BRIAN GEORGE BEUCLER
Pilots at Giordani Ln, Sandown, NH
License number
New Hampshire A2570991
Issued Date
Mar 2016
Expiration Date
Mar 2018
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
24 Giordani Ln, Sandown, NH 03873
Professional information
Automatic Integrated Mechanical And Electrical Angular Motion Detector Test System
US Patent:
6640610, Nov 4, 2003
Filed:
Mar 30, 2001
Appl. No.:
09/822117
Inventors:
Brian G. Beucler - Sandown NH
Robert E. Malone - Westford MA
Robert P. OReilly - Natick MA
Christopher F. Hanle - Chelmsford MA
Robert E. Malone - Westford MA
Robert P. OReilly - Natick MA
Christopher F. Hanle - Chelmsford MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
G01P 2100
US Classification:
73 138, 73 177
Abstract:
An automatic integrated mechanical and electrical angular motion detector test system includes a test fixture for holding an angular motion detector to be mechanically and electrically tested; a handler subsystem for feeding an angular motion detector to the test fixture; a motor having a rotatable shaft attached to the test fixture for rotating it and the angular motion detector it holds; and an electrical tester for testing the angular motion detector while it is rotating.
Integrated Accelerometer Test System
US Patent:
5895858, Apr 20, 1999
Filed:
Mar 10, 1997
Appl. No.:
8/815996
Inventors:
Robert Malone - Westford MA
Brian Johnson - Upton MA
Brian Beucler - Sandown NH
Robert O'Reilly - Natick MA
Normand Boucher - Lowell MA
Sarkis Ourfalian - Watertown MA
Brian Johnson - Upton MA
Brian Beucler - Sandown NH
Robert O'Reilly - Natick MA
Normand Boucher - Lowell MA
Sarkis Ourfalian - Watertown MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
G01P 2100
US Classification:
73 138
Abstract:
An automatic and integrated mechanical and electrical accelerometer test system including a test fixture for holding the accelerometers to be mechanically and electrically tested; a handler subsystem for automatically feeding the accelerometers to the test fixture; a shaker subsystem for mechanically testing the accelerometers, the shaker subsystem linked to the test fixture, the shaker subsystem automatically vibrating the test fixture; and a tester for electrically testing the accelerometers while the accelerometers are vibrating.
Method And Apparatus For Handling A Packaged Integrated Circuit Device For Testing
US Patent:
5614835, Mar 25, 1997
Filed:
Jun 7, 1995
Appl. No.:
8/484346
Inventors:
Robert Malone - Westford MA
Brian G. Beucler - Sandown NH
Brian G. Beucler - Sandown NH
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
G01R 3102
US Classification:
324755
Abstract:
A carrier is used to couple a packaged device having leads of a certain length to a testing device. The carrier includes an adapter for receiving packaged dies with leads that are cut so that they are otherwise too short for the testing device. The adapter thus allows the leads to be cut prior to testing.