ANTONIO GARCIA
Electrician at Etta Pl, Austin, TX

License number
Texas 173410
Expiration Date
May 26, 2017
Category
Journeyman Electrician
Address
Address
206 Etta Pl, Austin, TX 78753
Phone
(512) 554-4768

Professional information

Antonio Garcia Photo 1

Sr Power Tech At Amd (Volt)

Position:
Sr Power Tech at AMD (Volt)
Location:
Austin, Texas Area
Industry:
Information Technology and Services
Work:
AMD (Volt) - Austin, Texas Area since Jun 2012 - Sr Power Tech Closer to Bottom 2012 - 2012 - Cinamtographer Centaur Technology Feb 2008 - Aug 2012 - R&D Associate Engineer
Skills:
Thermal, Debugging, Hardware Architecture, Semiconductors, Microsoft Office, Electronics, IC, Testing, Hardware Diagnostics, ASIC, Failure Analysis, Soldering


Antonio Garcia Photo 2

Antonio Garcia - Austin, TX

Work:
PPE - Validation & Central Engineering - Austin, TX
BUSINESS OPERATIONS MANAGER/LAB MANAGER
PPE - Validation & Central Engineering
BUSINESS OPERATIONS MANAGER/LAB MANAGER
PPE - Validation & Central Engineering
INFRASTRUCTURE TEAM MANAGER
PPE - Validation & Central Engineering
FINANCIAL ANALYST/BUSINESS OPERATIONS MANAGER
PPE - Validation & Central Engineering
VALIDATION TEST DEVELOPMENT SUPERVISOR
Platform Validation
VALIDATION DEVELOPMENT ENGINEER
Engineering Manufacturing Services
SENIOR TEST ENGINEER
Platform Design
ASSOCIATE ENGINEER
Platform Validation
COMPATABILITY TEST TECHNICIAN 2


Antonio Garcia Photo 3

Construction At Lee Holmes Remodeling

Position:
construction at lee holmes remodeling
Location:
Austin, Texas Area
Industry:
Construction
Work:
lee holmes remodeling - construction


Antonio Garcia Photo 4

Picosecond Imaging Circuit Analysis Probe And System

US Patent:
6657446, Dec 2, 2003
Filed:
Sep 30, 1999
Appl. No.:
09/409974
Inventors:
Rama R. Goruganthu - Austin TX
Antonio Torres Garcia - Austin TX
Michael R. Bruce - Austin TX
Assignee:
Advanced Micro Devices, Inc. - Sunnyvale CA
International Classification:
G01R 31302
US Classification:
324752, 324754, 324 96
Abstract:
An apparatus, system, and method are provided for testing an integrated circuit with a probe card having optical fibers. The optical fibers of the probe card are fixed in alignment with test structures in the integrated circuit, and each optical fiber is coupled to an avalanche photo-diode for measuring photoemissions from the test structures. The photoemissions can be analyzed to verify correct circuit behavior. The optical fibers can be alternatives or complements to electrically conductive probes of the probe card.


Antonio Garcia Photo 5

Ring Oscillator Test Structure

US Patent:
6075417, Jun 13, 2000
Filed:
Jan 5, 1998
Appl. No.:
9/002655
Inventors:
Jon Cheek - Round Rock TX
Antonio Garcia - Austin TX
John Bush - Leander TX
Assignee:
Advanced Micro Devices, Inc. - Sunnyvale CA
International Classification:
H03B 524, G01R 3100
US Classification:
331 44
Abstract:
An improved oscillator test structure is disclosed. A structure according to one embodiment includes an odd plurality of first transistor pairs formed on a predetermined area of a semiconductor substrate. The transistor pairs are electrically connected in a serial ring. The structure also includes at least one second transistor pair, also formed within the predetermined area on the substrate, but electrically isolated from the odd plurality of first transistor pairs.