission, KS 66204
Carl Mayer
3606 156Th St, Overland Park, KS 66224

Professional information

Carl Mayer Photo 1

Apparatus And Method For Determining Analyte Concentrations

US Patent:
8199322, Jun 12, 2012
Filed:
Feb 4, 2011
Appl. No.:
13/021439
Inventors:
Dheerendra Kashyap - Overland Park KS, US
Craig Seyl - Olathe KS, US
Carl Mayer - Overland Park KS, US
John Ellenz - Olathe KS, US
Assignee:
Revolutionary Business Concepts, Inc. - Lenexa KS
International Classification:
G01N 21/00, G01N 33/48, G01N 33/50
US Classification:
356337, 356 39, 356341, 702 19
Abstract:
An apparatus and method for determining an analyte concentration of a sample, such as a tissue sample. The apparatus may comprise an emitter, close proximity detectors laterally located less than about 2 mm away from the emitter, and far away detectors laterally located greater than about 0. 5 cm away from the emitter. A plurality of wavelengths may be sent from the emitter to the sample, reflected off of the sample, and received by the detectors. The reflectance value measured by the close proximity detectors may be used to calculate one or more scattering coefficients. The reflectance value measured by the far away detectors may be compared with a reflectance value calculated using the scattering coefficients in a numerical inversion of a diffusion model to determine the analyte concentration of the sample.


Carl Mayer Photo 2

Enhanced Optical Sensor Module

US Patent:
8320981, Nov 27, 2012
Filed:
Jun 29, 2007
Appl. No.:
11/771547
Inventors:
Carl Mayer - Overland Park KS, US
Craig Seyl - Olathe KS, US
Joseph Lee Hollmann - Kansas City MO, US
Eric Weiss - Sunnyvale CA, US
Lyle Frank Weaver - Woodside CA, US
Timothy A. Fayram - Gilroy CA, US
Assignee:
Pacesetter, Inc. - Sunnyvale CA
International Classification:
A61B 5/1455
US Classification:
600310, 600322, 600323, 600326, 600320
Abstract:
An implantable system includes light sources to transmit toward vascularized tissue, in a time multiplexed manner, light having a first wavelength of approximately 660 nm, light having a second wavelength of approximately 810 nm, light having a third wavelength of approximately 910 nm, and light having a fourth wavelength of approximately 980 nm. The system includes one or more light detector to detect light of the first, second, third and fourth wavelengths scattered by vascularized tissue. Additionally, one or more processor is configured to determine levels of blood oxygen saturation based on the detected scattered light of the first and third wavelengths, determine levels of tissue oxygen saturation based on the detected scattered light of the first and third wavelengths, determine levels of hemoglobin concentration based on the detected scattered light of the second wavelength, and determine levels of tissue hydration based on the detected scattered light of the second and fourth wavelengths.


Carl Mayer Photo 3

Apparatus And Method For Determining Analyte Concentrations

US Patent:
7884933, Feb 8, 2011
Filed:
Aug 20, 2010
Appl. No.:
12/860569
Inventors:
Dheerendra Kashyap - Overland Park KS, US
Craig Seyl - Olathe KS, US
Carl Mayer - Overland Park KS, US
John Ellenz - Olathe KS, US
Assignee:
Revolutionary Business Concepts, Inc. - Lenexa KS
International Classification:
G01N 21/00
US Classification:
356338, 356342
Abstract:
An apparatus and method for determining an analyte concentration of a sample, such as a tissue sample. The apparatus may comprise an emitter, close proximity detectors laterally located less than about 2 mm away from the emitter, and far away detectors laterally located greater than about 0. 5 cm away from the emitter. A plurality of wavelengths may be sent from the emitter to the sample, reflected off of the sample, and received by the detectors. The reflectance value measured by the close proximity detectors may be used to calculate one or more scattering coefficients. The reflectance value measured by the far away detectors may be compared with a reflectance value calculated using the scattering coefficients in a numerical inversion of a diffusion model to determine the analyte concentration of the sample.