DR. BAO QUOC TRAN, MD
Marriage and Family Therapists at El Camino Real, Houston, TX

6157935, Dec 5, 2000

Dec 17, 1996

8/767833

Bao Q. Tran - Houston TX
Craig A. Anthony - League City TX

G06F 314, G06K 900

707503

A portable computer system manages data for a user using a processor; a program storage device coupled to said processor; an input recognizer embodied in said program storage device, said input recognizer adapted to receive non-cursive handwritings from said user and convert said non-cursive handwritings into text data; and a computer readable code embodied in said program storage device and coupled to said input recognizer for receiving said non-cursive handwritings, said computer readable code storing said data and allowing said user to process said data.

4661930, Apr 28, 1987

Aug 2, 1984

6/636941

Bao G. Tran - Houston TX

Texas Instruments Incorporated - Dallas TX

G11C 700

365201

A register of the type used on as address counter in a dynamic RAM is tested by a method which does not require cycling through every possible value of the register contents. The counter is first loaded with a fixed value, all 1's or all 0's, and the contents checked by an AND or OR gate, producing a one-bit output which is monitored off-chip. Then, the carry feedback path to the counter register is altered, as by inverting all but the LSB, and the contents again checked, using the one-bit output via the AND or OR. In this manner, the operation of the counter is tested in three cycles.

4868823, Sep 19, 1989

Jan 15, 1988

7/144299

Lionel S. White - Houston TX
Joseph H. Neal - Missouri City TX
Bao G. Tran - Houston TX

Texas Instruments Incorporated - Dallas TX

G06F 1110

371 213

A semiconductor read/write memory device has a normal mode of operation and a test mode. The test mode allows concurrent writing to a number of cells in the cell array so that test patterns may be rapidly loaded. The cell array is split into subarrays and the column addressing circuitry is arranged to provide a maximum of spacing between the cells that are concurrently written. In this manner, pattern sensitivity tests may be run at higher speed because a number of bits at widely spaced positions in the array can be tested simultaneously.

4654849, Mar 31, 1987

Aug 31, 1984

6/646656

Lionel S. White - Houston TX
Joseph H. Neal - Missouri City TX
Bao G. Tran - Houston TX

Texas Instruments Incorporated - Dallas TX

G06F 1122, G11C 2900

371 21

A semiconductor read/write memory device has a normal mode of operation and a test mode. The test mode allows concurrent writing to a number of cells in the cell array so that test patterns may be rapidly loaded. The cell array is split into subarrays and the column addressing circuitry is arranged to provide a maximum of spacing between the cells that are concurrently written. In this manner, pattern sensitivity tests may be run at higher speed because a number of bits at widely spaced positions in the array can be tested simultaneously.

6202060, Mar 13, 2001

Oct 29, 1996

8/741377

Bao Q. Tran - Houston TX

G06F 900

707 3

A portable computer system manages data conveniently for a user. The system has a processor, a program storage device coupled to the processor, an input recognizer adapted to receive non-cursive handwritings from the user and to convert the handwriting to data, and a computer readable code embodied in the program storage device for storing and processing the data.