DR. BRIAN KEITH BECKER, M.D.
Osteopathic Medicine in Tucson, AZ
License number
Arizona 25749
Category
Osteopathic Medicine
Type
General Practice
Address
Address
3938 E Grant Rd P.m.b. #444, Tucson, AZ 85712
Phone
(520) 647-7992
(520) 647-7950 (Fax)
(520) 647-7950 (Fax)
Personal information
See more information about BRIAN KEITH BECKER at radaris.comName
Address
Phone
5720 E North Wilshire Dr, Tucson, AZ 85711
16434 Scorpion Dr, Fountain Hills, AZ 85268
12009 127Th Dr, El Mirage, AZ 85335
10115 Mountain View Rd, Scottsdale, AZ 85258
16436 Scorpion Dr, Fountain Hills, AZ 85268
Organization information
See more information about BRIAN KEITH BECKER at bizstanding.comBrian Keith Becker MD
3938 E Grant Rd Pmb 444, Tucson, AZ 85712
Categories:
Family & General Practice Physicians & Surgeons
Phone:
(520) 327-9789 (Phone)
Professional information
See more information about BRIAN KEITH BECKER at trustoria.com
Dr. Brian K Becker, Tucson AZ - MD (Doctor of Medicine)
Dr. Brian K Becker, Tucson AZ - MD (Doctor of Medicine)
Specialties:
Family Medicine
Address:
BECKER, BRIAN KEITH MD
3938 E Grant Rd, Tucson 85712
(520) 647-7992 (Phone)
3938 E Grant Rd, Tucson 85712
(520) 647-7992 (Phone)
Languages:
English
Education:
Medical School
University of Arizona
Graduated: 1996
University of Arizona
Graduated: 1996
Brian Keith Becker, Tucson AZ
Brian Keith Becker, Tucson AZ
Specialties:
Family Physician
Address:
3938 E Grant Rd, Tucson, AZ 85712
Method Of Combining Multiple Sets Of Overlapping Surface-Profile Interferometric Data To Produce A Continuous Composite Map
Method Of Combining Multiple Sets Of Overlapping Surface-Profile Interferometric Data To Produce A Continuous Composite Map
US Patent:
6185315, Feb 6, 2001
Filed:
Sep 15, 1998
Appl. No.:
9/153365
Inventors:
Mark A. Schmucker - Tucson AZ
Brian W. Becker - Tucson AZ
Brian W. Becker - Tucson AZ
Assignee:
Wyko Corporation - Tucson AZ
International Classification:
G06K 900, G01B 902
US Classification:
382108
Abstract:
A method of combining height profiles of adjacent sections of a test surface to produce a composite profile of the surface consists of taking successive measurements of adjacent sections of the surface of the test sample by sequentially placing them within the field of view of the instrument and profiling them by phase shifting or vertical scanning. The x-y translation of the microscope between successive measurements from one section to the next adjacent section of the surface being profiled is carried out by overlapping such sections, so that spatial continuity is maintained between measurements. The height data generated for each section are then combined to form a larger image corresponding to the entire surface tested and discontinuities and/or errors introduced by the x-y translation process are corrected by normalizing the overlapping portions to a common reference plane. A plane is fitted through each set of measured heights in the overlapping regions and the tip, tilt and offset of each fitted plane are corrected to produce matching overlapping height data in adjacent sections. The measured height data for the balance of each section are then also corrected by the same difference in tip, tilt and offset to obtain a continuous normalized image.
Method Of Combining Multiple Sets Of Overlapping Surface-Profile Interferometric Data To Produce A Continuous Composite Map
Method Of Combining Multiple Sets Of Overlapping Surface-Profile Interferometric Data To Produce A Continuous Composite Map
US Patent:
5987189, Nov 16, 1999
Filed:
Dec 20, 1996
Appl. No.:
8/771428
Inventors:
Mark A. Schmucker - Tucson AZ
Brian W. Becker - Tucson AZ
Brian W. Becker - Tucson AZ
Assignee:
Wyko Corporation - Tucson AZ
International Classification:
G06K 936, G01B 902
US Classification:
382284
Abstract:
A method of combining height profiles of adjacent sections of a test surface to produce a composite profile of the surface consists of taking successive measurements of adjacent sections of the surface of the test sample by sequentially placing them within the field of view of the instrument and profiling them by phase shifting or vertical scanning. The x-y translation of the microscope between successive measurements from one section to the next adjacent section of the surface being profiled is carried out by overlapping such sections, so that spatial continuity is maintained between measurements. The height data generated for each section are then combined to form a larger image corresponding to the entire surface tested and discontinuities and/or errors introduced by the x-y translation process are corrected by normalizing the overlapping portions to a common reference plane. A plane is fitted through each set of measured heights in the overlapping regions and the tip, tilt and offset of each fitted plane are corrected to produce matching overlapping height data in adjacent sections. The measured height data for the balance of each section are then also corrected by the same difference in tip, tilt and offset to obtain a continuous normalized image.